Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Natural Gas Analysis
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Recently, natural gas has been recognized as a clean resournce for energy, in addition to being a raw material for chemical products. Recently a cutting-edge drilling technology has increased the use of shale gas. As the production area diversifies, the need for gas composition analysis has increased. Shimadzu addresses analytical requests with a wide system GC lineup. For analysis of liquified gas, such as LPG, a dedicated injector with a vaporizer is available. Both manual injection and online injection are available. The operation software can automatically calculate needed values, such as indexes, calorific values, etc.
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Pattern Region of Interest Analysis System
PRIAS
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PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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LC/MS/MS Method Package For Water Quality Analysis
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Shimadzu provides method files, including pre-registered MRM parameters with optimized quantitative and reference ions, LC separation parameters, and retention times and peak identification parameters for each compound, as well as report templates for outputting quantitation results, as a package. If retention times are adjusted when the system is introduced, based on the HPLC configuration delivered, the analysis process can be started as soon as the specified columns, mobile phases, and standard samples are supplied.
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On-Line Gas Analysis System
Titan-OL
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The Titan-OL is a turnkey, process-ready gas analysis system. The analyzer and sample handling hardware can be wall or frame mounted in a NEMA enclosure suitable for use in production environments, including Class I, Div. 1. The integrated sampling system is fully purgeable and can handle multiple sample and reference lines.
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Liquid Analysis
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Sensors for conductivity measurements and detection of air and gas bubbles.
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DSP System Design and Vibration Analysis
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Bridgenorth has experience in the design and implementation of a broad range of DSP systems. We offer consulting and design services in all aspects of DSP system design. Bridgenorth has worked on projects in the following areas
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Microscopy Image Analysis Software
analySIS FIVE
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The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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Signal Analysis Synthetic Instrument
SASI
Synthetic Instrument
Textron Systems’ SASI 240 is a Signal Analysis Synthetic Instrument that combines the capabilities of six distinct measurement systems into a single device. Our dual-channel architecture enables two independent radio frequency (RF) measurements to be run simultaneously. Whether used as a benchtop device or an integrated automated test equipment (ATE) RF subsystem, our SASI’s simple and intuitive graphical user interface (GUI) ensures easy, out-of-the box functionality.
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Failure Analyziz and Quality Assurance
NX20
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There's no room for error in the data provided by your instruments. Park NX20, with its reputation as the world's most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
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Product
DDR4 Protocol Debug And Analysis Solution
U4972A
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The U4972A DDR4 DRAM bundle provides software applications, probing, and hardware options for DDR4 DRAM debug, compliance validation, and analysis. The U4972A bundle includes systemization of hardware (modules installed into chassis) and software loaded onto the M9537A controller.
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MultiGas™ TFS™ Gas Monitor For Multi-Compound Gas Analysis
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The MultiGas™ TFS™ Monitor is an online, multi-compound, trace gas monitoring system in a stand-alone 19-inch rack enclosure. It uses an innovative tunable filter spectroscopy technology enabling high selectivity and stability measurement. Low detection limit (sub-ppm levels for most gases) is achieved through the use of high throughput optics coupled with a long-path gas cell and a high sensitivity detector.
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Vibration Analysis and Balancing Tools
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PRÜFTECHNIK Condition Monitoring GmbH
Predictive maintenance tools for vibration analysis can help prevent machine failure and avoid costly production downtime. Our vibration analysis tools are used for condition monitoring on rotating equipment to help detect early component wear and damage. Vibration analysis and balancing are integral parts of any condition-based and predictive maintenance program.
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Log Analysis Reporting Suite
Cyfin
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Cyfin is a customizable employee Web-use forensic log file analyzer and reporting solution. It is used by a variety of business and government organizations around the world. Scalability - Most scalable commercial log data analysis tool. Forensics - Capable of generating extremely detailed user audit reports. Comprehensive - Dashboard charting and trending system. Compatibility - Palo Alto, IronPort, SonicWall, WatchGuard, and many others. Regulatory Compliance - Covers requirements such as CIPA, HIPAA, & others.
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Video Quality Analysis Systems
ClearView Extreme 8K and 4K Systems
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Highest Resolution Video and Audio Quality Analyzers with 12G-SDI Interfaces and ST 2110 Networking Option
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Shock Response Spectrum Analysis
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A Shock Response Spectrum (SRS) is a graphical presentation of a transient acceleration pulse’s potential to damage a structure. It plots the peak acceleration responses of a bank of single degree-of-freedom (SDOF) spring, mass damper systems all experiencing the same base-excitation as if on a rigid massless base. Each SDOF system has a different natural frequency; they all have the same viscous damping factor.
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In-depth Execution Time Analysis For Critical Software
RapiTime
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*Timing analysis (inc. WCET) for Ada, C & C++ on-target & host**Identify code to optimize for worst-case behavior*Debug rare timing events*Simplify verification through integration with your CI tool*Produce evidence for DO-178 and ISO 26262 certification
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Water Fluoride Analysis
Aztec AFM631
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The Aztec 600 fluoride analyzer provides reliable and highly accurate measurement of fluoride concentrations to enable precise control of water fluoridation.
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High Performance Polyphase Energy Metering AFE w/ Power Quality Analysis
ADE9000
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The ADE9000 is a highly accurate, fully integrated energy-metering device. Interfacing with both current transformer (CT) and Rogowski coil sensors, the ADE9000 enables users to develop a three-phase metrology platform, which achieves high performance for Class 1 through Class 0.2 meters. Power quality features enable advanced meter designs with fast rms measurements and power quality level monitoring for EN50160 compliance. The ADE9000 integrates seven high performances ADC’s, a flexible DSP core. An integrated high-end reference ensures low drift over temperature with a combined drift of less than ±25 ppm/°C max for the whole channel including PGA and ADC.
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Product
DCA-M High-Accuracy, Low-Cost Solution for Optical Waveform Analysis
N1090A
Oscilloscope
The N1090A DCA-M builds on that legacy by using the high-performance elements of 86100 and 86105C. It can be configured to perform thorough optical transmitter compliance tests at a variety of standard data rates from 1.244 to 11.3 Gb/s and come with 20 GHz electrical channel in option.
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Stand Alone Wafer Sorter
MicroSORT
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The Microtronic MicroSORT semiconductor wafer sorter is designed to maximize throughput while minimizing wafer handling in a user-friendly operating environment. This stand-alone semiconductor wafer sorter enables sophisticated semiconductor wafer sorter routines for up to 4 wafer-cassette platforms. MicroSORT semiconductor wafer sorter reads OCR scribes from the top, bottom, or simultaneously, allowing for enhanced semiconductor wafer tracking and sorting. The MicroSORT semiconductor wafer sorter’s basic functions include the ability to move, compress, randomize, find, align, verify, and split semiconductor wafer lots. With our virtual tweezer mode, an operator can click on wafer icons to move wafers between cassettes, read semiconductor wafers, and swap wafer positions.
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Data Acquistion & Analysis Software
NextView 4
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One software for everything. NextView®4 covers the entire world of PC measurement data acquisition: displaying live data, recording measured values, analyzing your measurement applications - and much more.
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Time Domain/Fault Location Analysis For E5061B
E5006A
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The E5006A Time Domain/ Fault Location Analysis option allows you to locate the discontinuities and mismatches of devices such as cables. By employing the gating function in the time domain and transforming the data back to the frequency domain, you can remove unwanted responses of connector mismatch in your fixture. In addition, the cable SRL (Structural Return Loss) analysis capability is provided with the E5006A.
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*Beam Propagation Analysis
M²
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M², or Beam Propagation Ratio, is a value that indicates how close a laser is to being a single mode TEM00 beam, which in turn determines how small a beam waist can be focused. For the perfect Gaussian TEM00 condition the M² equals 1. M² cannot be determined from a single beam profile measurement. The ISO/DIS 11146 requires that M² be calculated from a series of measurements. M² is measured on real beams by focusing the beam with a fixed position lens of known focal length, and then measuring the characteristics of the artificially created beam waist and divergence. We have a number of solutions for the measurement of M² ranging from simple manual processes to fully automated dedicated instruments, depending on the frequency of the need to measure M² of lasers and laser systems.
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System for Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel
SierraNet M328Q
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The SierraNet M328Q™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with two QSFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328Q includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Enhanced Time Domain Analysis With TDR
S93011B
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S93011B enhanced time domain with TDR is available on all PNA models (N52xxB) and provides a one-box solution for high-speed interconnect analysis, including impedance, S-parameters, and eye-diagrams
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Self-Discharge Analysis Software
BT2155A
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The Keysight BT2155A self-discharge analysis software, controlling the BT2152A or BT2152B self-discharge analyzer, measures and records Li-Ion cell self-discharge current and cell voltage. The software configures the analyzer’s channel settings, such as initial voltage and current matching, channel limits (OVP, OCP, UVP), measurement intervals, and test duration.
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Surface Analysis
Dimension FastScan Bio
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The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Compact System for Chemical Analysis Technology
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Small test system based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of measuring instruments for chemical analysis in a high mix / medium volume environment.
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Protocol Analysis
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GL's protocol analyzer provides monitoring a communication link in accordance with industry protocol standards by non-intrusively tapping the network under test. The simple framework of the protocol analysis software helps you easily identify the improper sequence of protocol messages, and filter out frames causing the protocol violation.
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Wafer Thickness Measuring System
WT-425
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Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
