Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
Electronic Load Device
786529-01
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The RMX-4003 provides capabilities for qualifying power designs and validating power supply functionality in a production environment. You can combine Electronic Load Devices to customize your test system based on the number of channels, maximum load power, and voltage and current of each channel.
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Product
Maintenance & Maintenance-/Service Contract
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With cars it is easy: Change of oil, check of breaks and V-belt .. etc. - that is normal. But your test system does not need all these things. However it makes sense to look after your test system occasionally and check or change special idems. If you take the time and plan a preventive maintenance your test system will have less unplanned failure times. Less dust means less heat and slower ageing of electronic components.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
42-878-212
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The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Product
Gel Strength Test System
LD-LGST-A10
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Gel Strength Test SystemLD-LGST-A10is mainly used to measure the gel strength of gelatine under the stipulated environment. It has traveling accuracy ± 0.3 % and Test range up to 5 to 1000 g Bloom. It consists of Jelly Strength Tester, Constant Temperature Bath and Refrigerator. Sampling depth can be present arbitrarily in 1 to 60 mm. It consists four kinds of sampling measurement modes: single-step, maintaining, circulating and automatic.
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Product
In-Circuit Test System Calibrations
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Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Software for Testing Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
We offer extensive and powerful software packages for our systems. All of our testing systems are controlled with our Hillgus testing software and the test results are stored in our open file formats. With our evaluation software Oculus, the findings can be subsequently evaluated and documented. Both Hillgus and Oculus were developed in-house and are constantly being improved. Due to the modular structure, the software can be optimized for every requirement and expanded at any time.
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Product
LT-300A Aging-Life Test System For LED Luminaires
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Product
IC Testing System
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Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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Product
Shock Test System
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Labtone Test Equipment Co., LTD
Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability and sometimes the object may fail. Therefore, it's necessary to study the effect of impact and reproduce the shock environment, to assess the structural strenghth and performance of the object under shock environment.
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Product
PCIe 3.0 and 4.0 Compliance Testing
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Teledyne LeCroy offers an integrated and automated compliance testing system, approved by the PCI-SIG as a standard tool for Link and Transaction Layer Compliance testing for developers working with the PCIe 3.0 and PCIe 4.0 specification. This solution combines a Summit Z416 Exerciser and a PCI Express Test Platform (for testing End-Point devices) This system has been selected by the PCI-SIG as a standard test tool for PCI Express 3.0 and PCI Express 4.0 Link and Transaction Layer Compliance Testing.
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Product
NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
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The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Product
Primary Current Injection Test Set
T 3000
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T 3000 is a primary current injection testing system designed to perform primary tests requested in substations commissioning. It allows to perform different tests and measurements on current transformers, voltage transformers, power transformers, protection relays, energy meters and transducers
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Product
Mini Rack 60*60*60cm
OTP2 module no.001
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The rack serves as the basic structure for your individually designed test system. Various OTP² modules can be installed in the 60 x 60 x 60 cm rack in order to implement a wide variety of test requirements.
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Product
Electronic Loads
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Chroma Systems Solutions, Inc.
Power conversion testing for automated test systems, LED drivers, power supply testing, battery testing, and much more.
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Product
PCI Precision Resistor Card 4-Channel, 2Ω To 52.4kΩ
50-297-133
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Coefficient of Friction Gauges
M5-2-COF
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The M5-2-COF coefficient of friction (COF) gauge is an integral part of a COF testing system, typically including a motorized test stand and COF fixture. With a capacity of 2 lbF [10 N], the gauge can be used to measure friction for a wide range of materials, ideal for conformance to ASTM D1894 and other relevant standards. Static and kinetic coefficients are displayed on the backlit LCD, and are calculated from a user-programmable sled weight.
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Product
Custom Power On Option
U8002A-AUT
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This option helps users to eliminate manual intervention on instrument control when they use U8000 series power supplies in a test system. The behavior of this option and standard units are the same after power up, where the "Output ON/OFF" button is still accessible throughout the supply operations.
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Product
In-Circuit Test System
TestStation LX
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TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Test Automation Solution
CONFORMIQ TRANSFORMER
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Conformiq Transformer shortens the path to test automation, simplifies model-based testing (MBT) adoption using existing methods, and automates manual test execution. Along with Conformiq Creator, which generates executable test cases, scripts and documentation from models, it automates and transforms test design, extending the Conformiq 360° Test Automation™ solution for complex system testing at the speed of development.
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Product
SF6 Gas Online Monitor Test System
KVXJ
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KV Hipot Power Test Equipment Co.,Ltd
KVXJ SF6 Gas Online Monitor Test System is mainly applied on 35KV SF6 500KV, 220KV, 110KV GIS in the substation to monitor the SF6 gas leakage in the SF6 combined electrical equipment room environment and the oxygen content in the air in real time.
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Product
Capacitance & Tan-Delta Test System
TD-1
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By measuring the electrical properties such as capacitance and Tan-Delta regularly on periodical basis, it is possible to ensure the operational unexpected breakdown. Dissipation factor (Tan Delta) is one of the most powerful off-line nondestructive diagnostic tool to monitor the condition of solid insulation of various high voltage equipment.
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Product
PXI 5W Programmable Resistor Module, 1-Channel, 1.5Ω to 1.81kΩ
40-252-122
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The 40-252-122 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI Digital Multimeters - DMM
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All three PXI-DMMs deliver market-leading speed at their price points, measuring up to 15,000 readings/s with a maximum single-reading rate of 66 µs. These fast reading speeds translate into higher test system throughput and lower cost of test. Advanced triggering, enhanced functionality, and a full suite of free software simplify system integration and operation.
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Product
Modulation Distortion Up To 70 GHz
S930707B
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S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
VFTLP+ Test System
4012
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The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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FMET Systems
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The Failure Mode and Effect Testing system allows the shorting of any I/O pin to any other I/O pin, including one of 4 common "Rails". Users can establish rules to prevent unwanted shorting conditions.
