Test System Integration
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High Power LED Test System
Lumere-GM
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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0.3M Integrating Sphere For Leds Luminous Flux Test
CX-0.3S
Shenzhen Chuangxin Instruments Co., Ltd.
Thesystem are composed of integrating sphere, spectroradiometer and computer to determine the spectroradiometric and colorimetric parameters, e.g. spectral power distribution, chromaticity coordinates, correlated color temperature, color rendering index, color tolerance, color difference, luminous flux, current, voltage, wattage, etc.
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Compression, Paper And Pulp Test Systems
From basic tension and compression testing to advanced materials testing
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CATR Benchtop Antenna Test System
ATS800B
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Eddy Current Testing /ET System
Xiamen IDEA Electronic Technology Co., Ltd.
Eddy current testing system uses the most advanced digital electronic technology, photovoltaic technology and microprocessor technology. With beautiful design automatic transmission, complete electromechanical integration system, which is the only company that have a complete system of automatic machine.
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microLED Testing System
OmniPix-ML1000
The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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16 Channel Charge Integrating ADC
CQ16
The CQ16 is a 16-channel 12bit, fast converting charge-integrating ADC for CAMAC. To provide compatibility to older CAMAC ADC’s it can be switched into an 11-bit mode. All data read-out is provided either via CAMAC commands or through the fast FERA bus on the front of the module.
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DC System and Battery Test Instruments
Wuhan Huatian Electric Power Automation Co., Ltd.
DC System and Battery Test Instruments by HVTEST
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Integrating Spheres
IS-*M
• Diameter: IS-0.3M (φ0.3m)、IS-0.5M (φ0.5m)、IS-1.0M (φ1.0m)、IS-1.5M (φ1.5m)、IS-1.75M (φ1.75m)、IS-2.0M (φ2.0m). Other sizes can be designed according to the customer’s request. • The painting of integrating spheres is according to CIE Pub.No.84 (1989) • Material: Pure barium soleplate (BaSO4) • BaSO4 coating: ρ(λ)≥0.96 (450nm~800nm) and ρ(λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectanceρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in lighting holder position: The vertical is for E40, E27 and so on. The horizontal is for T5/T8/T12 tubes. The side assistant opening is for lighting fixtures • Auxiliary lamp position has been built-in. Auxiliary lamp and Auxiliary lamp device are optional • Power cable and socket has been build-in, it is convenient to power the testing lamp • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • The traditional integrating sphere is assembled by several pieces, Lisun Group developed A Molding Technology to produce the integrating sphere. A molding integrating sphere will be more round and the test results will be more accurate than the traditional integrating sphere
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Analog IC test system
A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
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Resonant Testing System
Originally designed to precrack specimens for fracture mechanics, the current versions offer much more possibilities due to a modular concept:*Bending up to 160 Nm*Tension/Compression up to 8 kN*Torsion
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All-In-One Battery Testing System
Integrating charge-discharge and temperature testing into one.
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High Voltage Test System
CKT-1180
The CKT 1180 is a High-Voltage Test System with up to 3500 VDC and 2800 VAC RMS leakage test capabilities.Originally designed for High-Speed Rail, the CKT 1180’s focus is to test assemblies that require extremely high reliability and work at elevated voltages.
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Battery Cell Test System
PEC is the worldwide leader in cell, module and pack test equipment for advanced batteries and energy storage systems. Our test equipment combines very high control and measurement accuracy with an excellent dynamic behavior. This results in very precise, near real time simulations of demanding applications in electro-mobility, renewable energy, aerospace and defense. PEC also supplies test systems for primary batteries and consumer applications.
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Camera Test System
FS 8681 / SR
FS8681/SR is software for evaluating images* and making pass/fail judgments in camera mass production inspections. It consists of the "Editor FS8681" application that sets the inspection content and the "Sequence Runner FS8681SR" application that executes the set inspection.
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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Test System Elowerk
eloZ1
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the latest generation. It reliably finds connection errors and assembly errors in electronic assemblies. The test electronics can be integrated both in table systems and in inline systems.
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High Voltage Battery Test System
The increasing use of electric drive systems both in the automotive industry and in transportation requires the development of new high-performance energy storage systems. In order to support you in the development and production of these systems, S.E.A. develops individually configurable test systems which are scalable and can be used flexibly for the respective requirements.
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Engine Performance/Endurance Test System
Various types of test system as follows can be built up in combination with measurement control equipment and peripheral instruments (fuel flow meters, actuators, temperature control device, combustion analysis system, ECU monitor, OBD, sound and vibration measurement instruments, emission analyzer, smoke meter etc.)·Traveling fuel economy test·Gas emission test·Output performance test·Deterioration/endurance test·Combustion analysis·Sound source probing
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Wafer Level Multi-Die Test System
ITC55WLMD
The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Silicon-Microphone 8Ch Auto Test System
BK9015
Based on the BK3011 MEMS Mic Tester, the BK9015 is our fully automatic 8 channel MEMS (Silicon) mic sweep tester. Testing up to 8 DUT's simultaneously, the BK9015 can test 8 mics simultaneously and sort them according to passing grade and cause of failure! Because it uses a sweep test, it can check characteristics for the entire frequency range. Your data can be viewed in real time or stored so you can analyze problems or trends.
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Leak & Seal Integrity Tester
Saicheng Leak Tester is professionally designed for the leakage tests of packages, bottles & pouches for food, drugs, medical instruments, household chemical products, cars, electronic components, stationeries and other industrial products. The instrument also can be used to test seal performance of specimens after falling and compression tests.
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Automatic Hysteresis Graph Test System
DX-4DMT
X-4DMT automatic hysteresigraph system accords with the standard permanent magnet test system, GB3217-92, used to measure the major and minor hysteresis loops, demagnetization curves, recoil hysteresis loops and initial magnetization curves in different temperature of ferrite, AlNiCo, SmCo, NdFeB and quenched material, and gives the magnetic parameter, Br, Hcb, Hcj, (BH)max, Hk and so on, and could meet different requirements on test function, precision, power capability, reliability, efficiency, price, local environment from laboratory to enterprise's production line.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Integrated Systems
Innerspec’s Integrated Systems are designed to provide automated and semi-automated NDT inspections in factory environments. These systems can incorporate unique sensors, instrumentation, software, as well as customized mechanical devices to integrate the inspection system with other equipment and processes.
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Integrating Sphere
The standard test temperature is 25, but high power lamps such as HID lamps and LED outdoor luminaires will produce a lot of heat during the test, thus the temperature inside the integrating sphere can not meet the requirements of IEC standards. Lisun Group designed the Constant Temperatured Integrating Sphere which allows the lamp was tested in a constant air temperature.
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Discrete Device Test System
capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
