Sapphire/SIC Wafer Flatness and Surface Appearance System

Sapphire/SIC wafer flatness and surface appearance system provide a previous surface flatness testing solution, though non-contract lighting testing to record the whole information of the surface, rapid and fast measurement for various of surfaces, line and all kinds of surface information.

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Topics

Flatness
Systems
Wafer
Test Systems
Testing
Lighting
Line
Measurement