Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Leak Analysis
Hiden LAS
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The Hiden LAS system is designed to analyze the leak rate from sealed packages, from a quality control or research and development perspective.
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Video Quality Analysis Systems
ClearView Shuttle 4K and IP Systems
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4K, HD, and SD Video and Audio Quality Analyzers Portable, Desktop, and 2RU Rackmountable
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Analysis Software for FLIM, PLIM
SPCImage
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*Analysis of Single-Decay, FLIM and PLIM Data*Analysis by Iterative Convolution and Fit Procedure or by First Moment of Photon Distribution*Calculations of Decay Parameters and Lifetimes by Various Decay Models*Calculation of FRET Efficiencies*Display of Lifetime and FRET Images*Display of Lifetimes, Amplitudes, Intensities or Ratios*Export of Lifetime Data and Images
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Flexoplate Analysis
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Quality Engineering Associates Inc.
QEA has the most comprehensive and sophisticated lineup of evaluation tools for flexography, one of the fastest-growing sectors in commercial printing. Our test tools quantify flexo plates, film, masks, photopolymer- and metal-backed plates and sleeves, letterpress, newsprint and direct-engraved plates, as well as the final print.
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Trace Viewer (Software Application For Trace Analysis)
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TraceViewer application provides you with a full range of options when analyzing traces (information on the condition of a fiber at any given point of its length, received from the optical time-domain reflectometer) - receiving, viewing, editing and labeling.
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Spectrum Analysis For P50xxB Up To 6.5 GHz
S970901B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Diagnostic Laboratory Software And Data Analysis
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Enhance the way you manage quality control data, build connectivity in diagnostic workflows, ensure system security, and more with our diagnostic laboratory software and data analysis tools.
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Software Composition Analysis
SCA
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Black Duck® software composition analysis (SCA) helps teams manage the security, quality, and license compliance risks that come from the use of open source and third-party code in applications and containers.
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Spectrum Analysis, Up To 26.5 GHz
S930902B
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The S930902B spectrum analysis adds high-performance microwave spectrum analysis to the PNA family up to 26.5 GHz. With fast stepped-FFT sweeps resulting from optimized data processing, the SA application provides quick spurious searches over broad frequency ranges. Simultaneous spectrum measurements can be done using up to five test and reference receivers. This multi-channel SA can be used with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy.
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Spectroscopy & Scientific Analysis Systems
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Advancing Knowledge. Empowering Breakthroughs. Our spectroscopy instruments and software help advance knowledge and understanding of radioactive materials, empowering the next wave of breakthrough science and innovation.
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DC Power Output Analysis Service
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We will detect decrease in power output of a customer’s solar power plant caused by trouble of the panels or other system components quickly, by analyzing the monitored data.
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Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Green House Gas Analysis
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Gas chromatographs help analyze green house gases in air and soil. In addition to nitrous oxide, which is known by its high global warming potential, CO and CH4 are measured by a single analysis.
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System for the Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel
SierraNet M328
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The SierraNet M328™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Complete Power Quality Analysis System
PK4564
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PK4564 complete Power Quality Analysis System includes PS4550 Power Quality Analyzer with extended memory, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, and 1-year deluxe warranty.
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LED Tester For Chip And Wafer
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Electrical Testing: Forward：VF,DVF,VFDReverse：VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system
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Metallurgy Analysis
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The metallurgical group is well equipped and staffed (9 full-time metallurgists and technicians) to evaluate materials ranging from cast iron to superalloys to composites. They are experienced in classical metallographic techniques, as well as the latest preparation methods.
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Gas Analysis
Si-CA 030
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The Si-CA 030 offers everything heating engineers need to inspect and maintain residential and commercial boilers, with wireless connection to our smartphone app and automatic generation of servicing reports and certificates.
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Inductively Coupled Plasma Spectroscopy (ICP-OES/MS), ICP Analysis Services
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ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards. ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identifcation and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements
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Portable Data Acquisition & Analysis System
LapCAT III
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# 4, 8, or 16 channels# 1 MHz aggregate 12 bit sampling. Resolution is 0.024% of full scale# 13 recording durations, user selected: 132 msec to 1320 sec# Digital Triggering from any channel, with +/- slope or window# 6 full scale gain ranges, user selected: 0.4, 1, 2, 4, 10, and 20 volts full scale - with a 10mV/g accelerometer these equal 40g, 100g, 200g, 400g 1000g and 2000g full scale - higher or lower ranges by different sensor selection
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Gas Analysis
QIC MultiStream
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The Hiden QIC MultiStream is a complete, multi-stream gas composition monitoring system. Capable of analysing gas streams at flow rates from 4 ml/min up to 10 L/min. The system is suited to a range of applications where multi-component, multi-stream gas analysis is required, environmental monitoring for example.
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PXI Bluetooth Signal Generation and Analysis
Test Toolkit for Bluetooth™
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Start taking faster Bluetooth measurements with PXI, the most cost-effective, flexible, and capable platform for wireless device test. Keep up with the latest Bluetooth standard developments with free upgrades of the Test Toolkit for Bluetooth. Gain greater confidence in your Bluetooth design's performance and increase test coverage with a flexible toolkit that offers fine control of the generated Bluetooth waveforms and generates accurate measurement results.
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In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Probe Needles for Wafer Sort and Test Applications
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Advanced Probing Systems, Inc.
APS is the global leader in the manufacture of probe needles used in cantilevered probe cards. All probe needles used in wafer sort are manufactured according to customer specifications using stringent in-process quality assurance procedures.
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Spectrum Analysis, Up To 50 GHz
S930905B
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The S930905B spectrum analysis adds high-performance microwave spectrum analysis to the N522xB/N523xB/N524xB PNA network analyzer family up to 50 GHz.
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Incident-based Abnormal Software Behavior Analysis Services
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If you have a software problem that no one can analyze, need training to get your developers, support and escalation engineers improve their troubleshooting, debugging, memory dump and software trace analysis skills or just need the expert opinion on an existing analysis report please don't hesitate to contact us.
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Log Analysis Reporting Suite
Cyfin
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Cyfin is a customizable employee Web-use forensic log file analyzer and reporting solution. It is used by a variety of business and government organizations around the world. Scalability - Most scalable commercial log data analysis tool. Forensics - Capable of generating extremely detailed user audit reports. Comprehensive - Dashboard charting and trending system. Compatibility - Palo Alto, IronPort, SonicWall, WatchGuard, and many others. Regulatory Compliance - Covers requirements such as CIPA, HIPAA, & others.
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Non-contact Measurement Wafer Sorting System (Robot Hand Tranceportation)
NC-3000R
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*High accuracy measurement system for large diameter wafer*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Compact design of Two-stage by measuring area and transfer area*Number of cassette station can be changed by customers request Option : Add wafer flattness measurement system(FLA-200)
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Analysis Application for E84
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GCI's industry leading E84 diagnostic software is a powerful, Windows-based graphical analysis application that can upload and analyze data from GCI's E84 Handheld Tester, E84 DLD, and RJ-11 Optical Transceiver products. The E84 Analysis Application can also display the signals of a live material handoff in real-time when connected to GCI's E84 DLD or RJ-11 Optical Transceiver.
