Showing results: 541 - 555 of 2807 items found.
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MPI Probe Card Technology
The Osprey probe card is MPI’s solution to demand for ever finer pitch. It is designed for smaller Al pad, and is ideal for tiny pitch application with peripheral and full array pattern. With precise alignment and better planarity control, Osprey can reach higher productivity by multi-DUT design. The forming wire (FW) type needle produced with MPI’s own micro fabrication process not only delivers high-quality performance but also allows easy needle replacement and shortens maintaining cycle time.
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Anritsu Corporation
With today's high data rates and high definition services, connector quality and inspection has never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.The Video Inspection Probe (VIP) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions.
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FIP-920 -
SYOPTEK INTERNATIONAL LIMITED
FIP-920 Fiber Optic Inspection Probe combines a 3.5” high definition TFT LCD display, provides a detailed image of fiber end-face, zoom in/out feature make it easy to identify the smallest particles, scratches. With the attached SD card memory, you can capture/record the live end-face image, the image file can be reviewed/transferred via SD card reader or USB cable. Up to 8hrs battery working make it possible to inspect the fiber end-face at any time and any place.
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Tektronix, Inc.
The IsoVu Measurement Systems can make nearly impossible measurements – like high-side Vgs- a reality, providing today’s power engineer with measurement insights not available in other power systems and instruments. When performing near-impossible measurements, especially in those involving Gallium Nitride (GaN) and Silicon Carbide (SiC), it can be extremely time consuming and cumbersome. IsoVu eliminates those concerns: IsoVu probes offer better common mode rejection and higher bandwidth for high EMI environments and on power FETs like SiC and GaN.
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Dynamic Test Solutions
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Pilot 4D L4 -
SEICA SpA
The Pilot 4D L4 represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system. Thanks to its integrated SMEMA conveyor, the Pilot 4D L4 can be combined with automatic load/unload magazines or lines, executing in-circuit, functional and visual tests of electronic boards in a completely automated mode. This is the ideal solution for medium and even high volume production test needs. The large test area can accommodate 21” x 24” boards (540 x 610 mm) board with split test. The ATE rack can be expanded with up to 1032 analog channels, connectable to an optional external bed of nails test fixture (TPM).
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EPMA -
JEOL Ltd.
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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EPMA-1720 -
Shimadzu Corp.
Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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JXA-8530FPlus -
JEOL Ltd.
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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IDR-321 -
Integrity Design and Reseach Corp.
Typical applications: Earth's field vector measurement, air shipment inspection, mapping & recording field perturbations, etc.
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HVP-40M -
PINTEK Electronics
*DC 40KV CAT II Pollution 2*600MΩ Impedance*25KV ± 2%, 40KV ± 3%*T.C. 200 ppm/oC*Positive Polarity only.*Resolution 1KV*Need not power.*CE, TUV GS, UL, CUL, IEC1010
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HVP-39pro -
PINTEK Electronics
* 39KVDC+ACpeak* 900MΩ Impedance* DC~50MHz(-3dB)* 1000:1 for Oscilloscope* Very Low Nosie