Test System Integration
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Multi-Function Test & Measurement System
Optoplex’s Multifunction Test and Measurement System (TM100 Series) is designed to provide a flexible and cost effective optical test and measurement solution, particularly for manufacturing lines. The mainframe can be mounted in 19” rack or stationed on desk-top for ease of use. There are many selections of the pluggable modules, from tunable laser, optical spectrum analyzer, EDFA, power meter, ASE light source, optical tunable filter, optical performance monitor, …, etc.
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Meter Test System
MTS-100
Kongter Test & Measurement Co., Limited
This Meter Test System features state-of-art designing with high accuracy. It is composed of high accurate (class 0.05% or 0.1%) standard reference meter and power source (up to 120A). This system is particularly designed with modular structure for calibration and test of different single phase/3 phase electronic/inductive active and reactive energy meters.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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IC Testing System
Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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Integrating Sphere With Holder Base
IS-*MA
1. The hold base can bear max 20kg, it can expanding to test all lamps such as E27/E40, all tubes such as T5/T8/T12, and all kinds of luminaries2. The hold base can be installed in the ceiling or down, it can be adjusted the height3. Hold base has four power cables connect to the outside Power Supply and max is 5KW4. The holder base is detachable. For some kinds of light sources you may need to change the position of the holder base.5. Diameter: IS-0.3M (0.3m), IS-0.5M (0.5m), IS-1.0MA (1.0m), IS-1.5MA (1.5m), IS-1.75MA (1.75m), IS-2.0MA (2.0m). Other sizes can be designed according to the customer’s request.6. The painting of integrating spheres is according to CIE Pub. No.84 (1989)
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VME Test System
VMETS
Measurements of system performance include Bus Utilization, Transfer Rates and Statistics. As data is acquired the Min, Max and Average values are updated and displayed in graphical form.
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Slip Ring Test System
This is a high specification tester that will measure many cable parameters. It measures cable resistance very accurately using the Kelvin 4-wire method. It also tests for shorts between pins at a low voltage. The next test is to measure insulation between connections at a higher voltage. This is carried out at up to 1500 Volts DC with resistances of 10 to 500 Meg ohms.
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Combination Board Functional Test System
QT 4256 ATE
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Multi-Purpose RF Test System
SPA1241
The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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Ionic Contamination Test Systems
CM+ Series
The Contaminometer (CM+ Series) system was originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s. Historically, International Standard IPC-J-STD001 stated that assemblies be cleaned to a value of <1.5µg/cm2 of NaCl equivalence. However, the new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ Series measure the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.
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Chloride Test System
C-CL-2000
The C-CL-2000 produces results on-site, within minutes that are accurate and comparable to expensive laboratory tests. It measures the electrochemical reaction of a weighted sample placed in an extraction liquid. It automatically shows a temperature compensated reading of percent of chlorides on its digital display. A wide range - from 0.002 to 2% chloride by weight - is covered.
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Horizontal Vibration Test Systems
G-3 Series
This series was used for the special structure of airbearing guide of inspection for Seismic Detectors andcharacterized is large displacement and high-accuracywaveform. In addition, the use of the Windows seismicdetector controller is easy to operate it.
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RF Conducted Immunity Test System
RFCI61000-4-6
RFCI61000-4-6 RF Conducted Immunity Test System is an automatic test system which is for the conduction sensitivity testing, it is fully meets IEC61000-4-6.2006, ISO11452-4, GB/T17626.6-2008 and GTB152B-CS114 etc standards. RFCI61000-4-6 internal source and broadband power amplifier can be generated 3 voltage test levels: 1v, 3v and 10v, and has the function of the real detect output level. It has two operation software which is calibration software and test software. When measuring, the signal is in 1 KHZ sine wave amplitude modulation system (80%) to simulate the actual harassment, and can through the coupling/decoupling network (CDN or electromagnetic clamp) to make the harassment signal coupled to the device.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Integrated Systems
Innerspec’s Integrated Systems are designed to provide automated and semi-automated NDT inspections in factory environments. These systems can incorporate unique sensors, instrumentation, software, as well as customized mechanical devices to integrate the inspection system with other equipment and processes.
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vibration test system
Labtone Test Equipment Co., LTD
Labtone EV series of electrodynamic shaker vibration test System simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications.Labtone EV series of electromagnetic vibration testing system simulate the vibration environment under the laboratory condition, and test the impact strength as well as reliability of various vibration test applications. In the laboratory, with the aid of vibration testing system, simulations of reproduction of sinusoidal, random, resonant search and dwell, classical shock and road models, etc. can be achieved. It is essential for product quality assurance, new product research and development.Labtone EV series of electromagnetic vibration testing system is specially designed to meet the need for long time operation. Vertical and horizontal vibrations can be achieved by the installation of vibration resistant base. The standard platform is equipped with high efficiency airbag shock isolation device, so that the vibration transmitted to the building can be minimized. There is no need for additional foundation in most of the cases.A complete set of vibration testing system is composed of shaker, power amplifier and vibration measuring control system, in accordance with the relevant national and international standards (such as: MIL-STD, DIN, ISO, ASTM, IEC, ISTA, GB, GJB, JIS, BS, etc.) to provide technical support for establishing product quality inspection.
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Variable Frequency Series Resonant Test System
HTXZ(L) / 150
Wuhan Huatian Electric Power Automation Co., Ltd.
This system is designed and manufactured for the communication withstand voltage test of 11kV/30MW hydro-generator.
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Visible / Infrared / Imaging Test System
System 1808
Testing Low-voltage CCDs and IR FPAs; Military, science-grade and medical CCDs or IR FPAs; CMOS ROICs and multiplexers; CMOS sensors. Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Electric Vehicle Service Equipment Test System
T4350
With the growing demand for electric vehicles (EV), there needs to be a simple and accurate method to test EV charging systems. Test the accuracy of AC and DC voltages and currents with TESCO’s Electric Vehicle Service Equipment (EVSE) Test System TS400. The TS400 is a valuable set with complete testing capabilities and caters to every possible EVSE charging protocol in the world (AC and DC). EV charging stations are popping up all over as the sale of electric vehicles increase. Many states or counties are now mandating testing for these charging stations. TESCO’s TS400 makes testing these chargers easy! TESCO’s EVSE Test Systems test the accuracy of energy delivery using a transactional mode compatible with Handbook 44 provisions. The TS400 Test System includes a T4000 EVSE Tester and a PL4000 EV Load Emulator. Reach out to your TESCO Representative for more information!
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Tracker for Testing CPV Module Systems
The tracking precision of our biaxial tracker is better than ±1° on each axis, with an option for ±0.1° precision. This makes the tracker ideal for testing concentrating PV modules. The software runs all required tests for angle-dependent testing of PV modules according to IEC 62108.
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Integrated Solution for Control and Automation
One
Building new machines for today’s smart factories requires sophisticated control and automation that can only be delivered through multiple solutions and components – including a PLC, HMI, I/Os and motion components such as AC Servo systems and VFDs. As all components must be integrated, selecting the right combination is crucial to the efficiency and success of any project.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Integrated Analyzer
OR35
OR35 is the portable real-time multi-analyzer that integrates the best of sound & vibration analysis technology in a truly mobile instrument. OR35 is the synthesis of the ultimate OR3x technology and OROS? wealth of experience of measurement. Designed to be the best for field operations, OR35 takes any measurement situation in its stride. Choose OR35 and go on confidently.?
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Integrated Micro-Optical Benches
iMOB Series
This line of products offers high-performance, robust, and ultra-stable power splitting with an adjustable ratio in a fully integrated package.
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Specialty Test Systems
The innovative products of D&V Electronics lead to cutting edge advancements – applied technology that will drive future transportation. Our specialty testing products are the cumulative result of our technological advancements that drive innovation, further our industry and enhance the quality of our customers’ products. From compact electric motor testing units to full electrical testing systems, we have the solution to always be TESTING THE FUTURE®.
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Mobil Cable Test and Fault Location System
SWG-12 (SWG-32)
• testing cable insulation with DC (rectified) voltage up to 32 kV;• conditioning faults by burning faulty cable insulation with current up to 100 mA;• pre-locating cable faults with the reflectometer RIF-9 based on the pulse reflection method (TDR), voltage wave oscillation method (DECAY), impulse current envelope (ICE) method and arc reflection method (ARC / ARC multi-shot);• pinpointing cable faults with the acoustic method with up to 2000 J surge wave generator and a suitable signal receiver.
