Defect
other than specified, imperfection .
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3D AOI
Zenith2
Zenith 2 AOI platform, which provides the AI-driven Auto Programming for rapid job programming. The Zenith 2 also combines Koh Young’s advanced vision algorithms with innovative high-resolution optics. The latest platform expands inspection capabilities, delivering best-in-class performance, functionality, and accessibility. Koh Young’s side-view solution allows Zenith 2 to quickly detect and analyze defects on a wide range of mounted components and chips.
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Axis Play Tester
PMS 3.5 | VP 225012
Maschinenbau Haldenwang GmbH & Co. KG.
The axis play tester PMS 3.5 is used to reliably determine defects and wear on steering parts, wheel bearings, suspension and suspension by counter-rotating transverse and longitudinal movement of the test plates. The built-in hydraulic drive ensures a powerful and even movement of the test plates. An automatic mode and other different operating modes make the PMS 3.5 easy to use.
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Power Steering Tester in Storage Case
34650
Gives fast, accurate power steering analysis. Test for defects in power steering pumps, gears and lines. Large heavy duty gage reads from 0-2,000 PSI and 0-140 BAR. Use to rule out power steering problems before expensive suspension or steering linkage problem is attacked. Includes 13 adapters. Supplied with instructions in a durable, plastic molded storage case.
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Sorter
IV-200I
IV-200I is a sorter for package in pocket tape that features a lot summary information. This product is used for mapping data with Defect Code Data/Report as well as exporting data or report archiving. IV-200I works well with an In.D X-ray Image Analyser.
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Defect Inspection Systems
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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Translating process images into significant tool-defect reduction
Trans-Imager
Real-time, tool-specific defectivity data. Now there is a way to monitor defectivity on individual processing tools – automatically – in real-time. Microtronic’s new Trans-Imager software module is able to take high-resolution images directly from your processing equipment and immediately detect and displaymacro wafer defects – transferring all of that information into our powerful and long-proven ProcessGuard software which provides a wealth of defect management and analysis. This new capability is called ProcessGuard Xtensis (PGX) because it extends the power of ProcessGuard software to fab tools that previously had no way to detect defects. This provides an important new stream of defect data.
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Inspection System for Die Casting
X-eye 7000BS
Appropriate for medium•large size component inspection and detecting surface structure and defects(inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's reduced significantly and enables long-term use with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Upsetting Testing Machine
JINAN PRCISION TESTING EQUIPMENT CO., LTD
The full-automatic rapid upsetting testing machine adopts hydraulic loading and manual control. The metal material applies pressure along the axis of the sample at room temperature or hot state to compress the sample, test the ability of the metal to withstand upsetting plastic deformation under the specified forging ratio, and display metal surface defects. It is mainly used in the upsetting test of metal materials such as iron and steel enterprises, standard parts manufacturers, and tool manufacturers to test the ability of metal to withstand upsetting plastic deformation under the specified forging ratio and display the metal surface characteristics.
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Bridge Decking Testing Equipment
The testing process can detect blow holes, inclusions or thin areas in 'sprayed-type' membranes. Because the concrete contains a small amount of water, it is electrically conductive and a DC Pinhole Detector can be used to create a high voltage which is passed over the surface by the use of a brush electrode. An alarm will sound to identify any small defects which can be rectified so that the integrity of the coating can be verified.
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Mini Visual Laser Source
TM536 Series
TM536 Series Mini Visual Laser Source totally complies with the human engineering. It's small in size, easy to operate, portable and integrated with a launching indicator. A Visual Laser Source is usually used to inspect the damaged or broken point of a optical fiber, cable, patchcord and etc.If the inspected fiber does have a defect, user could find the visual laser at the broken or damaged point. TM536 Series Mini Visual Laser Source is suitable for both single mode and multimode fibers. The performance of the visual laser source will act a little different on different fiber coat and color.
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Vison Inspection System
High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Electrical Testing
Board defects are never an option. Your customer expects perfect boards, each time, every time. Electrical testing is the key in ensuring that the connectivity of a PCB is precisely as specified and that there are no defects or flaws that may cause problems down the line.
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Review System
RV-3000
Reduces surface inspection device review time and contributes to greater inspection efficiency! This system uses address information for defects detected by surface inspection equipment to acquire images of defects with a high level of magnification, and categorizes defect types.
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Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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Software to Order
Our company develops turnkey technical vision systems, including writing software for specific tasks of the Customer, such as:- image capture- algorithms for localization and detection of objects- recognitionalgorithms - inspection algorithms, defect detection- logging and archiving- interface operator- programming FPGAs and controllersand much more
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Line Scan Vision System
In-Sight 9902L
The In-Sight 9902L 2K line scan smart camera is a high resolution self-contained vision system ideal for detailed inspections of large, cylindrical, or continuously moving objects. The 9902L acquires up to 16,000 lines of 2,000 pixels per line to produce a 32MP image that can used to detect even the smallest features and defects. Each pixel line is acquired at 67,000 lines per second to keep up with the fastest production lines. This standalone vision system only requires a small view of the target part, making it an ideal choice for installations with restrictive field of view or mounting space requirements.
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CapaConnect repair defective capacitive string parts
CC-LRP3/4+KS+DS
Hachmann Innovative Elektronik
With modules of CapaConnect series you can repair defective capacitive string parts of older installations, or retrofit string parts, where until now only direct cable taps are available. The connections to coupling dielectrics and earth can be carried out without an expensive dismantling normally, as the module contains all necessary components, like surge arresters, plug-in positions for adjustment capacities and high-quality contacts.
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1μΩ-4kΩ AC Milliohmmeter Low Resistance Tester
TH2521
Shenzhen Chuangxin Instruments Co., Ltd.
TH2521 AC Milliohmmeter is a high-performance and intelligent tester widely used to test contact resistance, internal resistance and battery voltage. The application of constant current source with 1kHz frequency can greatly eliminate the potential error caused by thermoelectricity on DUT. This meter has the function to automatically detect contact failures on test cable. At the range of 30mΩ, basic R resolution can reach 1μΩ. It is applicable for transformer, inductance coil copper resistance, relay contact resistance, switch, connector contact resistance, wire resistance, PCB line and via reistance dan metal defect detection, etc. In the mean time, signals, such as HIGH, LOW, PASS, can be output through HANDLER interface, thus it is very convenient to be used in automatic production line.
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Static Code Analysis Tool
Klockwork
Klocwork integrates seamlessly into desktop IDEs, build systems, continuous integration tools, and any team's natural workflow. Mirroring how code is developed at any stage, Klocwork prevents defects and finds vulnerabilities on-the-fly, as code is being written.
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PXI Fault Insertion Matrix Modules
All of our fault insertion matrices feature a breakout arrangement that allows faults to be attached to the sensor lines via the Y axis. This includes the breaking of a connection or the adding of a series defect – all of which can simulate connectivity problems in the system. The three pin breakout versions allow the connection to be swapped for a “bad” sensor simulation.
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Dual Filament Source
Get the optimal thermal profile for different materials and situations with the Veeco Dual Filament Source. This source is designed for growing high-quality Ga- and In-containing materials, while preventing charge material recondensation and significantly reducing defects. Dual Filament Sources are available for use with both SUMO and conventional crucibles (including Group III production crucibles).
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Test Systems
Testing is more than just finding defects on Printed Circuit Boards. It is also about how to predict defects before they occur. A true economy can only be achieved when you see testing as an integrated part of manufacturing. To achieve this we provide Advanced Diagnostic Tools and Electronic Manufacturing Systems (EMS) that integrate testing with design, manufacturing, and repair.
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Nano-focus X-ray Inspection System
X-eye NF120
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Defect Inspection System
NovusEdge
The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
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Compact Manual Laser Repair System
LRS-2400
LRS-2400 reads the defect data and navigates to the exact location of the defect. With a high power microscope the user can perform tasks as described below.
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Power Line Purpose Tester
LX-221A+
Shenzhen Lian Xin Technology Co., Ltd.
·Meet UL, VDE, CSA, SAA, T-MARK, KS. IRAM, CCC and other countries’ standards .·Used to test single – ends ,double –ends ,three-ends power supply cords.·Auto and continuous test in COND,Insulation Resistance ,Leakage Current, Line-to-line Hi-pot(inside HV), Leaking copper(outside HV), relative length,·Auto test the fine and detective goods, tested qualified ones can be be ejected by ejector pin and marked , automatic cutting defective products， and alarmed with voice prompt and light,·Provide with RS 232 interfaces, can communicate with PC, easy to upgrade,·Provide personalized customization according to different requirements.
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3D Sensor (Shiny Surfaces)
reflectCONTROL
reflectCONTROL is designed specifically to meet the high quality requirements that ensure high quality for shiny surfaces. The system based on deflectometry projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.
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Soldering Inspection Video Microscope
MS-1000
The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Automated Optical Inspection (AOI)
TR7700 SIII 3D
TRI’s ground breaking 3D AOI solution delivers the fastest hybrid PCB inspection combining optical and blue-laser-based true 3D profile measurement for the highest automated defect symptom coverage possible. Integrated state-of-the-art software solution and third generation intelligent hardware platform offer stable and robust 3D solder and component defect inspection and with high inspection coverage and easy programming.
