Nano-focus X-ray Inspection System
X-eye NF120 - SEC Co., Ltd.
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
-
Entry-level X-ray Inspection System
X-eye 5100 Series - SEC Co., Ltd.
-
High-speed In-Line 3D CT Inspection System
X-eye 6300 - SEC Co., Ltd.
-
In-Line X-ray Inspection System
X-eye 6200 - SEC Co., Ltd.
-
In-Line X-ray Inspection System for Secondary battery
X-eye 9000 Series - SEC Co., Ltd.
-
Inspection System
X-eye 7000B - SEC Co., Ltd.
-
Inspection System for Die Casting
X-eye 7000BS - SEC Co., Ltd.
-
X-ray Inspection System
X-eye SF160 Series - SEC Co., Ltd.
-
X-ray inspection system for BLU, LED Long bar products
X-eye 9000LED - SEC Co., Ltd.