Showing results: 1006 - 1020 of 2807 items found.
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CX-4.0 -
Shenzhen Chuangxin Instruments Co., Ltd.
Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin®. The rod is made of stainless steel.
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CX-A4D -
Shenzhen Chuangxin Instruments Co., Ltd.
Used to verify protection against access to hazardous parts through top openings. Meets IEC, EN, UL and CSA Standards including IEC 1010, EN61010-1, UL3101-1, and CSA 1010-1. The handle and stop face are made of Delrin. The rod is made of stainless steel.
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CX-12.5 -
Shenzhen Chuangxin Instruments Co., Ltd.
The rigid sphere (12.5 mm) from Autostrong is designed and manufactured to perform the test specified in many standards (IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950) to prove the degree of protection for the first characteristic numerals 2 (IP2X) .Its is designed to meet the requirements of international safety regulatory agencies such as UL, DNV, IMQ, BVSQ, ITS, IRAM , CSA, VDE, DIN , INMETRO.
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TE6-0718 -
Hangzhou Tonny Electric & Tools Co., Ltd.
*For use on 6V, 12V and 24V DC systems*Tests high and low voltages on all vehicle circuits, including computerized engine and body controls*Dual color LED indicates red for power and green for ground
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atg Luther & Maelzer
They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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DL10-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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DL07-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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DL03-ISO -
Teledyne LeCroy
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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TV-4510 -
Gemini Data Loggers Ltd.
Dual channel temperature recorder LCD display of current readings 30,000 readings capacity High accuracy and reading resolution Fast data offload Splashproof case Low battery monitor and battery low indicator Programmable alarms Optional audible alarm box USB and serial download cables
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OHT Inc.
*This system can measure MRAM characteristics automatically.*Generates strong and constant magnetic fields. (Max 1.5T, the highest in the industry)*Performs high speed sweep of magnetic field by using non-magnetic materials wafer chuck. (Max 4Hz, ±1T, the highest in the industry)
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EdgeProbe Nano DVB-T/T2 -
TestTree
With its small, compact and easy to handle design, the EdgeProbe Nano DVB-T/T2 is the ideal tool for field technicians to transport in order to validate and monitor 24/7 all points of a DTV network.EdgeProbe Nano is able to monitor DVB-T and DVB-T2 signals through its RF input (144 x 137 mm compact format).Combined with a Network Monitoring System or not, the EdgeProbe Nano provides a powerful broadcast network alert & diagnosis tool allowing DTV network operators to monitor global trends and anticipate potential failures.
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B4655A -
Keysight Technologies
Quickly access internal Xilinx FPGA signals Make incremental measurements in seconds, without changing design timing Access up to 128 internal Xilinx FPGA signals for each pin dedicated to debug Measurement can be either in State (synchronous) or timing (asynchronous) mode
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U1186A -
Keysight Technologies
Consists of a K-type thermocouple bead and a mini connector to dual banana plugs.
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U1185A -
Keysight Technologies
The U1185A consists of a thermocouple bead (J-type) and a mini connector to dual banana plugs.
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B4656A -
Keysight Technologies
Quickly access internal Altera FPGA signals Make incremental measurements in seconds, without changing design timing Access up to 256 internal Altera FPGA signals for each pin dedicated to debug Measurement can be either in State (synchronous) or timing (asynchronous) mode