Defect
other than specified, imperfection .
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Product
SDT Checker Range
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With a focused solution for every problem, the Checker range makes ultrasound available to everyone. Choose the right tool for the right job and perform fast troubleshooting inspections. As a first defense against breakdown, Checkers identify defects quick and early, allowing for deeper analysis and trending with an SDT200, SDT270 or SDT340.
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Product
Test Services For Circuit Board
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Acculogic Contract Testing Services group with multiple locations in United States, Canada, Germany and China provides Cost Effective, On-Demand (Quick-Turn) testing service. Our circuit board assembly test services include defect analysis, In-Circuit, Boundary Scan JTAG and Functional testing on industries most widely used test platforms.
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Product
In-Process Test OTDR
8000i
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The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
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Product
Vision Sensors
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Companies in a wide range of industries rely on vision sensors to perform simple pass/fail, go/no go inspections that help ensure products and packaging are error-free and meet strict quality standards. Cognex In-Sight 2000 vision sensors provide easy and reliable inspections thanks to powerful vision tools, modular lighting and optics, and an easy-to-use setup environment. By reducing defects and increasing yield, Cognex vision sensors help manufacturers streamline their operations and increase profitability.
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Product
Welding Resistance Tester
WRT
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The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
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Product
X Ray Flaw Detector
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A non-destructive testing (NDT) device used to inspect materials for internal flaws or defects such as cracks, voids, inclusions, and weld discontinuities.
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Product
Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Product
Monitroing and Control
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THANKS TO OUR ADVANCED DATA ANALYSIS FUNCTION AND EASY-TO-VIEW USER INTERFACE, YOU CAN IMPLEMENT SPC WITH VERY LITTLE EXTRA WORK. OUR MONITORING SOLUTION IS DESIGNED TO IMPROVE THE TRACKING THE DEFECT AND CAN BE EASILY CORRELATED WITH YOUR MANUFACTURING PARAMETERS FOR ROOT-CAUSE ANALYSIS.
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Product
Bushing Monitoring
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Qualitrol Bushing Monitor System is an on-line Tanδ (PF) and Capacitance monitoring system for substation bushings. It measures the phase difference induced by capacitive layers of bushings and calculates the rate of change to predict defects in bushing insulation.
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Product
Wafer Internal Inspection System
INSPECTRA® IR Series
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An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Product
Manufacturing Defects Analyzer
eloZ1-400
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The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1-400 is the compact version of the eloZ1. It is particularly suitable if there is only limited space to fit test appliances. The eloZ1-400 can also be used as a mobile test system.
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Product
TorqueLab® Torque Analyzer
LTT-Series
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The torque analyzer is designed for calibrating tools, joint testing, auditing and measuring torque. Torque tools go out of calibration with use. To maintain consistent accuracy, torque tools must be checked periodically for wear or defective parts. A power or hand torque tool is a measuring tool that must be properly calibrated and maintained. The LTT-Series is an advanced torque testing and documentation solution. Using a quality torque tester makes a safer world through accuracy and precision. Controlling torque is essential for companies to ensure their product’s quality, safety and reliability isn’t compromised.
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Product
Relay and Protection Testing
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HAOMAI Electric Test Equipment Co., Ltd.
These tests are done to show that protection relays are free from defects during manufacturing process.
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Product
Sorter
IV-200I
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IV-200I is a sorter for package in pocket tape that features a lot summary information. This product is used for mapping data with Defect Code Data/Report as well as exporting data or report archiving. IV-200I works well with an In.D X-ray Image Analyser.
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Product
Backplane Profiling & Inspection System
603d
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A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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Product
Flaw Detectors
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Flaw detectors are essential for ensuring the safety and quality of industrial products. They accurately identify defects such as cracks, voids, and inclusions without damaging the materials. Ultrasonic testing is particularly notable for its precision and versatility among the various non-destructive testing methods.
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Product
Reject Station for X-Ray Image Analyser
IV-110I
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IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
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Product
Protection Device Testing
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The Motwane Manufacturing Company
Power system protection is a branch of electrical power engineering that focuses on protecting electrical power systems to detect and isolate faulty parts. The objective is to keep the power system stable by separating only the defective components while keeping the rest of the network in operation. The device protects the transmission lines, generator transformer, and other electrical apparatus from multiple faults.
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Product
Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Product
Environmental Stress Screening (ESS) Chamber
ESS
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Developed to help electronics manufacturers detect product defects and production flaws, Environmental Stress Screening (ESS) forces infancy product failures that would otherwise occur after final assembly and product delivery. ESS’s goal is to improve profitability by eliminating defective products. ESS Systems can meet individual performance needs, product loading, and throughput requirements. Thermotron has the experience to provide the best solution for ESS testing at your company.
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Product
LED Light Tester
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The T100L Automatic LED Light Test Equipment is designed to identify the presence of any defects of electronic components for LED light applications, addressing any high-volume production testing challenges without needing expensive test fixtures with fiber optics
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Product
Automatic Battery Testers
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T100BT is an innovative, modular battery testing equipment able to combine, on a single test platform, all the tests required to detect any possible defect on battery cells and modules: from defective cell wiring, to geometrical or surface irregularities, to out-of-specs performances.The battery tester is designed for the high-volume production test of battery modules composed by prismatic, cylindrical, or pouch cells, as well in a Lab/NPI version for engineering, prototypes and low-volume battery testing. The complete configurability allows you to equip the tester with the modules and tools you need to test your products, reaching the desired throughput.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Ultrasonic Testing
Pundit 250 Array
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The Pundit 250 Array brings a quantum leap in the ultrasonic pulse echo testing. A number of unique innovations make the Ultrasonic multi-channel instrument the best and fastest solution for thickness measurements, detecting defects and localizing objects which cannot be easily detected by any other technology. This includes the assessment of thick concrete elements such as tunnel linings as well as pipes and tendon ducts beyond the rebar layer.
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Product
Cross Sections and Metallography
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Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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Product
Power Steering Tester Kit
PST22A
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Pinpoints defective power steering pumps, defective power steering gears and kinked or clogged power steering lines.
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Product
(AOI) Automated Optical Inspection Systems
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For automated defect detection and high-accuracy measurements. VisionGauge Online High-Speed AOI systems are perfect solutions for demanding high-throughput, high-resolution applications. These systems are perfect for a wide range of applications including MicroElectroMechanical systems (for MEMS inspection or MEMS measurement), semiconductor & discrete device inspection and measurement.
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Product
PoE Transient Test Meter
Trans-Guard 910016
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GrayStone Automation's innovative DCVBD voltage breakdown meter measures the breakdown voltage of many lightning protection devices and components to identify transient protection devices that may be damaged or defective and help prevent costly transient damage to critical and expensive equipment.
