JEOL Ltd.

JEOL is a leading global supplier of scientific instruments used for research and development in the fields of nanotechnology, life sciences, optical communication, forensics, and biotechnology.

  • +81-42-543-1111
  • +81-42-546-3353
  • 3-1-2 Musashino
    Akishima, Tokyo 196-8558
    Japan

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Showing results: 1 - 15 of 17 items found.

  • Clinical Chemistry Analyzer

    CA - JEOL Ltd.

    A compact, reliable chemistry system with versatile functions Micro-volume technology Automatic on-board hemolysis for HbA1c Smart space-saving design Max. Throughput 800T/H for Photometry 1,200T/H with ISE

  • Electron Probe Microanalyzer

    EPMA - JEOL Ltd.

    JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.

  • Electron Probe Microanalyzer

    JXA-8530FPlus - JEOL Ltd.

    JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.

  • Electron Spin Resonance Spectrometer

    ESR - JEOL Ltd.

    Electron Spin Resonance (ESR) is a powerful analytical method to detect, analyze and determine thecharacteristics of unpaired electrons in a substance. It is clear that the state of electrons in a substance have a strong influence on its characteristics and functionality, so evaluation by ESR is becoming more and more important. Many types of substances, from electronic materials to catalysts, biological samples, can be studied regardless of whether they are solid, liquid, or gas. A wide range of ESR techniques are possible using suitable attachments together with the basic instrument.

  • High-end Transmission Electron Microscope

    CryoARM - JEOL Ltd.

    JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.

  • Nuclear Magnetic Resonance Spectrometer

    NMR - JEOL Ltd.

    NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.

  • pecimen Preparation Equipment

    JEOL Ltd.

    Thermal damage can be reduced by cooling the specimen with liquid nitrogen during processing.Designed to suppress the consumption of liquid nitrogen, allowing long cooling periods.Rapid cooling of the specimen while immersed in liquid nitrogen. Return to room temperature. Designed to allow parts to be detached.

  • Photoelectron Spectrometer

    ESCA - JEOL Ltd.

    Equipped with a newly-designed user interface that further improves operability and also debuts a sophisticated, new modern and sleek exterior design.

  • Transmission Electron Microscope

    TEM - JEOL Ltd.

    Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.

  • X-ray Fluorescence Spectrometer

    JEOL Ltd.

    X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.

  • Auger Microprobe

    Auger - JEOL Ltd.

    It is a high specification Auger electron spectrometer with a hemispherical analyzer to provide high throughput analysis of the chemical bonding state at nano to micro areas, and a field emission electron gun also used for EPMA, because it can deliver a large, stable electric current The highly precise eucentric specimen stage makes it possible to perform the previously-impossible analysis of insulators. This in combination with the floating type ion gun offers the versatility to handle any specimen, such as metals and insulation materials, to obtain composition information to and chemical information.

  • Scanning Electron Microscope

    JSM-IT510 - JEOL Ltd.

    Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.

  • MultiBeam System

    FIB - JEOL Ltd.

    An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.

  • Scanning Electron Microscope

    SEM - JEOL Ltd.

    Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.

  • Electron Beam Lithography System

    JEOL Ltd.

    Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.

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