Test System Integration
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Rotor Test Systems
Automation Technology's RTS-3800 Rotor Test Systems offer an unparalleled ability to test the quality of die cast or PM rotors. The RTS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; the RTS-3800 is backed by ATI's industry leading two-year limited warranty.
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Manufacturing Test Only System
MTO
The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Armature Test Systems
Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Test systems
MG Products can supply a variety of test systems. These include the Extended Boundary Scan Test from JTAG Technologies, the functional test equipment integrated into a table or high configuration from Unites systems or the Cabinet Modular Test solution (CMT). We offer the right solution for every test setup.
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SoC/Analog Test System
3650-S2
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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Test Systems & Sub-systems Development and Integration
Research, development and the production of electronic test equipment, systems and subsystems for the industrial, scientific, and defense markets.
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METES - Meter Test Systems
Dramatic advances in the field of measurement technology and the use of state-of-the-art micro-electronics have led to the development of a new generation of electricity meters which are far more accurate than their predecessors of just a few years ago. As well as measuring the exact amount of energy used, a high level of integration enables electronic meters to perform a number of additional functions. As a result, these meters are also more sensitive to network irregularities. This means that regular testing is the only way to ensure that a meter functions correctly, both during final factory tests and during the entire life span of a meter.
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Integration Services
Factory Installation ServicesVME Systems TrainingConsulting for Advanced Algorithm DevelopmentCustom Systems Integration ServicesConfiguration Management Services
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YIG Integrated Products
With a 30 year YIG heritage, Teledyne RF & Microwave integrates YIG components with related microwave technologies, creating custom solutions that leverage the advantages of YIGs in cost-effective assemblies including synthesizers, receivers, converters and more.
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CCD Spectroradiometer Integrating Sphere Compact System
LPCE-3
LPCE-3 is a CCD Spectroradiometer Integrating Sphere Compact System for LED Testing. It is suitable for photometric and colorimetric measurement of luminaries such as LEDs, LED luminaires, Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps) and CCFL. The measured data meets the requirements of CIE, EN and LM-79 clause 9.1 for the measurement of photometry and colorimetry.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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EMI and EMC Test System
EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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Customizable Integrated Assemblies
Our ability to design, develop and manufacture, enables us to provide customized solutions to meet all types of signal switching needs, at a reasonable cost. We offer a variety of high-performance RF matrix systems including electromechanical, solid state, fiber optics or hybrid and considered the ideal choice for ATE, SATCOM and Space applications.
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Computer-controlled Torque Testing System
Torque Testing System,
Our top-of-the-range Vortex-i torque testing system gives optimum testing performance and evaluation options, enabling you to get the most from your test measurements.
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Circuit Breaker Test System
TDR9100
The Doble TDR9100 Circuit Breaker Analyzer is a state-of-the-art circuit breaker test set for testing all types of circuit breakers with efficient and accurate performance measurements.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Automatic Tablet Testing System
UTS 4.3
The UTS 4.3 LAB is a universal and fully automatic tablet testing system based on the long-proven UTS 4.1 - this was developed for industrial use and can be found in production worldwide. The UTS 4.3 LAB is now equipped with the database-driven, intuitive all-in-one touch software and no longer requires additional software solutions for most areas of application.The functionality of the software can be extended modularly and individually adapted to your needs and requirements. FDA regulations can be fulfilled with the optional FDA-21-CFR-Part-11 module.With UTS 4.3 LAB – as with the proven UTS 4.1 IPC – you can test round, oval, square and rectangular tablets as well as numerous special shapes. For difficult oblong tablets, the globally used Oblong Centering System (OZB) can also be integrated.
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Integrated Current Sensors
HMSR series
The HMSR is a new generation of high insulated Integrated Current Sensor from LEM. These product family provides a robust, compact and very accurate solution for measuring DC and AC currents in all highly demanding, switching power applications for commercial, industrial. HMSR is a micro core based open loop sensor with a reinforced insulation and overcurrent detections (user configurable and factory set). These features make the device suitable for high voltage applications requiring high precision and strong immunity against external field. The primary conductor (pins 1 and 8) has very low electrical resistance and dedicated pads d
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Sound Level Test System
In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Display Test System
PIMACS provides the broadest range of display optical performance measurement system for optical testing of various samples including flat panel displays. We are specialized in testing all sizes of display modules and panels ranging from various field.
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Headlamp Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Transducer Test System
TTS-030
For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Electronic Transformer Test System
UI2000-ET
• Input characteristics analysis 1) Measure Vrms (10-300V) Lrms (0.04-4A) W, PF, Hz, total harmonic and 0-50 component of harmonic 2) Accuracy: ± (0.4%reading + 0.1%range + 1digit) • Output characteristics analysis 1) Measure lamp voltage (1-60V) lamp current (03-20A) lamp power, crest factor and oscillatory frequency 2) Accuracy: Class 2 • It can print without compute, and provide the communication port for PC
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Test Automation System for Durability Testing
STARS MATS
STARS MATS is a Mileage Accumulation Test System application available with the STARS Automation platform for chassis dynamometer. The application provides test execution, equipment control, refueling, and vehicle state monitoring to perform long endurance test without the necessity of continuous staff presence. Its flexible design offers a wide range a customization, and it addresses the different testing requirements from manual to fully-automated operation.
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Tan Delta Test System
Diagnostic test that indicates the degree of cable insulation degradation. Rather than using only a VLF instrument to perform a go/no-go proof test, the Tan Delta, used in conjunction with a VLF hipot, permits the user to grade the deterioration level of many cables in order to prioritize replacement, rejuvenation, or to determine what additional tests may be useful.
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Integrated Current Sensors
Current sensors have to be smaller, smarter, cheaper. LEM’s R&D is actively developing a range of ICS to reduce the footprint of the current sensing function and simplify the integration of current measurement in a wide range of applications in automotive, industrial, or residential.
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Sparklike Laser Integrated
Sparklike Laser Integrated™ is an automated insulating gas measurement station, which is integrated in the IG production line. In addition to measuring the gas concentration of IGUs, it helps with monitoring possible over fill and optimizes the use of butyl.
