Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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PXI 2.5W Programmable Resistor Module, 1-Channel, 2.5Ω to 395kΩ
40-251-142
Programmable Resistor Module
The 40-251-142 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 395kΩ with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
3U Intel® Core™ i7-4700EQ Quad-Core Processor-Based PXI Express Controller
PXIe-3985
Controller
The ADLINK PXIe-3985 PXI Express embedded controller, based on the fourth generation Intel® Core™ i7 processor is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications.
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Product
PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope
780319-03
Oscilloscope
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Product
Dynamic and Satatic Electro-Hydraulic Servo Testing Machine
PLS Series
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Jinan Testing Equipment IE Corporation
PLS series dynamic and static testing machine is produced according to the dynamic servo test technology. Our design of the electro--hydraulic servo testing system is unitized, standardized and modularized, which enhance the stability and reliability of the system. The electro-hydraulic servo testing system is mainly used to test the dynamic and static mechanical performance of material parts. Equipped with corresponding accessories, the servo-hydraulic testing system can do tensile, compression, low and high cycles, crack growth tests and other mechanical tests for various kinds of materials. The Dynamic and Static Testing Machine is widely used in the fields of aviation and aerospace, ship-building and military industries.
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Product
Scanning Tanks
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Our ultrasound test tank systems are custom built to suit your requirements and additional features can be included.
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Product
Test System for Circuit Breakers
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Spitzenberger & Spies GmbH & Co. KG
Thermal testing with long-time currents up to 550 A. Magnetic testing with short-time currents up to 2000 A. Control software. Customer specifically adapted. 4 candidate records with pneumatic adapting.
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Product
Universal Frequency Counters
GT210PXI-2
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GuideTech’s GT210PXI-2 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system with optimal cost. The ability to precisely resolve frequency and time yields both increased accuracy as well as reduced measurement time.
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Product
Solid State PIN Diode Transfer Switch, 100 MHz to 8 GHz
P9400A
Dual Transfer Switch
The Keysight P9400A solid state PIN diode transfer switch offers outstanding performance in terms of port-to-port isolation, switching speed and low insertion loss over a broad operating frequency range of 100 MHz to 8 GHz. The P9400A is particularly well-suited for ultra-fast RF and microwave switching applications in instrumentation, communications, radar, switch matrices and various other test systems where high isolation, speed and lifetime of a switch are critical.
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Product
Environmental Test Systems
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Manufactured products can be exposed to both thermal and mechanical stresses.These should not be considered separately, as the effects may be linked.IMV can supply vibration-test systems combined with climatic chambers to provide complete vibration, temperature and humidity environmental testing.These systems can be custom-designed to meet your application.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Diagnostic Test System™
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The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Digital Closed Loop Control Thermal and Mechanical Testing System
3800 System
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The Gleeble 3800 is a fully integrated digital closed loop control thermal and mechanical testing system. Easy-to-use Windows based computer software, combined with an array of powerful processors, provides an extremely user-friendly interface to create, run and analyze data from thermal-mechanical tests and physical simulation programs.The result is a system unequaled for physical simulation and thermal-mechanical materials testing.
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Product
PXI-2556, 2.5 GHz, 75 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-56
Multiplexer Module
2.5 GHz, 75 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2556 is an RF signal multiplexer switch module. The multi-bank architecture of the NI PXI‑2556 makes it ideal for test systems that require parallel operations such as the stimulus/response testing of video RF devices such as tuners. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
AC Power Sources
RS Series
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AMETEK Programmable Power, Inc.
The RS Series consists of multiple high power AC and DC power systems that provide controlled AC and DC output for ATE and product test applications. This high power AC and DC test system covers a wide spectrum of AC and DC power applications at an affordable cost. Using state-of-the-art PWM switching techniques, the RS series combines compactness, robustness and functionality in a compact floor-standing chassis, no larger than a typical office copying machine. This higher power density has been accomplished without the need to resort to elaborate cooling schemes or additional installation wiring. Simply roll the RS unit to its designated location (using included casters), plug it in, and the RS series is ready to work for you.
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Open Frame Chassis
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The Hartmann Electronic Open Frame Development Chassis Series is our most diverse system yet. Available for 3U or 6U, with 34HP or 50HP with space for up to 12 slots, this versatile test system is sure to be an engineer’s best friend. A strong frame with an adjustable locking grab handle, along with a light-weight design make our Open Frame Chassis the perfect companion for easy transport from the lab to the testing grounds.
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LCR Meter
TH2811D
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Changzhou Tonghui Electronic Co., Ltd.
TH2810D/TH2811D LCR meter is our newly developed successor instrument for low frequency component measurement. TH2810D/TH2811D with its latest measurement technologies, large character LCD display, surface mount technics, easy of use and excellent appearance can be used for quality control on production line, incoming inspection of components and automatic test system. The RS-232C interface can be used to carry out remote control and statistics and analysis of measurement results.
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Product
PXI 5W Programmable Resistor Module, 4-Channel, 1Ω to 239Ω
40-252-013
Programmable Resistor Module
The 40-252-013 is a programmable resistor module with 4 channels which can be set between 1Ω and 239Ω with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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System for Analyzing Door Handles
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In the production process of a vehicle door handle, the electrical functions of the component are to be tested. The mechanical testing of the operation of the door handle is performed by a PLC-controlled test system. In addition to the mechanical test, the electrical parameters: “serial data stream” and “impedance of the antenna” are to be analysed.
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Combustion Enginee Analyzer
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Internal Combustion Engine Measurement, Analysis and ThermodynamicsComplete combustion measurement and analysis system for internal combustion engine research and development, optimization and testing of ignition systems, exhaust systems, and valve control gear.
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Benchtop Discrete Component Tester
Imapact 7BT
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The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
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Product
PCI High Density Pecision Resistor Card, 18-Channel, 2Ω To 122Ω
50-298-012
Programmable Resistor Module
The 50-298-012 is a high density programmable resistor card with 18 channels which can be set between 2Ω and 122Ω with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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VCS
Test Specimen Parameters
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a program from the scope of ZETLAB VIBRO software suite. The update of the software suite ZETLAB VIBRO includes a new user-friendly interface as well as a wide range of new functions, allowing the user to configure parameters of the vibration test system with the maximal possible prevention of errors occurrence.
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Test Signal Generators
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MicroImage Video Systems has a broad array of video test signal and color bar?generators designed for many applications from laboratory and testing to embedded systems. MicroImage Video Systems can design a video test signal generator for your applications. In fact, we have designed many more custom test signal generators that we offer as standard products. Small size is important and our video test signal generators start at just 1.5 inches square.
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Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Product
24-Bit Precision Load Cell Input Card
PCI-9524
Analog Input Module
The PCI-9524 is a robust, multi-purpose module designed for turnkey material test systems (MTS). Equipped with four strain gauge-based transducer input channels, four general purpose analog input channels, and a 3-axis motion controller, the PCI-9524 delivers a complete hardware solution for MTS manufacturers. The PCI-9524 easily integrates physical quantity measurement and implements strategy of close-loop control in a single module package. For transducer measurement, the PCI-9524 supports sensitivity from 1.0 mV/V to 4.0 mV/V and provides a 1/200000 accuracy of measurement of full scale. These features make the PCI-9524 suitable for precise measurement in large-scale transducers.
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Test Automation System for Durability Testing
STARS MATS
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STARS MATS is a Mileage Accumulation Test System application available with the STARS Automation platform for chassis dynamometer. The application provides test execution, equipment control, refueling, and vehicle state monitoring to perform long endurance test without the necessity of continuous staff presence. Its flexible design offers a wide range a customization, and it addresses the different testing requirements from manual to fully-automated operation.
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High Voltage Test System
CKT1175-15
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12.5 mV – 2000 VDCIR measurements to 5000 megohmsHipot testingDwell time prog. from 1 ms to 1000s in 1 ms steps
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,30 kg
