Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
Semiconductor Test
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Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
ESD Packaging Test Kit
PRF-911PT
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The PRF-911 Concentric Ring is to be attached to the PRS-801B Resistance System included in this Packaging Test Kit. This system will also give you surface resistivity by multiplying the surface resistance measurement in ohms by 10 to obtain surface resistivity in ohms/square. The PRF-911PT meets requirements from ANSI/ESD STM11.11, ANSI/ESD STM11.12 snd IEC 61340-2-3. It will also approximate surface and volume resistivity measurements per ASTM D-257.
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Product
Printed Circuit Board Testing Solutions
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IES Systems is a turnkey test systems solution provider with 10 years of proven experience in printed circuit board testing solutions. Our experienced engineers design electro/mechanical solutions to interface between your product and our custom designed test instrumentation. We provide a complete solution to your PC board testing needs.
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Product
PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
Programmable Power Supply
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Product
Handover Emulator
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Qosmotec Software Solutions GmbH
The Qosmotec handover test system QPER is a versatile test platform for emulating the RF signal between radio devices in a wireless network, e.g., between mobile stations and radio infrastructure of a mobile network. It is employed in test beds where radio signals are transmitted through coaxial cables and specifically manipulated by testers. QPER can be based on various hardware platforms, from attenuator arrays to digital channel emulators.
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Product
Meter Test Board
MTB-3200
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Run standard meter accuracy tests and complex meter accuracy tests under widely varying loading conditions with TESCO’s Meter Test Board (MTB-3200). TESCO’s Three Phase Meter Test Board (MTB-3200) is an innovative meter accuracy test system offering unsurpassed functionality and ease of use. All of the features needed to test meters today and tomorrow are standard.
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Product
PD Test Systems
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1. Number of channels: 2/4 electric signal interfaces & 1 EXT interface 2. Sampling frequency: maximum 200MGa/s 3. Sampling precision: 12bit 4. Range: 0.1mV~20V 5. Range switch: 1mV, 2mV, 5mV, 10mV, 20mV, 50mV, 100mV, 200mV, 500mV, 1V, 2V, 5V 6. Frequency band range: 1Hz-60MHz 7. Range non-linear error: 5% 8. Range of capacitance for test object: 6pF~250µF 9. Power source mode: internal lithium cell / AC 220V 10. Display: 6.5 inches TFT LCD 11. Resolution: 640×480 12. PV: 4GB 13. Hard disk: 32G stiff disk used for storing the test data
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Product
AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Product
Current Transformer Analyzer/Tester
GF1061
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Beijing GFUVE Electronics Co.,Ltd.
Portable CT PT analyzer is mainly used for field or lab testing, it can finish the measurements (M) and protection (P) class CT, PT and TYP class CT. Adopt 7 inch touch TFT LCD, self-equipped mini type printer supporting field printing; supporting to use USB flash disk to download data or RS232 port to PC control. This model GF1061 CT PT analyzer is the most complete and easy-to-use testing system for protection and metering CTs according to IEEE C57.13 and IEC60044 & IEC61869 standards.
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Product
VXI D/A Converters
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With Keysight Technologies' digital to analog converters, you can control devices under test or simulate sensors in a VXI-based test system.
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Product
Power Discrete Tester
Mostrak-2
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M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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Product
Mechanical Creep and Rupture Testing Machine
MRC Series
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Jinan Testing Equipment IE Corporation
MRC series mechanical creep and rupture testing machine with single-lever structure is designed for long-term creep and stress rupture test applications. The series mechanical creep and rupture testing system is mainly for the metallic materials under room or elevated temperature according to GB/T2039, GB/T 20120, EN ISO 204-2009 and ASTM E139. The creep and rupture testing machine can also maintain constant loads for extended periods of time. Through the mechanical advantage of the lever arm loading system, constant loads can be maintained with a high degree of accuracy for long duration. This creep and rupture tester uses dead weights without continuous operation and the dependency of a mechanically powered drive. The creep and rupture testing system is an ideal equipment for metallurgy manufacturer, research institute, colleges and other relevant factories and mines.
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Product
Stationary Drive Test System
ACTAS CF80
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Stationary test system for sequential final factory tests and function tests on up to 8 drives. The drive test system is operated and controlled with the ACTAS operating software. The test position is selected using the multiplex method. The test system can reproduce drive control with the aid of a logic module. This makes it possible to test any drive even if there is no control unit.
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Product
GSP-2B Test System Interface Probe
GSP-2B
ICT/FCT Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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Product
PXI High Density Precision Resistor Module, 3-Channel, 4Ω to 11.4MΩ
40-298-153
Programmable Resistor Module
The 40-298-153 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 11.4MΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Portable Test System
MT781
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Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Product
Power Meter
P-Series
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The N8262A is a compact and slim LXI-compliant P-Series modular power meter. The N8262A helps you to reduce your test system size and enables LAN-based automated power measurements. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
BitPhyer Tools
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BitPhyer is a family of hardware platforms used to test the IEEE 802.3™ MAC, Flow Control, PCS and RS layers for Ethernet devices, including Automotive Ethernet. This platform is based on Xilinx FPGAs and custom built hardware which are used to create a flexible bit-level based test system.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
PCI High Density Pecision Resistor Card, 4-Channel, 3Ω To 6.97kΩ
50-298-130
Programmable Resistor Module
The 50-298-130 is a high density programmable resistor card with 4 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Test System
2000/DATS
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WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
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Product
NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
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The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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Product
Camera Testing
FLIR
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CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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Product
PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 22.3MΩ
50-298-154
Programmable Resistor Module
The 50-298-154 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 22.3MΩ with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Boundary Scan Compliance Tester
QT900
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Qmax Test Technologies Pvt. Ltd.
QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IO’s capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.
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Product
PCI Precision Resistor Card 9-Channel, 1.5Ω To 472Ω
50-297-020
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
