Gigabit Ethernet Test
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
16FE Managed Ethernet Switch Support Modbus/TCP, -40~75℃
EKI-5526I-MB
Ethernet Switch Module
16 ports Fast Ethernet RJ-45 (EKI-5526/I-MB)Entry-Level Managed SwitchIXM function enables fast deploymentManagement: SNMP v1/v2c/v3, WEB, Standard MIB, Private MIB
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Test System
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
8FE + 2GE Combo Port Unmanaged Switch
EKI-2710E-2CI
Ethernet Switch Module
Provides 8FE+2GE combo port with Auto MDI/MDI-X, Supports 8 x 10/100 Mbps Auto-Negotiation + 2 x Combo 10/100/1000M Auto-Negotiation. Supports redundant 12 ~ 48 VDC power input, Supports DIP Switch Configuration: QoS/BSP/port-based VLAN, Supports EMC Level 4 protection for extreme outdoor environments.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
16FE+4G SFP Managed Ethernet Switch
EKI-7720E-4F
Ethernet Switch Module
16 Fast Ethernet ports + 4 SFP ports, SFP socket for Easy and Flexible Fiber Expansion, Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D). IXM function enables fast deployment
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
Flight Control System Test Platform
Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
Test Workflow Standard
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
8FE Unmanaged Ethernet Switch, -40~75℃
EKI-2528NI
Ethernet Switch Module
Provides 8 Fast Ethernet ports with Auto MDI/MDI-X, Supports 10/100 Mbps Auto-Negotiation, Provides compact size with DIN-rail/Wall mount, and IP30 metal mechanism, Supports redundant 12 ~ 48 VDC power input and P-Fail relay.
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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Product
8-Ports Gigabit Ethernet ITA Interface
YAV90058A
Ethernet Interface
8 RJ45 LAN connectors to VPC ITA 192 pins module
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
8FE+2G Combo Managed Ethernet Switch Support PROFINET, -40~75℃
EKI-5629CI-PN
Ethernet Switch Module
8 Fast Ethernet ports + 2 Gigabit Copper/SFP combo ports (EKI-5629C/I-PN)Entry-Level Managed SwitchIXM function enables fast deploymentProvides GSDML filesManagement: SNMP v1/v2c/v3, WEB, Standard MIB, Private MIBSupports Media Redundancy Protocol (Media Redundancy Client)
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Product
8FE PoE And 2G Combo Managed Ethernet Switch
EKI-7710E-2CPI
Ethernet Switch Module
Certified to IEC 62443-4-2 SL2, 8 x IEEE 802.3 af/at PoE Fast Ethernet ports + 2 x Gigabit Copper/SFP combo ports, Redundancy: Gigabit X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D) IXM function enables fast deployment, Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption), RADIUS.
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Product
3U CompactPCI® 2/4-Port Gigabit Ethernet Card
cPCI-3E10/3E12
Ethernet Interface
The cPCI-3E10 Series is 3U CompactPCI Gigabit Ethernet peripheral card equipped with Intel® 82574L PCIe Gigabit Ethernet controllers. The cPCI-3E10 provides four GbE ports on the front panel (RJ-45) with two switchable to the rear transition module, the cPCI-3E12 provides two GbE ports on the front panel (RJ-45), and the cPCI-3E10-SUB provides two Fast Ethernet ports on the front panel (DB-9). An optional Rear Transition Module (cPCI-R3E10) is available to provide rear access to the GbE ports switched from the cPCI-3E10 front panel.
