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System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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System Test
Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Switching System Test Tools
EBIRST™
Switching systems are an important part of many test systems, however, the switching system is in a vulnerable place. When accidents happen that can cause a faulty device, you need a way to get the system up and running again with a minimum of effort and operator skills.
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System Test Fixture
Chassis Level Test Fixture, Set Box Test Fixture, and more by IST Engineering
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Scienlab Battery Test System - Cell Level
SL1007A
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Solenoid Test Systems
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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Electro-Dynamic Vibration Test System (Water Cooled)
HIACC Engineering & Services Pvt. Ltd.
Water-cooled systems are capable of performing a variety of vibration test procedures, including tri-axial sinusoidal vibration test as well as the classical (semi-sinusoidal, trapezoidal and post-peak sawtooth) pulse & shock response spectrum tests. When configured with HIACC climatic chamber, the water-cooled vibration test system can perform multi-environment vibration tests
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PXI/PXIe MEMS RF Multiplexer, Dual 4-Channel, 4GHz, 50Ω, SMB
40-878-221
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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JTAG Test Procedures
Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.
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4/8 Channel Optimal Multiport Power Meter
UC8728
UC INSTRUMENTS UC8728 4/8 CHANNEL OPTICAL MULITIPORT POWER METER are PC control multiport passive components power meter test system and offer superior performance for the test of multichannel DWDM, WSS, ROADM, AWG & PLC components and modules, optical amplifiers, DWDM system and other general purpose of multiport fiber optical test and measurement applications. The system can be integrated with tunable laser source, optical attenuator & PDL controller provides a high performance passive components and modules automatic test system platform.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 8.19k Ohm - SPST
40-294-124
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 1.51MΩ
40-252-050
The 40-252-050 is a programmable resistor module with 1 channel which can be set between 3Ω and 1.51MΩ with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI Programmable Resistor Card 2-Channel 2.5 Ohm to 1.02k Ohm
40-294-021
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Full Band Noise Figure and Gain Test Extenders
STG-06-S1
Full band noise figure and gain test extenders are offered to extend noise and gain measuring capabilities up to higher millimeterwave frequency ranges. These extenders are designed to interface with noise and gain test systems that have an input IF of 10 MHz to 1.6 GHz, such as the industry standard Keysight 8970A/B, N8975A and Maury MT 2075B. The noise figure and gain test extenders include a high-performance, solid-state noise source (STZ series) and a full waveguide down converter (STC series), which consists of a Faraday isolator (STF series), full band mixer (SFB series), frequency multiplier, and IF amplifier. A frequency source with an output signal in the frequency range of 10 to 20 GHz is required as a local oscillator for the down converter. The noise source is automatically powered on and off by the noise figure meter.
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TestStation Multi-Site Inline
TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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PCI High Density Potentiometer Card 4-Channel, 16-Bit, 0 To 65k Ohm
50-296A-121-4/16
The 50-296A series are Programmable Potentiometer versions of the 50-295A Programmable Resistor cards with up to 9-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Semiconductor Package Inspection System
NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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Flying Prober Test System
QTOUCH2204C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.
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Power Meter
P-Series
The N8262A is a compact and slim LXI-compliant P-Series modular power meter. The N8262A helps you to reduce your test system size and enables LAN-based automated power measurements. Owing to LXI test standardization and its interoperability with existing test assets, your system can be up and ready in no time.
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DynEDGE Controller
The DynEDGE controller offers an integrated, multi-loop control and data acquisition system in an off-the-shelf solution for dynamometer applications, including system modernizations, new installations, turnkey systems, and complete test cell control and data acquisition systems. The controller provides both speed and torque control with four control channels that can be configured for ±100 mA, ±10 V, and ±20 mA.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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370MHz To 6GHz Radiation Measurement System
RMS-0460
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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Test System
MxDSRC™
The MxDSRC Test System simulates systems in the vehicle that interact with the DSRC radio module to create tests closely replicating real-world scenarios. Its integrated approach allows the DSRC components, such as RF quality and protocol conformance, to be exercised with multiple system components. MxDSRC provides a powerful and easy-to-use framework for testing your DSRC system.
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Missile Warning System Test Set
Baringa™ IR/UV
Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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Systems Integration (SIL) Lab Data Acquisition
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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Blackbodies & Extended Area Sources
The Infinity Series of blackbody radiation sources and extended area sources combine leading edge technology with features that support the expanding test requirements of the latest high performance sensors. SBIR designs the most stable, uniform, accurate and highly emissive blackbodies available. SBIR now offers VANTABLACK®S-IR as an optional coating, providing the E-O test community an unprecedented flat plate source emisisivty. SBIR continues to offer blackbody systems that provide the test community with unequaled performance, reliability and ease of integration into test systems. Our blackbody family includes six different varieties to choose from. The Infinity line offers four types of precision blackbody systems and our extended area sources offer two additional types of precision blackbodies to support all levels of IR testing.
