Defect
other than specified, imperfection .
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Product
Magnetic Permeability Meter Ferromaster
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Instrument for easy measurement of the relative magnetic permeability µr of feebly magnetic materials and workpieces with a permeability between 1.001 and 1.999. The permeability is measured by touching the workpiece with the probe tip and reading the result from the display. Typical applications are: non-destructive testing of materials, e. g. quality control of stainless steel, material selection for electron-/ion-beam equipment, detection of material defects induced by mechanical or thermal stress.
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Portable Eddy Current Flaw Detectors
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Portable eddy current (EC) flaw detectors inspect metallic parts and perform highly reliable and advanced flaw detection of surface and near-surface defects. Olympus offers portable eddy current equipment to meet a broad range of applications, including the detection of surface or near-surface defects, and the inspection of bolt holes.
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Product
Ceramics and Glass Inspection Systems
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Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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Product
Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Product
Digital In-Circuit tester
MTS180/300
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Analog in-circuit inspection and function inspection are realized on this inspection equipment. IC pin float function is standard equipment. The MTS180 is a press type jig, and the MTS300 is a vacuum type jig. In the board mounting process at the production site, electrical inspection is performed on the mounted board after component mounting, and non-defective or defective products are automatically judged. The main inspection contents are short / open inspection, analog inspection of resistors, capacitors, coils, diodes, etc., lead floating voltage measurement of QFP and BGA, Digital IC inspection, frequency measurement.
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Product
E-beam Metrology And Inspection
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Our HMI e-beam solutions help to locate and analyze individual chip defects amid millions of printed patterns.
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Product
Non-Destructive Testing (NDT)
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Marposs complements its geometric measurement solutions with solutions for non-destructive testing using eddy current technology.The testing options can be divided in three large groups:Material integrity test, to check for the presence of defects (cracks, porosity, blow holes, inclusions) on the surface and in the layer just below the surface.Material properties test, to check if the thermal cycles (hardening, hardening and tempering, annealing, stress relieving, etc.) have been performed correctly. Material identification checks are done to sort parts with the same geometry but made with different materials.Thread inspection to check if the treading has been carried out and its quality.In addition to the non-destructive checks performed with the eddy currents, we have developed a durometer for the conventional measurement of surface hardness, according to the Rockwell scale (HRC or HRA); which uses a diamond penetrator to measure the hardness of the sample being tested.
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Product
Metallurgical Testing Services
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BMP Testing and Calibration Services Inc.
Metallurgical testing is a crucial part of metal processing and manufacturing and is used in almost every industry — aerospace, shipbuilding, steel, construction, and many others. It involves the use of a wide range of techniques and equipment to identify the material type, potential defects, and processing errors.
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Product
Robotic 2D & 3D Vision Inspection
EyeT+Inspect
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EyeT+Inspect is the outstanding 3D device for robotic visual inspection combining robust 3D vision to inspect product shape with fast 2D vision to inspect product surface. EyeT+Inspect optimizes production thanks to automatic and objective removal of defective products from the production line.
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Product
Automated System for Visual Quality Control of Printing and Marking on Plates
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The automated visual control system (ASVK) is designed to detect defects in the printing of images and markings applied to the blanks of extruded expanded polystyrene during the production of plates.
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Product
Compound Semi | MEMS | HDD Manufacturing
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KLA has a comprehensive portfolio of inspection, metrology, and data analytics systems to support power devices, RF communications, LED, photonics, MEMS, CPV solar and display manufacturing. High brightness LEDs are becoming commonly used in solid-state lighting and automotive applications, and LED device makers are targeting aggressive cost and performance improvements, requiring more emphasis on improved process control and yield. Similarly, leading power device manufacturers are targeting faster development and ramp times, high product yields and lower device costs, and are implementing solutions for characterizing yield-limiting defects and processes. KLA's inspection, metrology and data analytics systems help these manufacturers control their processes and increase yield.
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Product
SOLAR CELL TESTER
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The tester is designed for terrestrial solar cell incoming/outcoming inspection with the purpose of checking and optimizing parameters and preventing manufacture defects of solar modules. Solar cells are not heated in process of inspection due to the use of xenon pulse lamp installed in the tester.
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Product
High Speed Cable Production Tester
GRL-V-DI20
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GRL-V-DI20 provides a fast and easy way for anyone to test cables for manufacturing defects and signal integrity specification requirements. GRL-V-DI20 provides comprehensive test coverage in seconds at a fraction of the cost of similarly-capable bench test equipment.
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Product
Food Quality Analyzer
Hydra F100 BQ
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The Hydra is a kiosk like machine with a touchscreen that is installed at a food processing facility. Instead of inspectors manually selecting and inspecting samples, whole trays of samples can now be inserted into the machine to be assessed at once. The Hydra has cameras above and below the fruit to capture images of this bulk sample, which is sent to AgShift’s cloud platform to analyze it for weight, size, color and to check for defects like mold or bruising.
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Product
Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
High Voltage System
HV-2
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International Electro-Magnetics, Inc.
*Tests Power Transformers for Continuity, Ratio and Phase. Applied and Induced Potential and No-load Losses.*14 Conductor Switching Matrix will test 7 individual windings, 13 taps of one common winding or some combination thereof. (10 Amp current limit)*The System Control is Windows/Visual Basic based. Menu screens allow full selection of test parameters and sequence. Low voltage tests can be performed first, allowing defective parts to be rejected without proceeding to time consuming induced Potential dwell routines. Test data labeling and data acquisition software can be easily added to the system.
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Product
Pre-reflow AOI
Zenith LiTE
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Minimizes Shadow Problems with 4way projectionEasy Programming with parametric approachReal time defect diagnosis and root cause removalrortified 2D features using 9 channel RGB lights100% 3D measurement inspection.
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Product
Advanced Metrology System
NGS 3500L
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This top performance system is designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. It is well suited for use as a dedicated production tool or as a versatile processdevelopment system. It features a powerful set of automated as well as semi-automatic optical/ video tools optimized for high accuracy, production throughput, and ease of use.
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Product
Interoperability Testing Services
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Using our decades of knowledge and experience of Bluetooth, markets and products we'll help you deliver products which are free of defects, minimize field issues, lower development costs and reduce time to market. Teledyne LeCroy offers test services to help in all stages of product development from Specification to Market Launch and beyond.
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Product
MicroPhase I LRP - Dual Phase Voltage Detector / Phase Comparator
MP1-02P
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Hachmann Innovative Elektronik
MicroPhase I LRP is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. Thanks to the "LRP-switch" the threshold value can be lowered from 2,5 µA (HR, MR, LR and LRM) to 1,0 µA (LRP).
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Product
Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Product
(AOI) Automated Optical Inspection Systems
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For automated defect detection and high-accuracy measurements. VisionGauge Online High-Speed AOI systems are perfect solutions for demanding high-throughput, high-resolution applications. These systems are perfect for a wide range of applications including MicroElectroMechanical systems (for MEMS inspection or MEMS measurement), semiconductor & discrete device inspection and measurement.
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Product
Flying Probe Tester
FA1817
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Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Product
Flat Panel Display Test Solutions
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Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Product
Environmental Stress Screening
E.S.S
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King Design Industrial Co., Ltd.
E.S.S system could find most potential and hiding defects earlier by checking the physical property of allmaterials and components, and make use of their nature response under Environmental Stress. Through our screening will to pick out all potential and hiding defects in advance and improving the product's reliability inling. It benefits the manufacturer and customer mutually.
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Product
EasyClassify
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Includes functions for classifier training and image classificationAble to detect defective products or sort products into various classesSupports data augmentation, works with as few as one hundred training images per classCompatible with CPU and GPU processingIncludes the free Deep Learning Studio application for dataset creation, training and evaluationOnly available as part of the Deep Learning Bundle
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Product
Chip Inspection System
GEN3000T
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GEN3000T is an inspection system that performs automatic inspection of individual semiconductor chips.This revolutionary chip surface inspection system was achieved by combining the chip handling technology cultivated by Toray with the inspection algorithm used in the "INSPECTRA®" wafer defect inspection system.
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Product
Highly Accelerated Life Testing (HALT)
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Quickly validate reliability and identify manufacturing defects that could cause product failures in the field with MET’s Highly Accelerated Life Test (HALT)HALT technique uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages, which improves product reliability and customer confidence inherent to the design and fabrication process of a new product as well as during the production phase to find manufacturing defects that could cause product failures in the field.
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Product
Backplane Profiling & Inspection System
603d
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A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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Product
Manufacturing Defects Analyzer
eloZ1-1600
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1 can be integrated into table systems as well as into inline-systems.
