Showing results: 961 - 975 of 2807 items found.
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FS4500 -
FuturePlus Systems
The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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TV-4076 -
Gemini Data Loggers Ltd.
Temperature recorder with integral stab probe LCD display of current readings 30,000 readings capacity High accuracy and reading resolution Fast data offload Splashproof case Low battery monitor and battery low indicator Programmable alarms Optional audible alarm box USB and serial download cables
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8734 -
TEGAM Inc.
For measuring semi-soft materials within a restricted temperature range. Compact size makes this probe easy to transport. The 403 stainless steel sheath has a pointed tip and is 3-3/4" long with a 2" handle. Thermoplastic rubber, coil-styled cord extends from 1-1/2 feet to 5 feet.
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SQprobe -
Telchemy Incorporated
SQprobe® is an advanced high speed probe designed for emerging software defined (SDN) and virtualized networks. It monitors IP based voice, video, audio and data streams at Gigabit rates, performing deep packet inspection (DPI) and providing accurate and detailed real time service quality metrics, usage and demographic data.
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Four Dimensions, Inc.
Four Dimensions' Mercury Probe Systems use the liquid metal Mercury to form temporary non-damaging electrical contacts on numerous materials. The instantaneous contact formed on semiconducting materials can be of MOS, MIS, or Schottky barrier type. This permits various electrical characterizations of for example silicon and compound semiconductors without the need of metal deposition processes.
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T3 -
Teledyne LeCroy
Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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8715A -
TEGAM Inc.
Type-K thermocouple probe. For monitoring hotplates, furnaces, molds, and other solid surfaces. The exposed thermocouple junction provides an accurate reading of surface temperature within 3 seconds. The sheath is 6" long with a 1/4" diameter flat tip. It is constructed with #304 stainless steel. The vinyl clad straight cord is 3-feet in length
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KP Technology
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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PPKIT04 -
Matco Tools
*Combines the Power Probe 4, PPECT3000 and various accessories to provide the ultimate combination of diagnostic and circuit testing capabilities*Tests for AC/DC voltage in 100ms and 50s resolutions, AC volts RMS and volts peak-to-peak, measure resistance, frequency and pulse width (negative and positive)*Tests fuel injectors, module drivers (transistors) and works as a circuit detector with the PPECT3000
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Sensors -
Foerster Instruments, Incorporated
We offer a comprehensive range of standard and customised sensors, probes and coils for component testing. If the wide selection of standard sensors does not optimally solve your testing task, we offer you an individual new development specially adapted to your testing task. Thanks to our many years of experience, you receive reliable sensor technology for reproducible test results.
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Tektronix, Inc.
Differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a Tektronix low voltage differential oscilloscope probe ensures that you see every possible detail. Tektronix offers TriMode™ architecture which streamlines measurement acquisition by enabling you to make differential, single-ended, and common mode measurements with a single connection!
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Extech 445715 -
Extech Instruments Corporation
This Big Digit Hygro-Thermometer with extendable probe (18” cable) measures humidity from 10% to 99% RH and temperature from 14 to 140°F (-10 to 60°C). Accuracy of ±4%RH and ±1°C/1.8°F. This meter also includes maximum, minimum and rest functions and has a rear calibration adjustment post with optional RH calibration bottles. Comes complete with built-in stand, mounting bracket, sensor, and 1 AAA battery.
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TSM Probe -
Mividi, Inc.
The Mividi TSM Probe is a compact system that runs Mividi TSM100 video streaming monitoring software and TSM Web remote management software on an Intel NUC PC. It receives data via IP interface and supports most common streaming protocols including TS over UDP, RTP, HTTP, HLS, RTMP, RTSP and MMS. The size of the device is only 4.5 x 1.9 x 4.4 inches, and it can be used for remote monitoring of IPTV and OTT video services in the proximity of customers.
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Beijing TIME High Technology Ltd.
There are 7 kinds of probes to work with Leeb hardness tester for different applications, which is D / DC / D+15 / C / G / E /DL.● Universal Impact Device D - For the majority of hardness testing requirements.● DC - Used in very confined spaces, e.g. in holes, cylinders or for internal measurements on assembled machines.● DL - For measurements in extremely confined spaces or at the base of grooves.● D+15 - For measurements in grooves or recessed surface.● C - Surface hardened components, coatings, thin walled or impact sensitive components (small measuring indentation).● G - Solid heavy or rough components. e.g. heavy castings and forgings.● E - For super hard materials.
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USB Multilink ACP -
P&E Microcomputer Systems
P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.