Wafer Level Multi-Die Test System
ITC55WLMD - Integrated Technology Corp. (ITC)
The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Test System
ITC57300 - Integrated Technology Corp.
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Test System Mainframe
ITC59000 - Integrated Technology Corp.
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Unclamped Inductive Load Tester
ITC55100STD - Integrated Technology Corp.
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test measurement unit
ITC59100 Rg/Qg - Integrated Technology Corp.