Gigabit Ethernet Test
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Product
3U CompactPCI® 2/4-Port Gigabit Ethernet Card
cPCI-3E10/3E12
Ethernet Interface
The cPCI-3E10 Series is 3U CompactPCI Gigabit Ethernet peripheral card equipped with Intel® 82574L PCIe Gigabit Ethernet controllers. The cPCI-3E10 provides four GbE ports on the front panel (RJ-45) with two switchable to the rear transition module, the cPCI-3E12 provides two GbE ports on the front panel (RJ-45), and the cPCI-3E10-SUB provides two Fast Ethernet ports on the front panel (DB-9). An optional Rear Transition Module (cPCI-R3E10) is available to provide rear access to the GbE ports switched from the cPCI-3E10 front panel.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
Test System
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
In-Circuit Tester
Sparrow MTS 30
In-Circuit Test System
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
8GE PoE And 2G Unmanaged Ethernet Switch
EKI-5729PI
Ethernet Switch Module
Full Gigabit Ethernet ports and comply with IEEE, 802.3af/at PoE standard, Communicates with SCADA software via Modbus/TCP. Communicates with NMS (Networking management system) via SNMP, Port-based QoS for deterministic data transmission.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
8-Pin Ethernet Male to 8-Pin Ethernet Male, CAT-5E Ethernet Cable
151733-02
Ethernet Cable
The 8M-8M Ethernet Cable connects devices to network hubs or switches. This cable features straight-through wiring. Additionally, the 8M-8M Ethernet Cable is available in different lengths and thin profile options.
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Product
Bottom Electrode SMD Test Fixture
16197A
Test Fixture
The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
SMD Test Fixture
16034G
Test Fixture
Perform impedance evaluation on a minimum SMD size of 0.6(L) x 0.3(W) [mm]
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
6FE+2x100M Multi-Mode SC Fiber Port Industrial Managed Ethernet Switch
EKI-7708E-2MI
Ethernet Switch Module
Provides 6*FE ports with auto MDI/MDIX, Provide 2x100M SC Multimode 2km ports, Support 10/100Mbps auto negotiation. Support jumbo frame transmission up to 10k, Provide slim size, DIN-rail with IP30 metal mechanism, Support redundant 12V~48V DC power input and P-fail relay.
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Product
Communications Test System for Frontline Diagnostics
CTS-2750
Test System
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
5FE Slim Type Unmanaged Industrial Ethernet Switch
EKI-2525LI
Ethernet Switch Module
Supports wide operating temperatures from -40 to 75 °C, Supports redundant 12 ~ 48 VDC power terminal input plus one DC power jack and P-Fail relay, Provides compact size with DIN-rail/Wall mount, and IP40 metal mechanism. Supports 10/100 Mbps Auto-Negotiation, Provides 5 Fast Ethernet ports with Auto MDI/MDI-X.
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Product
4FE+1FE SC Multi-Mode Unmanaged Ethernet Switch
ADAM-6521
Ethernet Switch Module
Provides 4 x 10/100 Mbps Ethernet ports with RJ-45 connector and 1 x 100 Mbps multi/single-mode fiber port with SC/ST connector, Supports full/half duplex flow control, Supports Integrated Loop-up engine. Supports MDI/MDI-X auto crossover, Provides broadcast storm protection. Supports +10 ~ 30 VDC voltage power input.
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Product
24GE+4G Combo Unmanaged Ethernet Switch
EKI-2428G-4CI
Ethernet Switch Module
19" Rackmount, -40~75℃, 24 x Gigabit ports + 4 x Gigabit copper/SFP combo ports, SFP socket for Easy and Flexible Fiber Expansion. Provides 8K MAC address, Supports 12-48V DC power input, -40 ~ 70°C wide-range operating temperature.
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Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
In-Line 2-Module In-Circuit Test System; i337x, Series 5i
E9988E
In-Circuit Test System
Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
Test Instrument
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
4GE PoE+1G+1G SFP, Unmanaged Ethernet Switch
EKI-2706G-1GFPI
Ethernet Switch Module
Supports 10/100/1000 Mbps Auto Negotiation (EKI-2706G) Supports jumbo frame transmission up to 9 kbytes, DIN-rail with IP30 metal mechanism, Redundant 24~48 VDC power input(BE Version) 4 x IEEE 802.3 af/at PoE ports + 1 x Gigabit Copper + 1 Gigabit SFP ports.
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Product
PXIe-8521, 4-Port, 100BASE-T1 PXI Automotive Ethernet Interface Module
786771-01
Ethernet Interface
PXIe, 4-Port, 100BASE-T1 PXI Automotive Ethernet Interface Module - The PXIe-8521 is a 100BASE-T1 unshielded twisted pair (UTP) Automotive Ethernet interface for developing applications with the NI‑XNET driver. The PXIe-8521 is ideal for developing applications that require … Automotive Ethernet to test and validate automotive electronic control units (ECUs). The interface provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, which allows it to synchronize with an external network as well as the rest of a PXI system. The PXIe-8521 also provides LEDs on the front panel so that you can monitor the network link and activity.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
