Gigabit Ethernet Test
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
8FE Slim-Type Unmanaged Industrial Ethernet Switch
BB-ESW108-A
Ethernet Switch Module
8 x fast Ethernet ports with auto MDI/MDI-X, Supports 10/100 Mbps auto negotiation, Compact size with DIN rail and wall mount. Supports redundant 12~48 VDC or 10~24 VAC power input, Wide operating temperature range of -40 ~ 75°C, C1D2 for hazardous locations.
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Product
3U CompactPCI Serial 4-Port USB 3.2/2-Port Ethernet Card
cPCI-A3USB
Ethernet Interface
- Follow PICMG® CompactPCI® Serial design guide- CompactPCI® Serial, 3U 4HP- 4x USB3.2 Gen 1 ports and 2x RJ45 2.5G LAN ports in front panel- 1x USB2.0 port on board- Operating temperature: -40°C to +85°C- Designed to meet EN50155 standards
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Product
Mini In-Circuit Test System
U9403A
In-Circuit Test System
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
4 X 10GbE + 16GE + 8GE Combo L3 Managed Ethernet Switch, -40~85℃
EKI-9728G-4X8CI
Ethernet Switch Module
16 x Gigabit RJ-45 ports + 4 x 10GbE SFP ports + 8 x Gigabit combo ports, L3 function : Static route , RIP v1/v2 , OSPF v2 , VRRP, SFP socket for easy and flexible fiber expansion. Management: SNMP v1/v2c/v3, WEB, Telnet, Standard MIB, Security:802.1x HTTPS,SSH and SNMPv3, Dual power input and 2 relay output.
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Product
Gigabit Ethernet
SFP OC3 / OC12 / OC48
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OC3, OC12, and OC48 transceivers are supplied for short, intermediate, and long reach applications. Compatible with Cisco equipment, all include LC connectors and are compliant with industry standards.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
Test System
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
Test Handler
M6242
Test Handler
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Product
8-Ports Gigabit Ethernet RCV Interface (R)
YAV90058
Ethernet Interface
8x RJ45 LAN connectors to VPC RCV 192 pins module.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
Unmanaged Ethernet Switch
EKI-2712X-SPE
Ethernet Switch Module
Provides 2 x 10G, 2 x 2.5G, 2 x SFP+, and 6 x SPE ports, SFP+ socket for easy flexible fiber expansion, Offers DIN Rail and wall mounting options. Supports wide-range 9–36VDC power input, Compliant with IEEE 1588 E2E TC standard, Supports gPTP IEEE 802.1AS-2020 Time-aware bridging.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
EN50155 Managed Ethernet Switch
EKI-9512E-4GMW
Ethernet Switch Module
8 x M12 D-Coded 10/100 Mbps ports + 4 x M12 X-Coded 10/100/1000 Mbps Byapss ports, Complies with EN50155 & EN50121-3-2, Operating temperature: -40 ~ 75°C, Operating power input range: 16.8~137.5VDC, Supports X-Ring Pro for rapid and predictable convergence. Supports IXM for fast and easy maintenance, Supports N-Key for quick configuration and backup, M12 connector with IP67 rugged housing.
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Product
6GE+2G Multi-Mode Fiber Port Unmanaged Ethernet Switch
EKI-2728M
Ethernet Switch Module
Provides 6 x 10/100/1000 Mbps Ethernet port with RJ45 connector, Provides 2 x 1000 Mbps fiber port with SC type connector for 1000Base-SX/LX device, Supports MDI/MDI-X auto crossover. Supports Auto-Negotiation, Supports redundant 12 ~ 48 VDC and 24VAC power input, Provides flexible mounting: DIN-rail and Wall mount.
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Product
Universal Test System
LEON System
Test System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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Product
Functional Test System
TS-5040
Functional Test
The Keysight TS-5040 Functional Test System is a cost effective, robust and reliable test system that gives you the lowest cost of ownership. In addition, the open architecture Test Exec SL gives you the flexibility to do just about anything you want.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
Test System
Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
4FE+1FE SC Multi-Mode Unmanaged Ethernet Switch
ADAM-6521
Ethernet Switch Module
Provides 4 x 10/100 Mbps Ethernet ports with RJ-45 connector and 1 x 100 Mbps multi/single-mode fiber port with SC/ST connector, Supports full/half duplex flow control, Supports Integrated Loop-up engine. Supports MDI/MDI-X auto crossover, Provides broadcast storm protection. Supports +10 ~ 30 VDC voltage power input.
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
