Test System Integration
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Product
Adapter Interface 0-18 Slot | Test System LH
101151
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The Adapter Interface 0-18 Slot | Test System LH is a crucial component for advanced testing systems, specifically designed for efficient interfacing. This model incorporates a unique configuration allowing it to facilitate a 0-18 slot arrangement. Its compatibility with a 256 pin card ensures that it provides a reliable connection, minimizing the chances of data interruption during tests. Furthermore, it is designed to operate efficiently with a 1920 Dual Sided configuration, making it suitable for versatile applications in testing environments.Notably, this adapter streamlines operations, offering a total of eight slots, each supporting up to 128 pins through Genrad technology. The part number E07-00271 further emphasizes its precision in development, affirming its reliability and effectiveness in meeting high-demand testing requisites. Designed for interface optimization, this adapter stands out by providing refined performance to enhance device diagnostics and data acquisition processes.
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Product
Optics Test Systems
Lens Test
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Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Product
Automatic Test Equipment for Electronic Systems
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BAE Systems has designed and manufactured comprehensive test solutions for both military and commercial applications for more than 40 years. During this time, we have kept pace with the rapidly evolving market to deliver integrated, commercial-off-the-shelf solutions to our customers. Our test equipment consists of an open architecture, adaptable core that can easily integrate with additional instrumentation. This enables the development of unique configurations that support the full spectrum of avionics and electronics in use today.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
EMI and EMC Test System
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EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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Product
Modular Test System
IMU-MGE
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Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union. Each system can be individually configured and easily extended.
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Product
DC Power / Energy Absorber Test System
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AMETEK Programmable Power, Inc.
The Energy Absorber Test System includes power supplies and a regenerative energy absorber with a rating of 400VDC at ±150A. The system consists of DC power supplies, an AC distribution and interlock system, an energy absorber chassis and an absorber load resistor chassis. The power sources are equipped with a remote control option allowing control via GPIB or with front panel controls in local mode. The operation of the specific parts of the system is described in the sections below.
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Product
Electrodynamic Vibration Test Systems
A-series
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A wider range of test requirements and higher test specifications.A-series meets the needs for such a versatile test environment.Advanced automatic energy saving, high level of functionality and a protected test environment.
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Product
RF Mixers with Integrated LO
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Analog Devices RF mixers/multipliers include both active and passive, as well as broadband and narrowband, products. These devices promise high performance and flexibility to help designers achieve their target specifications, reduce design time, and optimize costs. With leading specifications including speed, dynamic range, noise figure under blocking, SFDR, and ESD performance, ADI RF mixers and multipliers help to raise the bar within RF systems.
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Product
Vibration Test Systems
G-5 Series
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Both Shock tests at from relatively high acceleration(max. 4900m/s2 -500G) to low acceleration with wide pulse width, difficult to achieve with conventional Shock Test Systems and Vibration tests for not only IEC, MIL and JIS but also requiring higher acceleration, velocity and displacement than ordinary VTSs can be carried out with one system.
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Product
Low Cost / Used Test Systems
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For the last 30 years, Terotest has offered a range of used and refurbished ATE Systems, along with all associated spares at very competitive prices. From completely configured systems to the smallest replacement parts Terotest holds a comprehensive range for some of the largest ATE manufactures in the world. See below for more details.
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Product
Traction and Induction Motor Test Systems
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Crest makes state-of-the art test systems for testing 3-phase AC motors used in traction and other industrial applications.
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Product
Stationary Meter Test Systems AC
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Today Meter Test Technology is much more than only testing accuracy and functionality of a conventional electricity meters. With implementation of SmartMeters a complex test and data management system is required. – It’s a good thing to have experts by your side.
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Product
Test System
NFC Xplorer
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The CISC NFC is a compact, high-quality test system, developed for HF RFID and NFC devices measurements and performance and conformance tests.
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Product
Linerizers and Integrators
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Linearizers with freely selectable parameters are designed for industrial applications in which non-linear analog signals or frequencies are to be linearized on the display and at the analog and data outputs. Depending on requirements, devices with 19 to 4000 linearization points are manufactured. The linearization can be entered directly via the device keyboard or via the serial interface from the PC. Several linearization methods are available, such as direct overwriting of the display with the desired value, table with setpoint and actual values or polynomial linearization.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Microwave Wideband Synthesizer w/ Integrated VCO
ADF4371
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The ADF4371 allows implementation of fractional-N or interger-N phase-loacked loop (PLL) frequency synthesizers when used with an external loop filter and an external reference frequency. The wideband microwave VCO design allows frequencies from 62.5 MHz to 32 GHz to be integrated
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Product
Imaging Gauge Software Test System
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The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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Product
PCB Interconnect Stress Test System
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PWB Interconnect Solutions Inc.
Integrated package including PC, Software with real time graphing and all related systems and hardware for 8 head, dual sense testing model IST-HC
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Product
V4 Marine Communications System - V4 NAVTEX Test System
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The ICS Electronics Limited V4 NAVTEX Test system may be used for type approval, general performance testing and production testing of NAVTEX receivers.
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Product
Long-Stroke Tensile Testing System For Vulcanized Rubber
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Capable of Measuring Even Specimens with a Large Break Strain A tensile test method for vulcanized rubber is stipulated in JIS K6251 (Rubber,vulcanized or thermoplastic-Determination of tensile stress-strain properties). One of the properties of vulcanized rubber is significant elongation. This long-stroke tensile testing system for vulcanized rubber has a long stroke that is required for calculating these tensile characteristics of rubber, and accommodates dumbbell specimens Nos.1 through 6 stipulated in JIS K6251.
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Product
Test Automation Systems
iTest
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Our iTest family of test automation systems provide a full range of capabilities, allowing you to purchase just the right solution for your application without having to overbuy.
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Product
Flight Line Armament Test System
SST
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The Stores System Tester (SST) is a ruggedized flight line armament test system that enables real-time diagnostic analysis. U.S forces need to perform alternate mission equipment (AME) troubleshooting and diagnostic analysis on the flight line. BAE Systems' SST provides this capability in a one-person portable package.
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Product
Single Long Pulse Solar Simulator & I-V Test System
TriSOL SLPSS
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The OAI Test System for HIGH EFFICIENCY SOLAR CELLS overcomes the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match the cell’s dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell efficiency leading to increased profitability.
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Product
Multi-Function Test & Measurement System
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Optoplex’s Multifunction Test and Measurement System (TM100 Series) is designed to provide a flexible and cost effective optical test and measurement solution, particularly for manufacturing lines. The mainframe can be mounted in 19” rack or stationed on desk-top for ease of use. There are many selections of the pluggable modules, from tunable laser, optical spectrum analyzer, EDFA, power meter, ASE light source, optical tunable filter, optical performance monitor, …, etc.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
Meter Test Systems
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We offer a huge variety of products for meter testing. From the smallest device with the size of a single-phase meter up to customized semi-automatic systems with more than 40 test positions.
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Product
Electrodynamic Vibration Test Systems
CV-series
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CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
