Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Product
Microwave Furnace for Ash, Bone Content & Carbohydrate Analysis
Phoenix
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The Phoenix line of microwave muffle furnaces offers unmatched versatility and speed in a rugged, easy-to-use system. Choose from two configurations and a variety of options!
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Product
Real-Time Analysis up to 255 MHz, Basic Detection, Multi-touch
N9041B-RT1
Signal Analyzer
See, capture, and understand elusive signals as short as 17.17 s with 100% POI and a complete set of advanced triggers, up to 110 GHz View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 VSA software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Satellite Carrier Reconnaissance and Analysis System
SCL-SACRAS
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Shoghi’s Satellite Carrier Reconnaissance and Analysis System (SCL-SACRAS) is capable of detecting Point-to-Point satellite links, which work for international Voice networks, GSM Abis backhaul links, IP links and VSAT networks of major VSAT manufacturers including iDirect, Hughes, Gilat, Eastar Romantis, Comtech; including the various types of proprietary protocols and services running on them.SCL-SACRAS can be utilized for the carrying out the detailed reconnaissance of satellite carrier frequencies running on various target satellites, for identification of target carriers for regular monitoring which are of the customer’s interest. Military or intelligence agency customers can utilize this system to identify the target links on respective satellites for continuous monitoring, using the Shoghi VSAT Monitoring System.
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Product
Optical Communication Analysis
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In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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Product
Network Analysis Solution
IOTA
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IOTA is a complete network analysis and troubleshooting solution for a variety of use cases in small, mid-size enterprises, remote sites, and small data centers. It is a versatile integrated solution, combining TAP, storage, and analysis capabilities in a single portable device.
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Product
Software for Configuration, Logging and Analysis
LMG-CONTROL
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ZES ZIMMER Electronic Systems GmbH
Real-time display of configuration and measuring valuesTransfer of up to 3000 measuring values per secondTimestamps with a resolution of 1 millisecondVersatile analysis of sampling valuesExport of measuring values to other applications
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Product
Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Product
Occlusal Analysis with BiteForce DynamicsTM
T-Scan
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The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
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Product
Combustion Analysis System
DS-3000 Series
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With the ongoing research and development for improving combustion technologies (HCCI, EGR, etc.), new power sources (HEV and PHEV) and new fuels (biodiesel and natural gas) , development of more fuel-efficient and smaller engines are demanded. The DS-3000 series Engine Combustion Analyzer meets such growing expectations with the new, more powerful hardware.
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Product
Two-Quadrant SMU For Battery Drain Analysis, 20 V
N6781A
Source Measure Unit
The Keysight N6781A is a source / measure unit (SMU) designed specifically for the task of battery drain analysis. Whether the device under test (DUT) is an eBook reader, MP3 player, mobile phone, or pacemaker, the N6781A’s seamless measurement ranging, programmable output resistance, and auxiliary DVM combine the best set of advanced features on the market for battery drain analysis. When used with the 14585A Control and Analysis software, the N6781A becomes an even more powerful battery drain analysis solution, offering additional insights into your measurements. Learn more about the 14585A Control and Analysis software.
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Product
Gas Analysis
Si-CA 130
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The Si-CA 130 features a touch-screen display and comes with PC-based management software (in addition to the smartphone app) for more in-depth combustion gas analysis. The three field-replaceable cells and sensors offer expanded measurement capability.
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Product
Benchmark, Competitive and Failure Analysis
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Helping you determine the root cause of product failures and evaluate products against industry competition and standards.We provide third-party verification and support for claims related to performance versus competition, root product failure cause, and benchmark industry performance. As an independent laboratory with over 60 years of product testing experience, our expertise helps you evaluate products for a variety of performance related characteristics. Additionally, we can provide expert witness legal testimony for insurance claims, CPSC filings, and civil/criminal court cases through our testing results and data.
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Product
Analysis Software for FLIM, PLIM
SPCImage
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*Analysis of Single-Decay, FLIM and PLIM Data*Analysis by Iterative Convolution and Fit Procedure or by First Moment of Photon Distribution*Calculations of Decay Parameters and Lifetimes by Various Decay Models*Calculation of FRET Efficiencies*Display of Lifetime and FRET Images*Display of Lifetimes, Amplitudes, Intensities or Ratios*Export of Lifetime Data and Images
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Product
SFC-FID System For Fuel Analysis (For ASTM D5186 And D6550)
SFC-4000 Series
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The SFC-FID has been developed for a range of applications including measurement of hydrocarbons in fuels.
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Product
Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Product
Wafer Prober
Precio octo
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200mm wafer prober. The system adapts ultra-high speed indexing and high-speed wafer exchange functions to reduce test cost and improve overall equipment effectiveness (OEE) markedly enhancing productivity.
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Product
Mainframe Performance Monitoring & Analysis
Strobe
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Compuware Strobe is the industry-leading application performance monitoring and analysis solution for mainframe applications. With Strobe, IT departments can pinpoint application inefficiencies that cause excessive CPU consumption and reduce hardware and software costs while increasing customer satisfaction.
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Product
Terahertz Coating Thickness Analysis
TeraCota
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TeraView presents a film thickness gauge designed for the automotive industry. The sensor can determine the individual thickness of multiple paint layers on both metallic and non-metallic substrates and offers significant benefits over existing techniques.
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Product
PoE LLDP Emulation (PSE) & Analysis for 802.3at & 802.3bt
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The IEEE 802.3 specifications require that Type 2, Type 3, and Type 4 PDs implement PoE LLDP and use the Power via MDI TLV for power negotiation. This requirement therefore applies to any PD that draws more than 13 watts. The PDA-600 family includes an option to flexibly emulate any PSE while capturing and analyzing the LLDP power negotiation protocol from a PD.
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Product
Automated Analysis Software
RevospECT Pro
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RevospECT Pro is the industry’s first commercially available high-powered, adaptable and scalable automated analysis system. It provides end users the power and control to perform comprehensive automated analysis of eddy current data. RevospECT has a proven track record in the field and meets rigorous industry standards for flaw analysis from bobbin, rotating and array inspection techniques. Once configured for an inspection, RevospECT Pro will process and analyze data at an extremely fast rate utilizing its robust distributed processing power, often outpacing data acquisition rates and generating results that can be verified immediately by the reviewing data analyst. More importantly than system speed is the consistency of the results that are delivered using computer-aided analysis.
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Product
Multi-Track Spectral Analysis
FreqAnalyst Multi
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FreqAnalyst Multi is a unique multiple tracks real time spectrum analyzer: it lets you visualize the spectral content of several audio tracks on the same screen with extreme smoothness and high resolution for both time and frequency. It is the ideal solution for mixing: you can use it as a frequency overlap detector and actually see which part of the spectrum every single instrument uses.
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Product
Manual Contactless Wafer Detector
HS-NCS-300
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Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Product
Time Domain Analysis
S96010B
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The S96010B time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to time domain or time domain data to the frequency domain and runs on the E5080B.
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Product
Wafer Prober Networking System
PN-300
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The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.
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Product
The DC System Analysis Module
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Save time with intuitive scenario manager interface.• Communicate designs effectively with graphical and text base results.• Improve decisions by quickly comparing resulting curves from different scenarios.• Increase productivity by modeling both DC and AC systems in a single project.• Reduce mistakes by evaluating all loading conditions and duty cycle loads.
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Enhanced Imagery Analysis
RVSAR™
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Textron Systems' RVSAR is an extension for our proven RemoteView™ software and provides capabilities to enhance the clarity of Synthetic-Aperture Radar (SAR) imagery. Users can employ an easy speckle suppression solution, allowing different filters to be applied either on a single page, or multiple polarization images on one page by using with MultiViews.
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Product
Shock Response Spectrum (SRS) Analysis Solution
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Shock Response Spectrum (SRS) Analysis SolutionMechanical shock pulses are often analyzed in terms of the shock response spectrum. The shock response spectrum assumes that the shock pulse is applied as a base input to an array of independent single-degree-of-freedom systems. SDOF system assumes that each system hat its own natural frequency.
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Product
Water Silica Analysis
Navigator AW641
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ABB's Navigator 600 Silica analyzer substantially cuts the costs and maintenance associated with silica monitoring in power generation and other large-scale steam and water dependent applications.
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