Test System Integration
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Full Vehicle Test Systems
MB Dynamics delivers effective, low-cost, and quiet excitation technology to root source S&Rs in vehicles, trimmed bodies, subsystems and components, including 4 poster test rigs. MB’s patented Direct Body Excitation (DBE) Road Simulator and Dynamic Vehicle Torquer (DVT) are advanced vehicle road simulation technologies which help detect vehicle S&Rs during development, launch, and production.
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Integrated Assemblies
Teledyne RF & Microwave offers full first-level integration capabilities, providing not just performance components but also full subsystem solutions to help reduce program schedule and cost. Drawing on our expanding breadth of components, Teledyne RF & Microwave delivers customer-specified subsystems of analog and mixed analog-digital design, including hybrid, MMIC, and mixed hybrid-MMIC configurations. Designed to meet military or space applications, some typical subsystems Teledyne RF & Microwave delivers include I/Q demodulators, coupled detector assemblies, switched amplifier detector assemblies, and dual-band VCOs.
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Test System Mainframe
ITC59000
The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Integrated Flight Controller
Kratos Defense & Security Solutions, Inc.
The Integrated Flight Controller (IFC) controls the entire flight functionality and maneuverability of the BQM-167 subsonic aerial target platform. The IFC accepts commands from a ground control system (such as GRDCS, SNTC, or TTCS), inputs current vehicle operating parameters from onboard sensors, and outputs control signals to the vehicle for flight control. The IFC supports multiple high performance maneuvers, such as barrel rolls, high G turns, and low altitude operation.
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Integration Tool Suite
TurboDFT
TurboDFT contains a suite of very useful and powerful DFT integration tools. TurboDFT allows users to automatically integrate and stitch DFT cores, whether they are created using DFT tools from SynTest or other vendors
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Automatic Transformer Test System
TH2829LX
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 20 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Dynamic Component Test Systems
RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Integrated Airborne Solutions
UAVs have evolved into the 'Go-To' platform for many remote-sensing applications. Headwall's integrated solutions combine a hyperspectral imaging sensor and choice of GPS/IMU mounted on a high-performance UAV.
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Electrodynamic Shock Test System
FS SERIES
The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
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High-Speed Transformer Test System
DU-7211
Delta United Instrument Co., Ltd.
Inductance, Q factor, Leakage Inductance, AC Resistance, Capacitance, DC Resistance, Balance,Turn ratio, Open/Short check
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Test Fixture, Axial And Radial
16047A
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Protective Relay Test System
MTS-5100
The MTS-5100 is the only all-in-one relay test set with a direct front panel interface for all functions, without exception!
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Infotainment Test for Automotive Applications
Multimedia operating interfaces are complex control and display devices for functions such as entertainment, telephony, on-board computers and vehicle settings. The functional test of such complex control units and their networking within the vehicle architecture presents a particular challenge in every phase of the product design process.
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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AC Resonance Test System
KV Hipot Power Test Equipment Co.,Ltd
KVXZ-270kVA/270kV Variable Frequency AC Resonance Test System is applied for AC dielectric test for electric equipment.
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Integrated 5G mmWave Test System
IQgig-5G
The IQgig-5G is a fully-integrated, non-signaling solution for testing 5G mmWave products at both the 28 GHz and 39 GHz frequency bands. All signal generation, analysis, and RF front-end routing hardware are self-contained inside a single chassis. The IQgig-5G is license-upgradeable to support the pre-5G and 3GPP standards evolution with up to 1 GHz of tester bandwidth. The IQgig-5G solution has three bi-directional source and measurement ports each with 2.92mm connector coaxial interface.
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Conductivity-Resistivity Sensor Electronics and Integral System with PVDF Sensor
2850
The Signet 2850 Conductivity/Resistivity Sensor Electronics are available in various configurations for maximum installation flexibility. The universal mount version is for pipe, wall, or tank mounting and enables single or dual (digital versions only) inputs using any standard Signet Conductivity/Resistivity sensor. The threaded j-box version can be used with these same Signet sensors for submersible sensor mounting. It is also available as a combined integral system configuration for in-line mounting and includes a conductivity electrode in a choice of 0.01, 0.1, 1.0, 10.0 or 20.0 cm-1 cell constants. The 2850 is ideal for applications with a conductivity range of 0.055 to 400,000 S or a resistivity range of 18.2 M to 10 k.
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Spectrophotometer & Integrating Sphere Test System
LPCE-1
This Test System is suitable for photometric and colorimetric measurement of luminaries such as Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps), CCFL and LED. The measured data meets the requirements of CIE and IES LM-79 for the measurement of photometry and colorimetry.
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C-Mic Auto Test System
BK9010B
Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.
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Vibration Testing System
Wewon Environmental Chambers Co, Ltd.
Vibration Testing is performed to determine if a product can withstand the rigors of its intended use.
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Dayton Audio Test System
DATS V2
Highly accurate measurement of loudspeaker impedance and T/S parametersEasy-to-use, fully-featured measurement software with intuitive interfaceCompact USB measurement module with molded test leads and alligator clipsSoftware includes signal generator, scope, and measurement of inductors and capacitorsData can be saved to create a driver parameter library or exported to popular box design programsNew V2 hardware and software simplify setup and eliminate warm-up/cool-down times
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Power Module And Device Testing System
Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Instrumented Pendulum Impact Testing System
JB(INSTRUMENTED)
Jinan Testing Equipment IE Corporation
JB-450I/750I Instrumented Pendulum Impact Testing Machine is equipped with high precision instrumented strain-gauged striking edge & high-speed data acquisition system. This instrumented test system can measure the force of a test specimen during an impact event. Then, the instrumented test data can be used to calculate the energy absorbed by the test specimen. In addition, the crack initiation and arrest loads can be used in fracture mechanical models.
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SoC Test System
V93000 SoC / Smart Scale
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
