-
Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
-
The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
-
Product
Test Systems
-
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
-
Product
TMR Linear Sensors
-
MultiDimension Technology Co.,Ltd.
Linear sensor utilizes a unique push-pull half bridge composed of four unshielded TMR sensor elements. The unique bridge design provides a high sensitivity signal output that is linearly proportional to a magnetic field applied parallel to the surface of the sensor package, and it provides superior temperature compensation of the output.
-
Product
DC Bias Current Power Supply
TH1775
-
Shenzhen Chuangxin Instruments Co., Ltd.
TH1775 is a DC Bias Current Source (or DC Magnetization Current Source) used for inductance measurement of inductors and transformer windings with DC bias current. Except for constant current output, low additional error and wide frequency response range are important for bias current inductance measurement. High frequency LCR meter could be used, when the frequency response range is wide enough. MPU controlled auto current balance technology is adopted to realize AC+DC current overlap and constant current output from 0 to ±20A. Two TH1775 can be paralleled to supply a maximum current up to 40A.TH1775 permits high frequency measurement up to 1 MHz and can be directly controlled by TH2816A, TH2817A, TH2818 and TH2819. TH1773/TH1775 with its low additional error, wide frequency response range and sweep output function is widely used in DC biased inductance measurement. TH1775 also provides a perfect solution for magnetic material analysis.
-
Product
IP-Parallel-BA1 "IP-Tape"
-
The IndustryPack compatible IP-Tape design adds 48 digital parallel IO lines to one slot of your carrier board. The IO is dedicated to a DTC interface. Other interfaces can be implemented. The DTC interface has 22 Address, 16 Data plus Parity, 4 control and 5 status lines. Parity is automatically generated in write mode and checked in read mode.
-
Product
Multi-Channel UT
Pilot
-
Pilot is a next generation multi-channel UT device. Its one-of-a-kind specifications make the Pilot capable to perform advanced ultrasound inspections. Pilot is unique in its capacity to meet the most demanding needs of various industries, from aeronautics (employing composite and honeycomb structures) to in-line, as well as TOFD and many other applications with stringent requirements. Compact and powerful, this 8-channel full parallel, or up to 64 multiplexed, unit pushes the boundaries of the UT benchmark as it is more efficient than any other conventional UT system in the NDT market.
-
Product
CMOS Image Sensor
CIS
-
CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
-
Product
Power Supply, 300 V, 11 A, 3300 W
N8741A
Power Supply
Keysight's basic DC power supplies offer essential features for a tight budget. The Keysight N8741A is a 300 V, 11 A, 3300 W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage.
-
Product
Carousel Autosamplers
-
The carousel platform is designed to be sturdy, reliable, and easy to use. The rotating sample tray minimizes space requirements, making it easy to fit into an existing housing. It holds up to 96 samples when fully loaded and contains a microprocessor that allows sequential or random sampling. The autosampler is typically interfaced to and controlled by the host instrument computer using a serial, USB, or IEEE-488 parallel communications cable.
-
Product
Straightness Measurement Kit
55283A
-
The Keysight 55283A Straightness Measurement Kit, used with the Keysight 5530 Laser Calibration System, makes straightness, squareness and parallelism measurements to identify geometry errors that seriously degrade machine tool performance. These measurements allow documentation, analysis and diagnosis of machine tool travel and parallel axes of motion.
-
Product
PXI-6528, 48-Channel, 24 Sink/Source Inputs, 24 Sink/Source Outputs, Channel-Channel Isolated, PXI Digital I/O Module
778543-01
Digital I/O
48-Channel, 24 Sink/Source Inputs, 24 Sink/Source Outputs, Channel-Channel Isolated, PXI Digital I/O Module—The PXI‑6528 is an industrial, parallel digital I/O interface. With programmable power-up states, you can configure the initial output states in software to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PXI‑6528 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions. Programmable input filters eliminate glitches/spikes and provide debouncing for digital switches/relays through a software-selectable digital filter.
-
Product
Time-of-Flight SIMS
PHI nanoTOF II
-
PHI’s patented TRIFT mass spectrometer with Parallel Imaging MS/MS provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous high mass peaks identification with parallel tandem MS imaging capability. The PHI nanoTOF II can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements.
-
Product
Stand-Alone Test Fixture
MA 2013/D/H
-
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
-
Product
PCI Three-Axis High Performance Laser Board with External Sampling
N1231B
Laser Board
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
-
Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
-
Product
6U VPX FPGA Cards
-
Curtiss-Wright Defense Solutions
FPGAs have revolutionized the way digital signal processing (DSP) subsystems are configured. With a large number of gates, hardware multipliers, and high-speed serial interfaces, FPGAs enable sophisticated applications, including radar, signal intelligence, and image processing, which rely on repetitive processing that can be expressed in highly parallel form. FPGAs perform exceptionally well in FFTs, pulse compression, filters, and digital up/down converters.
-
Product
Back and Forth Scratching Tester
WGQ-60
-
Shanghai Dean Electrical Co., Ltd
Executive standard: NEMA、JIS; Inspection standard: JB/T4279.15-2008Used to detect the scraping resistance of coating and cable insulation layer of flat wires of 0.800～5.600mm (narrow side) and the silk and enamel covered round wires with nominal conductor diameter of 0.100～5.000mm;Application of SCM control allows for fast operation and strong anti-interference capacity;Sample support table allows for parallel rise and fall, maintaining close contact between the entire plane with sample;Scratching needle is vertical to the paint scraping direction and parallel with sample supporting table;When film is scratched and the action current is ≥5mA, painting scraper would automatically stop scraping;LED would automatically display the number of scraping.
-
Product
Mezzanine System
3560
System
ECM P/N 3560 provides four independent I2C channels. For ease of development a PCA9564 interface IC converts parallel data to I2C serial communication. Additionally an LTC1694 I2C accelerator IC decreases the rise time of the passively pulled up I2C bus allowing for greater capacitive loading or higher bus speeds. Each channel is comprised of SCL, SDA and two Grounds.
-
Product
Fineliner
-
The parallel tester Fineliner enables two-sided contact with fne structures. Withvisual detection of both substrate sides and corresponding adapter position correction≥ 300μm test points can be contacted. The rigid needle adapter with a pitch of ≥ 400μmalso allows a high contact density. This results in a large test depth on the substrate.The integrated DMC reader ensures a correct test result assignment. Multiple PCB canbe tested step by step through in the X-direction of the Fineliner, further eliminatingsubstrate tolerances in the X-direction, and enabling more cost-effective adapters andmeasurement techniques. A quick-release system with identifable replacement kitsensures safe and quick retooling.The measuring technology can be defned customer-specifcally. There are 2040 pyloninterface points per side.
-
Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
-
Product
Force & Strain Measurement
-
Load cells, tank weighing devices, balances, scales, force gauges, torque sensors and strain gauges including diaphragm, dual parallel, linear, rosette, T-rosette, and torsion and shear types.
-
Product
"Stiff Grid" and Parallel Operation AC Generator Excitation Regulator
SVRFP
-
The Kinetics model SVRFP Exciter/Regulator rectifier is designed and rated in capacity and operating parameters for the application of exciting the fields on an AC generator in parallel with other AC generators and the power system is a "stiff system" in relation to loading. A "stiff system" is a generating system that is of sufficient capacity or the generator is "small" in relation to the system grid, that the AC system voltage under impulse/step loading condition does not require forcing of the generator field to maintain the power grid voltage. Systems are designed with a standard unit service factor to operate within the +10% to -20% nominal voltage rating at 100% current rating.
-
Product
High Performance DC/DC Converters
-
The 4:1 Input Voltage 1000 Watt Single FXP DC/DC Full Brick converter is designed to operate in parallel with up to 3 FXP bricks (2800 Watts) with no external circuitry. The FXP series provides a precisely regulated DC output. The output voltage is fully isolated from the input, allowing the output to be positive or negative polarity and with various ground connections.
-
Product
PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
Multiplexer Module
2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
-
Product
Bench Power Supply, Single, Adjustable, 2 Output, 0 V, 32 V, 0 A, 5 A
72-8700A
-
This Bench Power Supply 35V @ 5A max output has a master-slave tracking, constant voltage, constant current function. The main outputs can be connected in parallel or in series. Auto switching between voltage and current operation.
-
Product
TestStation Multi-Site Offline
-
TestStation Multi-Site Offline provides true parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
-
Product
Solder Test Pallet
WaveRIDER® NL 2
-
The wave soldering process is one of the most challenging procedures to set up. The ECD WaveRIDER NL 2 greatly simplifies wave solder set up and ensures perfect repeatability, time after time. Board recipe preheat temperatures, conveyor speed, wave height, contact times and parallelism are all measured and monitored using the WaveRIDER NL 2 process pallet.
-
Product
Resistance & Capacitance Box
RCS Series
-
The RCS-box combines the features and specifications of both the R-box and the C-box in one convenient package. Ideal for setting timers, oscillators, and filters, the resistance and capacitance may be used independently, in series, or in parallel. A shorting link allows them to be coupled or separated.
-
Product
Testing Multi-Radio Mobile Devices
IQxstream
-
With LitePoint's IQxstreamTM mobile test system you will have all the capability you need to fully test many 3G and even 4G cellular radios and standards. Moreover, the system is designed to reduce per-device test time and cost because of its unique parallelism architecture. A 100 MHz capture capability means that it can test adjacent channel leakage ratios (ACLR) in one, five-channel capture.
-
Product
Simultaneous Multi-Surface Test Interferometer
VeriFire MST
-
Simplify the complex – multiple surfaces create complex fringe patterns, the Verifire™ MST uses patented wavelength-shifting technology to acquire phase data from multiple surfaces simultaneously. Report key metrics from individual surfaces of parallel windows, transmitted wavefront, as well as precise surface-to-surface information like total thickness variation (TTV), wedge and even material inhomogeneity.
