Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
MU Cable Tester System
16814
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The MU Locomotive Trainline/Cable Test System (MU Test System) can perform shorts testing, continuity testing, and ground-leakage testing on each of the 27 pin Multi-Unit Trainlines normally found on Freight Locomotives. The MU Test System is comprised of two identical tester units. Each unit is installed in a rugged, water resistant Pelican case. Each unit contains an MU cable receptacle that mates with a 27 pin MU jumper cable. A snap-on vinyl pouch on the outside cover of each unit provides storage for the battery charger/power adapter and the chassis test lead. The enclosure cover hinges separate from the test unit as the cover is opened; this removes the cover completely to allow free access to the MU cable receptacle and the control panel.
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Product
PXI High Density Precision Resistor Module, 18-Channel, 2Ω to 122Ω
40-298-012
Programmable Resistor Module
The 40-298-012 is a high density programmable resistor module with 18 channels which can be set between 2Ω and 122Ω with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI Platform Completion Hardware
Platform
PXI Platform Completion Hardware enhances your PXI test systems. These products can monitor the health of a chassis, improve device synchronization, share data between systems, add data storage, and more.
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Product
Coaxial Matrix Switch, DC to 20 GHz
87606B
Matrix Switch Module
The Keysight 87606B matrix switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control creates a switch that meets the requirements for highly repeatable switching elements in test instruments and switching interfaces. The switch is designed to operate for more than 10 million cycles and will meet all electrical specifications for at least 5 million cycles. The switch exhibits exceptional insertion loss repeatability. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of the switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Product
PXI Precision Resistor Module 9-Channel, 1.5 to 472
40-297-020
Programmable Resistor Module
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1Ω to 122Ω
40-251-112
Programmable Resistor Module
The 40-251-112 is a programmable resistor module with 4 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Product
PCI 18 Channel Precision Resistor Card
50-297-001
Precision Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Product
Generators and Sources
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For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Product
Flight Simulator Tester
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Excalibur’s Flight-Sim Tester is a hardware and software solution for enabling near-real flight testing scenarios for airborne system testing (avionics testing).
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Product
PXI High Density Precision Resistor Module, 6-Channel, 3.5Ω to 201kΩ
40-298-041
Programmable Resistor Module
The 40-298-041 is a high density programmable resistor module with 6 channels which can be set between 3.5Ω and 201kΩ with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Microcomputer Three-phase Relay Test Set
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Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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Product
Boundary-Scan DIMM Socket Tester
ScanDIMM
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Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Product
FRP-25T Test System Interface Probe
FRP-25T
ICT/FCT Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 120Recommended Travel (mm): 3.05Overall Length (mil): 1,210Overall Length (mm): 30.73
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Product
Manual Flying Probe Test Systems
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They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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Product
PXI Versatile Multiplexer, Solid State, 125mA, 100V
40-683A-001
Multiplexer Module
The 40-683A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 125mA current and 100V voltage handling. The 40-683A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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Product
Shock/Bump Test System
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HIACC Engineering & Services Pvt. Ltd.
HIACC’s Shock/Bump Test System is a specialized, automated, and high-performance testing apparatus designed to simulate the impact, shocks, and repetitive jolts that electronic components, electronic products, and packaging experience during transportation or operational use.
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Product
Battery Checker
SK-8551
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Total condition check for 12V (24V) batteries. (Truck, Marine, Industry etc.)Battery check, Engine start performance, Charging system tests.
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Product
Communications System Analyzer
Freedom R8200
System
The Freedom R8200 from Astronics Test Systems represents a major step in the evolution of the Land Mobile Radio Test. The Freedom R8200 is the first and only test instrument that combines comprehensive digital and analog LMR testing with the ability to measure important RF network characteristics, such as Distance to Fault (DTF), Return Loss, and Voltage Standing Wave Ratio (VSWR). The Freedom R8200 is also the only service monitor with the abilityto display advanced RF Parameters in a Smith Chart for more complicated network analysis
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Product
IC Tester
ICE1
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The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Product
PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 201kΩ
40-298-141
Programmable Resistor Module
The 40-298-141 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 201kΩ with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PCI Precision Resistor Card 3-Channel, 3Ω To 1.51MΩ
50-297-150
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
MCB Thermal Trip Calibration Test Bench (IEC 60898 Cl 9.10.1.2, Annex I.1, IS)
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The test system is designed and customized to carry out 2.55*Intest as per Table 7 (test c) of IEC 60898 (also mentioned for routine testing of MCBs. The test is done at dc current to exactly analyze and correct the bimetallic properties of the MCB as far as thermal tripping is concerned. The unit comes with a pneumatically operated test fixture with in-built dc stepper motor that is controlled by a micro controller / PC to calibrate the breaker into a narrow tripping band programmed by the user.
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Product
Regenerative Battery Pack Test System
17040
Test System
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Product
Pickering's Software Drivers and Application Software Packages
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In test system development, the best hardware is only usable if its software control environment is robust and easy to use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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Product
Single-phase Relay Test Set
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Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations. It is further necessary that these expanding testing capabilities be met with a similar improvement in the simplification of a test instrument’s user interface and software control.
