Showing results: 1 - 9 of 9 items found.
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BLS-I/BCT-400 -
Sinton Instruments
The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
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Suns-Voc MX -
Sinton Instruments
Perfect for paste-firing optimization and process control. Open-circuit method indicates the upper bound of efficiency for any solar cell precursors
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WCT-120TS -
Sinton Instruments
Wafer lifetime measurement instrument Offering calibrated analysis of temperature-dependent carrier-recombination lifetime.
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WCT-120 -
Sinton Instruments
Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity.
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WCT-120PL -
Sinton Instruments
Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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FCT-750 -
Sinton Instruments
In-line, light I-V and Suns-Voc measurements in a single flash at 2400 units per hour. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
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FCT-650 -
Sinton Instruments
Advanced analysis of solar cells including light I-V and Suns-Voc data.
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IL-800 -
Sinton Instruments
Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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FMT-500 -
Sinton Instruments
Advanced analysis of solar modules including light I-V and Suns-Voc data. Capability to accurately measure high-efficiency modules.