JTAG Technologies Inc.
We are a solutions company specializing in PCB assembly testing, fault diagnosis and device programming. We develop innovative products built upon boundary-scan (IEEE Std 1149.x) standards and supply our software and hardware products and services world-wide.
- 877 FOR JTAG
+31 (0) 40 295 0870 - info@jtag.com
- Bogert 6
Eindhoven, 5612 LZ
Netherlands, Kingdom of the
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Digital/Analog/Frequency Measurement Module
JT 2149/DAF
The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module for use in JTAG Technologies’ widely-used JT 2147 (QuadPod) signal conditioning interface. The DAF module has been designed to replace a regular TAP Pod and provides 28 measurement channels plus a clock generator. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
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Pod with Four Test Access Ports for 5v or 3.3V TTL Thresholds
JT 2137
The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
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JTAG Live Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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DIOS (Digital I/O Scan Module)
JT 2122/MPV
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
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BSD (Test Diagnostics)
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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QuadPOD Conditioning Interface
JT 2147/VPC
The JT 2147/VPC is a variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within Virginia Panel Corporation’s mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry, two independent, programmable TAP modules (of type JT 2149) and two TAP modules with I/O (of type JT 2149/MPV) on a single board that interfaces via the VPC QuadraPaddle connectors type G20x or G14x.
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64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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DataBlaster PCI / PCIE JTAG Boundary-Scan Controller
JT 37x7/PCI
High speed and performance JTAG Boundary-scan PCI PC plug-in controller for PCI bus slot or PCIe PC plug-in controller for PCI Express bus slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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I/O Modules
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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Boundary-Scan Controllers
Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry’s most reliable IEEE 1149.x high speed and performance JTAG controllers, JTAG interfaces and more. To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factors. For use in design, production and manufacturing and service.
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USB Explorer (Two Port)
JT 3705
The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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USB License Key
Sentinel RMS
For customers that wish to use our software on different computers we offer the possibility to purchase our software license locked to a USB dongle. Add this product to your software order and we’ll deliver your software licenses linked to a compact Sentinel RMS license key.
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TAP Signal Isolation Module
JT 2139
The JT 2139 is a TAP signal isolation module designed for use in combinational test systems that utilise multiple instrument interfaces. To avoid parasitic capacitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technologies boundary-scan controller from the remainder of the instrumentation system. JT 2139 isolators are a standard component of the JTAG Technologies ‘Symphony’ systems that integrate boundary-scan with In-Circuits Testers etc..


















