Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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High Energy Shock Test System
KRD13 series
KRD13 series high energy shock test system is specially designed to meet the requirements of military and automotive testing. The system adopts the principle of pneumatic energy storage expansion. By adjusting the inflation pressure, various high-level acceleration tests can be easily implemented in a short stroke.For the high-G classic shock test, it’s equipped with the corresponding shock amplifier to complete high-peak shock test.
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NFC Physical Layer Test System
IQnfc+
LitePoint provides turn-key software that facilitates test coil calibration, executes test plan and provides detailed waveform analysis and flexible APIs to customize test flow in the labs.
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Dynamic and Fatigue Testing Systems
Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
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Automated Switch Test Equipment
TRICOR Systems Inc. offers test equipment for switches, keypads, rubber, etc. Virtually any component where accurate force-displacement and measurements are required. From our Model 933A, a low cost life test system to our Model 925 test station used to obtain precise force measurements relative to displacement; we have the system you require.
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Automatic Transformer Comprehensive Test System
TH2837LX
Changzhou Tonghui Electronic Co., Ltd.
Automatic Transformer Comprehensive Test System
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Electrodynamic shakers
EV232
Labtone Test Equipment Co., LTD
Labtone EV series of electromagnetic vibration testing system simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications. In the laboratory, with the aid of vibration testing system, simulations of reproduction of sinusoidal, random, resonant search and dwell, classical shock and road models, etc. can be achieved. It is essential for product quality assurance, new product research and development.
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Goniophotometer Test System For Led Lamp
1680A 1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341,the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Modular DC Electronic Load
N3300A Series
The new N3300A Series of dc electronic loads is fast, accurate, and ideal for increasing production throughput in high volume dc power supply manufacturing. This series consists of a full rack width (1800 watts max) mainframe and a half rack width (600 watts max) mainframe, and 7 interchangeable electronic load modules. The modules provide a variety of voltage, current and power ratings. New dc connectors for test system configurations are now available on all modules.
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Tire Rolling Resistance Test System
This system measures the rolling resistance of each tire accurately. In addition to the simultaneous measurement of tire loss resistance and rolling resistance coefficient for each drive by mode operation (JC08, WLTC), coasting test, constant acceleration/deceleration test and transient mode test are able to be performed. Furthermore, measurement of driving noise/ vibration of the tire, effect of the tire loss due to the temperature change can be verified by adding options.Conforming the JIS D 4234: 2009 and ISO 28580: 2009.
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Ultrasound Transducers
Utilizing optical and semiconductor fabrication techniques, Imaginant manufactures the PureView PrecisionTM line of RoHS-compliant delay-line ultrasound transducers with center frequencies ranging from 50 MHz to 250 MHz (higher and lower transducer frequencies are also available). Imaginant's precision-manufacturing process produces transducers that exhibit high reliability and high uniformity from device to device. This manufacturing consistency enables uniform test system performance to be attained across multiple systems. Imaginant transducers are available in focused and flat-face models that can be produced with minimal-damping for applications requiring maximal sensitivity or with maximal-damping and high-bandwidth for applications requiring the highest-degree of temporal precision.
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Fastest Flying Probe Test System for Semiconductor Substrate Interconnect Test
GATS-3200
* Test individual packages or * Test Multi-image panels with Step&Repeat Function * single flying probe top using very high speed voice coil motor (VCM) technology * 50 - 100 tests per second ... high throughput * Dual Flying Probe Top for testing bump-to-bump nets * flying probe head allows testing of all nets including each power and ground point * 4-wire test capability
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PCI High Density Pecision Resistor Card, 6-Channel, 4Ω To 1.51MΩ
50-298-050
The 50-298-050 is a high density programmable resistor card with 6 channels which can be set between 4Ω and 1.51MΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Automatic Transformer Test System
TH2840AX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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Pneumatic Vertical Shock Response Spectrum Test System
KRD14 series
KRD14 series pneumatic shock response spectrum tester is used to measure and determine the shock resistance of electrical and electronic products or packaging, and to evaluate the reliability and structural integrity of the test product in a shock environment. The shock response spectrum is the total result of a series of single-degree-of-freedom linear systems with different natural frequencies subjected to the same shock excitation response. When a product is subjected to an impact, the maximum value of its impact response means that the product has a maximum stress. Therefore, the shock response spectrum tester can better simulate the shock wave and shock energy suffered in the real environment.
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Primary Injection Test Systems
Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Pump, Hydrostatic Test, 15,000 psi
9901-150L
Hydrostatic test pump may be utilized as a standalone unit or combined with any of our reservoirs, safety test chambers, test fittings or other optional equipment to achieve a complete hydrostatic test system. with integral safety test chamber.
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PXI High Density Precision Resistor Module, 6-Channel, 4Ω to 1.51MΩ
40-298-050
The 40-298-150 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 1.51MΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PCI High Density Pecision Resistor Card, 9-Channel, 3Ω To 6.97kΩ
50-298-030
The 50-298-030 is a high density programmable resistor card with 9 channels which can be set between 3Ω and 6.97kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Engineering Support Platform
ESP
ESP, or Engineering Support Platform, is a low cost, powerful and versatile platform for the development, deployment and support of FPGA Applications. ESP is powered by DSX core, ARC’s core element for the development and deployment of digital and mixed signal systems. The standard system contains 2 custom FPGA system, often configured in combination where one acts as the application firmware, and the other is used for test. But the system is expandable and configurable in any combination to solve any problem in a digital, analog or mixed signal system. The FPGAs can be configured to generate, analyze, process and/or output complex signals at a wide range of voltages, frequencies and serial protocols. It has been used to develop solutions for Radar systems, testers, Pattern Generation, digital signal processing and generating, Video processing, and many more. ESP comes as a desktop or rack mounted solution, and no special interfaces are needed.
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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PCI High Density Pecision Resistor Card, 3-Channel, 3.5Ω To 102kΩ
50-298-140
The 50-298-140 is a high density programmable resistor card with 3 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Midirack - 120 x 60 x 80 cm
OTP2-Modul-Nr002
The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 120 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Electromagnetic anechoic box/Shield box/Anechoic chamber
The necessity of a wireless system test has risen by the spread of recent wireless telecommunication equipment as shown in cellular phone, wireless LAN, RF-ID tag and ETC (Electronic Toll Collection system). It is necessary for a wireless test to be performed in anechoic environment in which an external noise is intercepted and a radio wave does not reflect internally. An anechoic chamber (room version of a shield box) is proper facilities but needs a wide space and a huge cost. Especially, the equipment under wireless system test on the production line can not radiate any signal radio wave outside before approval. The shield box satisfies these conditions.
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PXI Versatile Multiplexer, Solid State, 250mA, 40V
40-682A-002
The 40-682A-002 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 250mA current and 40V voltage handling. The 40-682A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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FMET Systems
The Failure Mode and Effect Testing system allows the shorting of any I/O pin to any other I/O pin, including one of 4 common "Rails". Users can establish rules to prevent unwanted shorting conditions.
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MATCO BASIC MULTIMETER
MD251
*Provides readings for volts, amps and ohms required for automotive electrical system tests, as well as diode and continuity tests*Beep-Jack audible warning beeps against improper a-terminal plug in and decreases the risk of damage
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope
780319-01
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Fiber Identifier
OFI-20A
OFI-20A can detect optical signal presence, type and direction anywhere on fibers during optical network deployment, maintenance and troubleshooting. With non-destructive macro-bend detection technology, it introduces no damage to tested fiber or interference to the service on fiber. OFI-20A is able to identify wide-spectrum signals (such as signals in CATV system) and can be used in SONET/SDH & DWDM systems tests.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, SMB
40-878-241
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Automated Test Equipment
Viewpoint Systems offers design verification and manufacturing quality inspection systems to help customers reduce human error in repetitive tests, increase testing speeds, and ultimately get products to market faster at a lower cost. Viewpoint Transforms Test from Design to End-of-Line. Our R&D test systems are designed with the flexibility to validate ever-changing prototypes while accelerating your development schedule.
