In-line High-Density ICT System Series 7i

The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.

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In-circuit Test

i3070 - Keysight Technologies

The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.

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1-Module In-Circuit Test (ICT) System, i327x Series 5

E9901E - Keysight Technologies

The E9901E i307x Series 5 offers just enough nodes for testing small boards in a small footprint tester. The system includes the same Ease of use GUI on its predecessor, the E9901D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today's components.

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2-Module ICT System, I317x Series 6

E9902G - Keysight Technologies

Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.

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4-Module In-Circuit Test (ICT) System, i307x Series 5

E9903E - Keysight Technologies

The E9903E i307x Series 5 has the largest nodes count coverage of the i3070 Series 5 family at 5184 nodes. The system includes the same Ease of use GUI on its predecessor, the E9903D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today's components.

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4-Module ICT System, I307x Series 6

E9903G - Keysight Technologies

Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.

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In-Line 2-Module In-Circuit Test System; i337x, Series 5i

E9988EL - Keysight Technologies

The i3070 Series 5i Inline ICT retains the popular and proprietary Keysight short-wire fixturing technology used in our stalwart Keysight 3070 and i3070 systems.

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In-Line 2-Module In-Circuit Test System; i337x, Series 5i

E9988E - Keysight Technologies

Short wire fixturing eliminates problems commonly found with long wire fixturing, such as noise and deterioration of test stability. This translates into transportable, repeatable and stable tests on your i3070 Series 5i, even if you need to deploy tests halfway across the globe, or on different manufacturing sites.

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2-Module In-Circuit Test (ICT) System, i307x Series 5

E9902E - Keysight Technologies

All i3070 Series 5 tests systems include a new infrastructure for more flexibility in the addition, control and connection of external electronics or instruments. The system allows external electronics to be plugged into the test head as if it has been merged into the system. The external electronics can be functional test circuits to provide additional functional test coverage at ICT, or provide additional stimulus to the unit under test for better test coverage. Control of the external electronics, test sequence and test results are still through the BT-BASIC test plan, executed by the test head PC Controller that our users are familiar with.

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2-Module In-Circuit Test (ICT) system, i307x series 5

E9905E - Keysight Technologies

The E9905E i307x Series 5 is designed to meet the needs of most mainstream electronics manufacturers with in-circuit test requirements in a reduced size test head. The system includes the same Ease of use GUI on its predecessor, the E9905D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today's components.

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2-Module In-Circuit Test (ICT) system, i307x series 5

E9905EL - Keysight Technologies

The E9905EL i307x Series 5 is designed on a slimmer footprint to meet the needs of most mainstream electronics manufacturers with in-circuit test requirements in a reduced size test head. The system includes the same Ease of use GUI on its predecessor, the E9905D i307x system. Since the launch of the first Series 1 3070 test system, decades ago, the Transportability, Reliability and Stability (TRS) is maintained including the capability to test at low voltages that are required with today's components.

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