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Product
Wafer Testing
Trio Vertical
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SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
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Product
PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
Multiplexer Module
2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Product
Wafer Chucks
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ARC, in addition to fabricating Wafer Chucks from aluminum, is also known for its ability to work in hard to machine materials such as hardened (50-62 Rockwell) metal alloys, fired ceramics, e.g. SiC and glasses. These materials are often ideal for semiconductor equipment applications due to their ability to hold critical dimensions and tolerances. ARC specializes in surface grinding and lapping these materials to precision flatness and parallelism specifications needed for semiconductor wafer chuck requirements.
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Product
Universal Programmer Superpro 6100N
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Until now,Support 401 IC manufacturer, 103004 pcs devices and keeps growing.Features:Supports 87454 types of devices from 305 IC manufacturers (by 3/15/2013) and keeps growing.Supports EPROM、Paged EPROM、Parallel and Serial EEPROM、FPGA、PROM、FLASH(NOR & NAND)、BPROM、NVRAM、SPLD、CPLD、EPLD、Firmware HUB、Microcontroller、MCU；Supports devices with Vcc as low as 1.2V. Socket Adaptors available for DIP、SDIP、PLCC、JLCC、PGA、LGA、SOIC、SOJ、SOT、QFP、TQFP、PQFP、VQFP、MQFP、LQFP、TSOP、SOP、TSOPII、PSOP、SSOP、TSSOP、SON、EBGA、FBGA、FTBGA、VFBGA、μBGA、CSP、SCSP、QFN、HVQFN etc.High programming speed.Built with 144 universal pin-drivers. Universal adaptors are available for varies packages up to 144 pins. Quick new device support. Popular NAND FLASH Platform supported including Samsung (XSR1.0/1.6), QualComm, HYNIX（HIFFS）, MTK(Solution V1.1), ICERA (v1.0/2.0), ST （7162、7141等）, AMLOGIC(IF2/0), REALTEK, PICOCHIP, DataLight ( Flash FX Pro), Marvell(310/303/920/935…), BroadCom, ZTE, Intel (CE4100)，UBI, LEADCORE(L1809OG), MSATR etc. Customer-specific NAND solution available.PC hosted mode and stand-alone dual modes. Under PC hosted mode the programmer is controlled by a PC via USB2.0 (high speed) to program a chip. Under stand-alone mode the programmer is controlled via a 6-KEY keypad and a 20 character by 4 line LCD display. A CF card is used to store the project files.User can operate multiple units to construct a concurrent multiprogramming system thank for the stand-alone mode. IC manufacturer approved programming algorithms are used for high reliability.Testing functions for logic devices.Advanced and powerful software functions.Production mode starts chip operation at the moment the chip is inserted in the socket properly.Project function simplifies processes such as device selection, file loading, device configuration setting, program option, and batch file setting into one touch step.Password can be set for project files and production volume controlBatch command combines device operations like program, verify, security into a single command at any sequence.Dynamic buffer makes it possible that each chip is programmed with different data file. Applications including serial number, MAC address etc.Log file is useful for quality tracking.Many safety mechanisms are built including self-diagnosis, wrong chip placement detection, poor-pin-contacting detection, ID checking, over-current and over-voltage protection etc.Windows XP/Vista/Win7/ Win8/Win10 compatibility.
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Product
Low-Temperature Impact Device
DWC-1
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This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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Product
6U VPX FPGA Cards
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Curtiss-Wright Defense Solutions
FPGAs have revolutionized the way digital signal processing (DSP) subsystems are configured. With a large number of gates, hardware multipliers, and high-speed serial interfaces, FPGAs enable sophisticated applications, including radar, signal intelligence, and image processing, which rely on repetitive processing that can be expressed in highly parallel form. FPGAs perform exceptionally well in FFTs, pulse compression, filters, and digital up/down converters.
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Product
DC-14GHz Divide-by-8 to 511 Programmable Integer Divider
UXN14M9P
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The UXN14M9P is a highly programmable integer divider covering all integer divide ratios between 8 and 511. The device features single-ended or differential inputs and outputs. Parallel control inputs are CMOS and LVTTL compatible for ease of system integration. The UXN14M9P is packaged in a 40-pin 6x6mm leadless plastic surface mount package.
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Product
Calipers - Dial
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A precision measuring device with parallel jaws or legs, with a shape similar to a clock face.
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Product
HiFIX High Fidelity Tester Access Fixture
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The HiFIX lineup delivers clean waveform transmission, precision docking, and multi-DUT parallel test, with high reliability.
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Product
Integrating Spheres
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Integrating spheres are used especially for measuring divergent light sources such as LEDs. The light is introduced through the input port, then reflected many times by the highly reflective interior of the sphere until it illuminates the inner surface uniformly. A detector samples a small fraction of this light to measure the total power input. Ophir integrating spheres have a highly reflective diffuse white coating for measurements independent of beam size, position and divergence. There are several sphere sizes, apertures and wavelength regions available. The large IS6 series has 2 configurations for measuring divergent or parallel beams.
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Product
Dual Surge Current Generator
MIG0612T-K12
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Designed for testing telecom surge protection devices according to ITU-T K12. The generator has two indepedent impulse outputs which allow testing of two and three terminal protection devices such as gas discharge tubes (GDT). The generator can be configured for two terminal devices or with the outputs in parallel to increase the current impulse for two terminal devices.
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Product
Serial Parallel Interface
Model 2303
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* 2303 Board provides 40 high-power TTL I/O lines that can sink 23 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Dual Serial headers support conections with baud rate switch inputs or to a Serial Flat Ribon Cable Assembly. * Optional Relay Driver board drives 24-40 relays. * 114732 Board has the DIN connector on circuit side for use with the X3DVR Relay Driver Board or for piggyback mounting.* All other specifications are the same as listed above for the 2303.
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Product
Bidirectional AC Source / Sink With Regenerative Power Supply
EAC-4Q-GS
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Single system from 30kVA to 500kVA and in parallel up to 2MVA and more. Galvanic isolation from the network. TFT touch display with simple menu navigation. Emergency stop in the front door. Indicator lights for operating status. Bidirectional current flow, up to 100% of the nominal output power can be fed back into the grid. Output voltage and phase angle adjustable per phase.
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Product
High Parallel Test Handlers
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High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.
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Product
Signal Splitter
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The Dynamic Signal Buffered Splitter protects sound and vibration sensor acquisitions from the unwanted effects of a parallel troubleshooting or diagnostic instruments. G Systems Dynamic Signal Buffered Splitter provides buffered and unbuffered outputs connected to the same signal input. Up to 16 sensors, typically accelerometers, proximity probes, microphones, and pressure transducers, may be connected to the 16 signal inputs.
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Product
Modular DC Power Supply
62000B series
DC Power Supply
Chroma's new 62000B series of Modular DC Power Supplies offer many unique features for Burn-in and plating/electrolysis applications. The features include a N+1 redundancy, high power densities, hot-swappable maintenance, remote ON/OFF and programmable control via the CAN bus. The 62000B family offers 5 types of power module with ranging from 1V to 150V, current from 10A to 90A, and offers two mainframe type of six and three position. The six position mainframe can envelop in up to six power modules paralleled operation for 9KW power output. The 62000B can easily parallel up to fourteen mainframe to 120KW with current sharing and CAN bus control for bulk power applications. The Modular DC Power Supplies of 62000B are very cost effective with high power density and low current ripple. These instruments have be designed for burn-in applications such as the LCD panels, DC-DC converters, power inverters, notebook computers, battery chargers and many other types of electronic devices.
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Product
AMIDA 5000 Tester
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AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Product
Parallel Simulation Engine
RocketSim
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Complementing compiled-code simulators, Cadence® RocketSim™ parallel simulation engine eliminates functional verification bottlenecks by speeding up simulation using commonly available multi-core servers.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Product
TRF Manager 9
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Configuration by using a PC, this is one of the major TRF generator attribute. Instruments have factory settings suitable for common applications and contain the most popular test patterns. But many users want to customize the setup or set the instrument according to specificic application requirements. They also may want to adjust parameters, that cannot be accessed by any other way. That is what TRF Manager 9 (optional software pack) can do. And much more! Pattern generators of the TRF-498 and 598 series use a parallel interface for connection with PC. Basic setup can be realized by using Pattern Manager, free software downloadable from our site. For advanced settings there is available TRF Manager 3 software. For more detailed information see the TRF-498 and TRF-598 section, please.
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Product
Solar Array Simulator
Simulator
Among other things, solar array simulators are required for testing satellite power supplies. An SAS (Solar Array Simulator), consisting of an interconnection of several Solar Array Simulator modules, maps the solar panels and displays the individual strings connected in parallel. Optionally, the individual SAS modules are monitored by a Second Level Protection, so that the test object is not damaged in case of errors with the voltage sources. Additional circuitry is implemented via project-specific test modules. The signal path to the DUT can be separated, e.g. for dynamic current measurements.The Keysight Solar Array Simulators used were specially developed for satellite applications and cover the significantly higher requirements regarding the control speed of MPP tracking compared to terrestrial applications.
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Product
The Ultrafast Grid
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The next generation of cross browser testing gives you parallel test automation at a scale never seen before – across all browsers, devices, and viewports.
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Product
Double Function Tester with Shielded HF Test Chambers
End-of-line Tester UTP 9010 RF
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The UTP Series 9010 is a scalable test series available in a variety of feature-rich variants and many designs. The UTP 9010 RF function tester shown here as an example is suitable for tests with a medium number of channels and complexity. It is designed for parallel testing of two or more test items. The measuring instruments used are used alternately for several test items. Due to its compact design and construction as a modular system, this powerful tester can easily be expanded to larger numbers of channels.The integrated HF test chamber UTP 5070 developed by NOFFZ allows an independent shielded test. It can be operated manually or fully automatically by a robot .The basic version of the UTP 9010 series is an ideal system for functional and end-of-line tests and is already preconfigured for this purpose. The RF tester presented in the example is used in particular to test infotainment and eCall modules in the vehicle as well as IoT products with wireless technologies.
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Product
LCR & Component Tester
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PeakTech Prüf- und Messtechnik GmbH
Digital LCR measuring device for resistance, capacitance and inductance with high-resolution dual multifunction display. Components can be measured in series or in parallel and the LCR meter also offers the choice between automatic and manual range selection.
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Product
CSvideo | CTvideo | CSvision Series Infrared Thermometer
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The video pyrometer series optris CSvideo/CTvideo and the new innovative ratio pyrometer CSvision allow a parallel use of video and crosshair laser aiming for an optimal measuring field adjustment even in processes with limited access. They reliably measure temperatures of metals or ceramics and, due to their short measuring wavelength, reduces measuring errors of surfaces with low or unknown emissivities. The high quality video sighting can show its full advantage together with the software CompactPlus Connect or the IRmobile App on your cell phone with state-of-the-art zoom and image rotation features. The adjustable focus, motorized on CSvision, allows an optimal adaptation to different application and installation demands. As CSvision can measure objects up to 3000 °C a unique two-step brightness reduction filter (BRF) is giving the user a tremendous advantage when aiming on hot and extremely bright objects.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Product
Current Logger Sensor
NUL-202
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This sensor can be used to measure the current in parallel or series branches of low voltage AC and DC circuits and also to investigate the dependence of the current flow through components on the voltage across them.
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Product
Altitude Data Simulator
ADS-100
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The Model ADS-100 is an all solid-state device that simulates the output of altitude encoders/digitizers in both parallel and serial (RS232) data formats. Designed to substitute for an altitude encoder when testing and troubleshooting an aircraft's altitude reporting system, the ADS-100 provides two RS-232 compliant outputs in addition to the ICAO pressure altitude code.
