Gigabit Ethernet Test
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Product
Functional Test Fixtures
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Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
EN50155 Managed PoE Ethernet Switch
EKI-9528E-8GMPW
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M12 connector with ruggedized IP54 certified housing, Complies with EN50155 and EN50121-3-2 standards, 24 x PoE IEEE802.3af/at ports. Wide nominal power input range: 24 ~ 110VDC, Operating power input range: 16.8 ~ 137.5VDC, X-Ring Pro delivers rapid and predictable convergence.
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Product
Ethernet Connectivity for Controlling ARINC-429 Channels and Auto RX Bridging
ENET-A429
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eNet-A429™ is an innovative product that provides “remoting” of ARINC operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). eNet-429 is a small, low-power, rugged device that provides connectivity for 1-8 ARINC 429/575/573/717 Channels – Ideal for remoting ARINC connections for in-field applications or point-point lab usage.
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Product
Photodiode Burn-in Reliability Test System
58606
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The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
8GE+4G SFP Port Gigabit Unmanaged PoE Switch
EKI-2712G-4FPI
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Dual 48 VDC power input and 1 x relay output, -40 ~ 75°C wide-range operating temperature, EN50121-4 approval for railway trackside deployment. NEMA TS2 for traffic control, SFP socket for easy and flexible fiber expansion, 8 x IEEE 802.3 af/at PoE Gigabit ports + 4 x SFP ports.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
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Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
8FE Unmanaged Ethernet Switch, -40~75℃
EKI-2528NI
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Provides 8 Fast Ethernet ports with Auto MDI/MDI-X, Supports 10/100 Mbps Auto-Negotiation, Provides compact size with DIN-rail/Wall mount, and IP30 metal mechanism, Supports redundant 12 ~ 48 VDC power input and P-Fail relay.
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Product
5FE Slim Type Unmanaged Industrial Ethernet Switch
EKI-2525LI
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Supports wide operating temperatures from -40 to 75 °C, Supports redundant 12 ~ 48 VDC power terminal input plus one DC power jack and P-Fail relay, Provides compact size with DIN-rail/Wall mount, and IP40 metal mechanism. Supports 10/100 Mbps Auto-Negotiation, Provides 5 Fast Ethernet ports with Auto MDI/MDI-X.
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Product
Functional Test System
TS-5040
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The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
8FE+2G Combo Managed Ethernet Switch
EKI-7710E-2C
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Certified to IEC 62443-4-2 SL2, 8 Fast Ethernet ports + 2 Gigabit Copper/SFP combo ports, Redundancy: Gigabit X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D).
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Tabletop Single Site Test Handler
3111
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The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
EN 50155 M12 8FE PoE + 2GE Managed Switch
EKI-9510E-2GMPW
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M12 connector with IP67 rugged housing, Complies with EN50155 & EN50121-3-2, Complies with EN45545-2 & EN61373, Supports PoE IEEE802.3af/at. Wide nominal power input range: 24~110VDC; Operating power input range: 16.8~137.5VDC. Compact size to fit in different narrow spaces, Operating temperature: -40 ~ 70°C.
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Product
4GE+2G SFP Managed Ethernet Switch
EKI-7706G-2F
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4 Gigabit Ethernet ports + 2 SFP ports, SFP socket for easy and flexible fiber expansion. Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D). IXM function enables fast deployment, Security: 802.1x (Port-based, MD5/TLS/TTLS/PEAP encryption), RADIUS, Management: SNMP v1/v2c/v3, WEB, Telnet, standard MIB, private MIB.
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Product
Bluetooth RF Test System
FRVS
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FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Product
Component Test Systems
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These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Automated Test Equipment
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These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
8FE PoE And 4G SFP Managed Ethernet Switch
EKI-7712E-4FPI
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Certified to IEC 62443-4-2 SL2, 8 x IEEE 802.3 af/at PoE Fast Ethernet ports + 4 SFP ports, Redundancy: X-Ring Pro (ultra high-speed recovery time < 20 ms), RSTP/STP (802.1w/1D) IXM function enables fast deployment,Security: 802.1x (Port-Based, MD5/TLS/TTLS/PEAP Encryption), RADIUS.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Product
16FE Managed Ethernet Switch Support Modbus/TCP, -40~75℃
EKI-5526I-MB
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16 ports Fast Ethernet RJ-45 (EKI-5526/I-MB)Entry-Level Managed SwitchIXM function enables fast deploymentManagement: SNMP v1/v2c/v3, WEB, Standard MIB, Private MIB
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Product
SAS Protocol Test System
Sierra M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
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The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
6FE+2x100M Multi-Mode SC Fiber Port Industrial Managed Ethernet Switch
EKI-7708E-2MI
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Provides 6*FE ports with auto MDI/MDIX, Provide 2x100M SC Multimode 2km ports, Support 10/100Mbps auto negotiation. Support jumbo frame transmission up to 10k, Provide slim size, DIN-rail with IP30 metal mechanism, Support redundant 12V~48V DC power input and P-fail relay.
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Product
RSE Wireless EMC Spurious Emission
TS8996
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The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
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80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Test Handler
M4841
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High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
