Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
C-Mic Auto Test System
BK9010B
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Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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Product
Bluetooth RF Test System
FRVS
Test System
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Modular Test System
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The GS-X modular system is used for functional testing of medical devices and for testing the electrical safety of medical and general portable devices.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Circuit Breaker Test System
TDR900
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It operates and records a circuit breaker’s contact timing, motion, velocity, main contact engagement & synchronization, trip and close coil initiation and currents.
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Meter Test Board
WECO 2150
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Model 2150 automated test system is a fully ANSI compliant testboard that uses a single voltage and three independently controlled isolated current sources to test all electromechanical and solid state meters up to 50 Amps. Utilizing a precision laser optics system, the Model 2150 can test meters through the most grime-coated covers with unfailing accuracy. This same laser technology makes it possible to test using the disk’s edge without wasting time with the tricky optics adjustments found with other test systems.
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Product
SWB-2812, 16x9, 1 A, Reed Matrix Module for SwitchBlock
781420-12
Matrix Switch Module
16x9, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2812 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
PXI High Density Precision Resistor Module, 4-Channel, 3Ω to 52.4kΩ
40-298-133
Programmable Resistor Modules
The 40-298-133 is a high density programmable resistor module with 4 channels which can be set between 3Ω and 52.4kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Vibration Testing
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Sanwood Environmental Chambers Co ., Ltd.
Sanwood , a 23 years of professional Vibration Test System for Automotive parts, vibration table, vibration machine, Electromagnetic vibration table, Vibration Test Chamber manufacturers
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Chassis and Controllers Accessories
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Keysight offers high-performance chassis and controller accessories to synchronize multiple Keysight USB modular products to accelerate your test system integration and development.
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Software
DIGITIZER
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The Digitizer allows the recovery of design data of unknown assemblies by an electrical analysis with a Condor flying probe test system
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All-In-One Battery Testing System
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Integrating charge-discharge and temperature testing into one.
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MEMS Handler
4664-IH
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The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Product
Testability Director
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Advanced Test Engineering Solutions, Inc.
A spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government''s Testability Program for Electronic Systems and Equipments. But Version 3.1 goes much further, bringing you hundreds of guidelines from IC design through board and system testing.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Spectrophotometer & Integrating Sphere Test System
LPCE-1
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This Test System is suitable for photometric and colorimetric measurement of luminaries such as Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps), CCFL and LED. The measured data meets the requirements of CIE and IES LM-79 for the measurement of photometry and colorimetry.
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Non-Nitrogen HALT Chamber
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An advanced environmental test system that performs Highly Accelerated Life Testing (HALT) without relying on costly liquid nitrogen (LN2) for rapid cooling.
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Satellite ATE
MS 1123
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Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Carbon Monoxide Detector, CO
ENVIROMUX-CMD
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Continuous air monitoring. Pre-set alarm points alert at: 70 ppm after 60 to 240 minutes; 150 ppm after 10 to 50 minutes; and 400 ppm after 4 to 15 minutes. Flush or surface mount. Test functionality of electrochemical CO sensing cell. Connect to RJ45 or digital input sensor ports. Screw terminal. To connect to the RJ45 inputs use CAT5/5e/6 cable terminated at one end with RJ45 connector. Connect the un-terminated end to the sensor screw terminal. Maximum cable length: 1000 ft (305m). LED indicators for operation status and system test. Powered by ENVIROMUX-2D/5D/16D. Regulatory approvals: UL.
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Functional Testing
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Whatever your functional testing requirement, whether analogue, digital, or a combination of technologies, we have a solution. With over 2500 applications delivered in this field we have a level of experience that cannot be matched. Ensure the reliability of your product with our functional testing tools. Our functional test solutions range from completely standalone applications to those matched for our FLEX range of ATE test systems. Whatever your testing needs, we will help you choose the best option for you.
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Product
Eurostat Turnstiles
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For companies who need to ensure that the operators cannot enter the EPA unless their wrist straps and footwear are compliant every day• The turnstiles comply with ANSI/ESD S20/20 specification and ISO standards record keeping requirements • Both ESD safe shoes are tested separately through measuring electrodes, installed in the contact mat.• This system tests operators quickly (≤ 3 sec) and automatically and generate reports for the ESD coordinator• Communication with a server for traceability (Operator ID, Time & Date, Test values etc…)• LCD screen showing real time measurement• Keypad• Hygrometry measurement• Choice of measuring ranges and system calibration directly with the software• HID Wiegand interface, compatible to any HID card format
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 2Ω to 52.4kΩ
40-251-033
Programmable Resistor Modules
The 40-251-033 is a programmable resistor module with 4 channels which can be set between 2Ω and 52.4kΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Load Cell Measurement
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Designed specifically as a single-board solution for material testing system (MTS) applications, the PCI-9524 combines a high 24-bit resolution with 1/200,000 count accuracy to provide the most precise load cell measurement PCI board available in the market today.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Noise Sources
WGNS
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The system allows the user to extend the frequency range of the NFA to allow for accurate noise figure measurements to be performed on a device operating in the 26.5 – 170GHz range on wafer as well as in benchtop applications. Farran offers the WGNS series of noise sources to be used in conjunction with the FBC down converters for use as frequency extenders for noise figure measurement test system.
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600 AMP MULTIMETER CLAMP
MD79
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*Provides readings for volts, amps and ohms required for automotive electrical system tests*Handy 35mm AmpTip clamp jaws ergonomically measure at jaw tip for small sized conductors up to 60A and regular current, and Hz measures at jaw center for regular conductors up to 600A*Records max, min and calculates average readings over time
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Rate & Inertia Sensors
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TE Connectivity (TE) provides electronic test and measurement systems, such as inertial sensors, rate sensors, and rate gyroscopes for demanding industrial, military, aerospace, automotive crash testing, robotics, biomechanics, and more.
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MATCO TECH MULTIMETER
MD257
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*Provides readings for volts, amps and ohms required for automotive electrical system tests as well as diode and continuity tests*Lo-Z ghost voltage buster drains ghost voltages leaving only hard signals on meter readings*Beep-Jack audible warning beeps against improper a-terminal plug in and decreases the risk of damage
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HPx-310 Radar Signal Output Card
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The HPx-310 Radar Signal Output card is a replacement for the HPx-300, form, fit, and function. It generates representative radar signals for system testing, simulation, training or radar video streaming. Under software control, the card generates radar video, trigger and azimuth signals similar to those generated by real radars.





























