System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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EW System Test Set
MS 1107
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PSS LRU Test Set is used to test the RWR (Radar Warning Receiver) system by simulating the input signals and testing the output signals.
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Missile Warning System Test Set
Baringa™ IR/UV
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Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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Weapon Control System Test Set
MS 1102
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- Provides serviceability checks on armament system- Portable instrument- Check the Bomb release sequence, practice bomb release sequence, rocket release sequence, fuzing, and jettison of aircraft stores- Helps to identify faults of conventional armament- Microprocessor based design
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Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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HSI System Test Panel
TA-500
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This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.
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System Level Test and Burn-in Solutions
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System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Embedded System Test Automation Software
ECU-TEST
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ECU-TEST is the software for automation tests used in the validation of embedded systems within the automotive industry. It can be used when designing, implementing, and evaluating different tests. It will generate intuitive test reports.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Scienlab Battery Test System — Cell Level
SL1002A
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Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Hydraulic Vertical Shock Test System
KRD10 series
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KRD10 series full-automatic hydraulic shock test system is used to measure and determine the impact resistance of products or packaging, and to evaluate the reliability and structural integrity of products in a shock environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, trapezoid wave and other waveform shock tests to achieve the shock wave and impact energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Automated Test System
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Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Electrophotography
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Quality Engineering Associates Inc.
Drawing on years of applications experience, QEA has developed a comprehensive line of tools for evaluating EP printer components and sub-systems. This unique family of test systems embodies innovative engineering solutions and a fundamental understanding of the physics of EP processes to give you “must-have” tools for high-speed printer R&D and quality control. These non-contact, non-destructive tools emulate the EP printing process and deliver quantitative data you can rely on. QEA tools are ideal for:
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PXI 2.5W Programmable Resistor Module, 2-Channel, 2Ω to 13.6kΩ
40-251-131
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The 40-251-131 is a programmable resistor module with 2 channels which can be set between 2Ω and 13.6kΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Remote Docking Fixtures
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RTI offers a variety of docking interfaces including our Standard OctoPogo series with interchangeable alignment plates to third party test fixtures. RTI has developed many complete interface solutions, including everything required to interface to various test systems.
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8 Gbit/s Read-Write Analyzer
RWA 4000 TDMR
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Works with GSA 6044 digital signal analyzer to perform Two Dimensional Magnetic Recording (TDMR) measurements. RWA 4008 TDMR Read-Write Analyzer is a part of the new generation all-digital Guzik 4000 Series test systems. RWA 4008 TDMR requires Guzik signal analyzer GSA 6044 to provide a complete RWA TDMR solution for magnetic recording test applications.
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PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 102kΩ
40-298-140
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The 40-298-140 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 102kΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Fuel Hose Assembly Tester - Basic, USAF
9901-10FHT
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The basic fuel hose assembly tester is utilized by those users who do not require the complete 9201A test system which includes all test adapters and components required by U.S. Air Force PD 89MMI638. The 9901-10FHT however includes the identical test pump, manifold and controls and with larger valves, ports and fittings for increased fluid flow, is designed for the identical mission of testing fuel hose assemblies. Maximum pressure is 1000 psi allowing better control resolution at lower test pressures.
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Battery Testing Systems
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The CT2001 series Battery Testing Systems are designed for energy storage materials research and battery test. The eight channels are independently programmed and controlled by the computer. The Current ranges are from 1 mA to 5 A and Voltage ranges from 2V to 15V. Each testing system is specifically built for customer needs.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
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Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
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2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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PXIe-5451, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator
781204-01
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PXIe, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.
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Flash Programming for Functional Test Systems
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Flash programming stations allow you to offload flash programming from functional test systems, increasing test throughput while improving capital utilization. Circuit Check flash programmer fixtures support multiple programmer types and multiple I/O configurations.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 1.5Ω to 6.97kΩ
40-251-124
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The 40-251-124 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 6.97kΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Continuous Time Interval Analyzers
GT668PXIe-40
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GuideTech’s GT668PXIe-40 PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 50MHz time base with NIST traceable calibration. Some of the GT668PXIe-40 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.
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Contact Resistance Measurement System
CRMS
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The CRMS is a system designed to allow any user to measure the resistance of each set of relay contacts associated with the relay under test. The test system consists of a CONTACT RESISTANCE MEASUREMENT UNIT (CRMU), a MULTIPLE RELAY TEST RACK, as well as an interconnect CABLE ASSEMBLY. Either DC or AC energy to pick and drop relay coils under test for all contact measurements is supplied from the CRMU and easily interfaces with the Multiple Relay Test Rack. For additional and more thorough testing of relays an external relay tester can be interfaced to the Multiple Relay Test Rack to supply energy to the relay coil. It is recommended that the UTE Relay Tester With Timer/Counter (UTE Product # 15967-00) be utilized so the operator can take full advantage of the unique features it offers
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 510 Ohm
50-294-014
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The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Boundary Scan Compliance Tester
QT900
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Qmax Test Technologies Pvt. Ltd.
QT900 Qscan Test system is designed to provide test solution for both Boundary Scan compliance devices and Non Boundary Scan devices. The System provided with Digital IO’s capable of driving and receiving via JTAG IEEE 1149 standard interface and synchronous to JTAG pins. Both Digital and JTAG test are carried out synchronously. Use of virtual test pin and Edge connector eliminates the need of expensive test fixture strategy.
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PCI Programmable Resistor Card 2-Channel 2.5 Ohm To 2.04k Ohm - SPST
50-294-122
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The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
