Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
-
Product
Wafer Edge Profile Measurement
WATOM
-
WATOM can carry out fully automatic, non-contact measurements of the edge profiles and diameter in accordance with SEMICON standards. A special feature is the system's ability to make measurements of the mark cut into the edge of the wafer to indicate the crystal orientation. Because of its high measurement accuracy of less than 1.5 µm, leading wafer manufacturers across the world use WATOM for shop-floor geometrical quality control.
-
Product
Compact Passive and Active Resistor Trimming for Thick and Thin Film
LRT 2000C
-
*Travel: 6" x 6"*Laser : Fiber Laser Ytterbium 1064 nm*Kerf: 30 to 80 micron Adjustable*Pulse width : 80 nano second*Rap Rate: 1 to 1 million Pulse Per Second*Average Power: 20 watts
-
Product
Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
-
*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
-
Product
Wafer Tester
-
Tokyo Electronics Trading Co., Ltd.
A vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD).
-
Product
Coating thickness XRF Standards
-
We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
-
Product
Probe Needles for Wafer Sort and Test Applications
-
Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
-
Product
Thick Film Inspection
785
-
For thicker coatings such as coal tars, extruded and tape coatings, the Model 785 has a range of infinite voltage settings from 1,000 to 15,000 volts.
-
Product
Bond Tester for Wafers 2 - 12 inch
Sigma W12
-
Bondtester for wafers or at wafer level 2” – 12” (up to 300 mm)Precise testing and Cold Bump Pull (CBP) testingLarge X/Y stages X: 600mm, Y: 370 mmForce range from 1gf – 10 kgfBump pitch down to 20 µm
-
Product
WAFER MVM-SEM
E3300 Family
-
The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
-
Product
Paint & Powder Coating Thickness Gauge
415
-
The new Elcometer 415 Industrial Paint & Powder Thickness Gauge provides simple, fast and accurate coating thickness measurements on smooth and thin industrial paint and powder coatings.
-
Product
Equipment Front End Module Wafer Handler
Sigma EFEM
-
Integration transforms the bond tester into a fully automated system. We offer various types of EFEM (Equipment Front End Module) wafer handlers, to combine with a Sigma W12 for operator-free bond testing.
-
Product
WAFER MVM-SEM® E3300 Series
E3310
-
The E3310 is a WAFER MVM-SEM®* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
-
Product
Current Sensing Resistors, Thick Film Type
-
Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
-
Product
Underwater Thickness Meter
Multigauge 3000
-
Large bright 10mm display. Integral battery with 55 hours runtime. Can be easily upgraded to a topside repeater. 500m depth rating.
-
Product
Thickness Meter for Phosphor Coating
PM200T
-
PM200T is applicable for the manufacturers of fluorescent lamp. During the procedure of powdering tube, PM200T solves the problem efficiently how to control the phosphor thickness and uniformly of the tube. It becomes the important tool to reach best lumen output and save the phosphor.
-
Product
Wafer Inspection Products
-
Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
-
Product
Distance, Coating and Thickness Meters
-
PeakTech Prüf- und Messtechnik GmbH
This professional laser distance measuring device with multi-line LCD display, which has a backlight, was specially designed for high-precision distance measurements.
-
Product
Thickness Gauge
124
-
The Elcometer 124 Thickness Gauge is used to measure the peak-to-valley height of a surface profile moulded in the Elcometer 122 Testex® Replica Tape.
-
Product
Flaw Detector & Thickness Gauge
DFX-8+
-
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
-
Product
Film Thickness Measurement
-
Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
-
Product
Coating Thickness Gauge - Integral
Elcometer 456
-
Whether you are measuring on smooth, rough, thin or curved surfaces, the Elcometer 456 Dry Film Thickness Gauge produces accurate, temperature stable measurements thanks to its ±1% thickness measurement capability and increased reading resolution.
-
Product
Coating Thickness gauges.
-
PELT gauges provide data for the precise control of exacting coating-applications including for automotive paints, wind turbine blade protective coatings, steel coil coatings, and shipping container anti-corrosion coatings. PELT gauges measure coatings on substrates including steel, aluminum, plastics, carbon fiber, composites, glass, and wood.
-
Product
Anti-Surge High Power Thick Film Chip Resistors
-
Panasonic Industrial Devices Sales Company of America
Anti-Surge High Power Thick Film Chip Resistors by Panasonic
-
Product
Wafer Inspection Machine
IV-W2000
-
The IV-W2000 is a wafer inspection machine that features on-the-fly scanning and inspection as well as automatic handling of 6/8/12-inch wafers. With the option to have a Chinese language UI, this machine is also known for being intuitive and user-friendly.
-
Product
Moisture / Thickness / Density Meters
-
On-line multi IR wavelength analyzer utilizing infrared absorption technology for measuring product constituent and/or thickness.
-
Product
Premium Handheld Coating Thickness Gauges
DUALSCOPE® FMP100 and H FMP150
-
Coating thickness measurement at the highest level. The device series for maximum flexibility and control in coating thickness measurement. Ideal for the use of inspection plans.
-
Product
Coating Thickness Gauge
NOVOTEST TP-1M
-
Portable Coating Thickness Gauge NOVOTEST TP-1M – device for operative non-destructive measuring of coating thickness in compliance with ISO 2808 with high measurement accuracy.Coating thickness gauge is designed to test:thickness of various thick protective coatings on various metals and alloys;thickness of paint and other dielectrics – radioabsorbing, mastic, teflon, plastic, electroplating coatings on steel;thickness of electroplating and paint coatings on non-ferromagnetic alloys and non-ferrous metals;thickness of bitumen and other thick coatings on various metals and alloys;as well as relative humidity, air temperature, surface temperature, dew point temperature and difference between surface and dew point temperatures, estimate the depth of grooves and the surface roughnessElectronic thickness gauge – device which widely used in shipbuilding and automotive industries for measuring of the thickness of paint, in order to test the quality of products, also it used for determining technical condition of the tested objects.
-
Product
Ambient Temperature Vacuum Wafer Chucks
-
6" (152mm) Vacuum Wafer Chuck for General Purpose Ambient Temperature testing with a Stainless Steel vacuum wafer surface
-
Product
Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10 DUPLEX
-
The professional for duplex measuring. The specialist for measuring the thickness of duplex layers from automotive to roof panels.
-
