-
Product
Programmable DC Electronic Load - (Economical)
63200E Series
-
The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
-
Product
Manual Test Adapters
-
Manual test adapters (MA) from INGUN are available in several series and series, which differ in terms of use, maximum permitted contact force, parallel stroke, size and service life.
-
Product
Wi-Fi / Bluetooth / IoT Tester
MP5000
-
High speed, high throughput tester for mass production, Turn key automation test software, 4 sites in parallel.
-
Product
Content Uniformity >
PrepEngine
-
The PrepEngine was developed through collaborations with leaders in the biotech and pharmaceutical industry to speed up the sample preparation process. The result - a process that is ultra-fast with multiple drives so up to 10 samples can be prepared in parallel.
-
Product
PCI-6528, 48-Channel, 24 Sink/Source Inputs, 24 Sink/Source Outputs, Channel-Channel Isolated, Digital I/O Device
778833-01
Digital I/O Module
The PCI-6528 is an industrial, parallel digital I/O interface.With programmable power-up states, you can configure the initial output states in software, to ensure safe … operation when connected to industrial actuators. If a computer or application fault occurs, the PCI-6528 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions. Programmable input filters eliminate glitches/spikes and provide debouncing for digital switches/relays through a software-selectable digital filter.
-
Product
PXI 32 Chan I/O Parallel I/P Prog Threshold
40-412-111
Digital I/O Module
A 32-channel Digital I/O module with high output voltage and currentcapability and a dual variable threshold input. Each of the 32 channel outputs can be used to drive the output high or low usinga high current capacity drive capable of sourcing 0.4A from the high side or 0.5Asink on the low side for each channel. The module is available in two versions witheither serial or parallel capture of the input levels.
-
Product
Digital Demultiplexers
-
Advanced Science and Novel Technology, Co., Inc.
24:48 digital demultiplexer (DMUX) with SSTL1.5 input and output interfaces.Supports data rates from 1.0Mbps to 2.0Gbps.User-controllable independent internal delays for data and clock signals.1.5V I2C control interface with a user-defined 3-bit chip address.Preset function for synchronization of multiple parallel devices.Full-rate output copy of external high-speed clock input signal.Two pairs of clock divided-by-2 and synchronous clock enable outputs for supporting the tree-type demultiplexation structure.Additional synchronous clock divided-by-4 output.Dual power supply of +3.0V and +1.5V.Industrial temperature range.Low power consumption of 2.1W at 2.0Gbps.Available in custom 256-pin BGA package (13mm x 13mm x 2.5mm).
-
Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
-
Product
Digital Control Step Attenuator
-
Digital control attenuators with TTL parallel control offering fast switching speed and high attenuation accuracy
-
Product
Resister Blackjack
-
Resistor blackjack is like regular blackjack but better! Your goal is to assemble a single resistance from several resistors that is as close to 21k while not being over.Unlike regular blackjack, the resistors can be combined in series and in parallel, giving the game a whole new dimension. Plus, resistors have tolerances so achieving a mathematical 21k doesn't guarantee a win.
-
Product
TRF Manager 9
-
Configuration by using a PC, this is one of the major TRF generator attribute. Instruments have factory settings suitable for common applications and contain the most popular test patterns. But many users want to customize the setup or set the instrument according to specificic application requirements. They also may want to adjust parameters, that cannot be accessed by any other way. That is what TRF Manager 9 (optional software pack) can do. And much more! Pattern generators of the TRF-498 and 598 series use a parallel interface for connection with PC. Basic setup can be realized by using Pattern Manager, free software downloadable from our site. For advanced settings there is available TRF Manager 3 software. For more detailed information see the TRF-498 and TRF-598 section, please.
-
Product
Haze Meter
DRKWGT-2S
-
Shandong Drick Instruments Co., Ltd.
DRKWGT2S transmittance / haze analyzer is a computerized automatic measuring instrument which is designed based on the People's Republic of China national standard GB241080 "transparent plastic light transmittance and haze test methods" and the American Society for testing and materials standard ASTM D100361 (1997) Standard Test Method for Haze and Luminous Transmittance of Transparent Plastice." It could apply to all transparent, translucent parallel plane sampler (plastic plates, sheets, plastic film,sheet glass) of light transmittance, transmission haze and reflectivity test also applies to liquid samples (water, beverage, pharmaceutical, colored liquid, grease) turbidity measurements in defense research and production workers and peasants to have a wide range of applications.
-
Product
Solar Simulator
-
It is the optimum light source for the evaluation of requiring high degree of parallelism close to sunlight. Irradiation area and parallelism are produced according to your request.
-
Product
Software Tool Especially Designed for Production Process Supervision
LEON OP
-
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
-
Product
Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
-
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
-
Product
Tri-Temp Test Handler
JANUS 2800T Tri-Temp Handler
-
SESSCO Janus 2800T Tri-temp Handler is designed to accommodate small to medium size standard and custom IC packages. Supports high parallelism of up to octal sites and is equipped with dual high-speed input tube loaders and dual auto output tube unloaders for higher throughput up to 28K UPH. With over 500+ I/O and 16 temperature zones available, it has plenty enough resources for the most demanding applications. It can be customized for MEMS applications and high-voltage testing. Powered by a cutting-edge 10 ns/step all-integrated controller and modular programming design.
-
Product
Room Temperature Sample Holders
12962A
-
The 12962A sample holder is designed to allow accurate impedance tests of solid materials to be performed at room temperature. The sample holder consists of two parallel electrodes, one of which is fixed in position and the other which can be moved into contact with the sample by adjustment of a micrometer. The sample holder makes use of guard ring and reference techniques in order to improve accuracy by reducing “fringing” effects at the edge of the sample. The standard electrode provided is 20mm diameter.
-
Product
Addon Cards
-
Fit the IM6/Zennium electrochemical workstation to your application. Control external potentiostats, capture additional physical properties or enhance your system to a true parallel impedance analyzer.
-
Product
1MP OV10633 Custom Lens Camera Module
e-CAM1M_CU10630_MOD
-
e-CAM1M_CU10630_MOD is a High Dynamic Range (HDR), Wide Dynamic Range (WDR), custom lens camera module targeted for surveillance and security applications. This HDR camera module based on the OV10633 sensor from OmniVision is e-con’s first Wide Dynamic Range (WDR) camera module that can stream 1280x720p video at 30fps over its 8-bit digital video parallel interface. This 1MP WDR/HDR camera module is compatible with almost all of the popular Application Processor families such as TI OMAP, TI Sitara, NXP/Freescale i.MX, Marvell Xscale, Samsung etc and also compatible with Digital Signal/Media Processors such as TI OMAP35x, TI DaVinci DM37x, DaVinci DM3xx etc. This 1MP WDR/HDR camera module is compatible with almost all of the popular Application Processor families such as TI OMAP, TI Sitara, NXP/Freescale i.MX, Marvell Xscale, Samsung etc and also compatible with Digital Signal/Media Processors such as TI OMAP35x, TI DaVinci DM37x, DaVinci DM3xx etc. The camera module is mounted with an industry-standard S-mount M12P0.5 lens holder allowing our customers to choose a lens of their choice. The camera module is mounted with an industry-standard S-mount M12P0.5 lens holder allowing our customers to choose a lens of their choice.
-
Product
Multiphoton FLIM System
DCS-120 MP
-
*Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software
-
Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
-
Product
Manual Drive Unit
ATE MA350
-
Parallel contact stroke: 20 mm. Contact force max.: 300 N. Component on PCB: 58 mm. Pressure frame unit-opening angle: 66.Weight: 2,60 kg
-
Product
3D Measurement
PSD-Array
-
The PSD array consists of 16 parallel one-dimensional PSD elements on the same chip. By utilizing the triangulation technique the reflection of a laser line or multiple laser spots onto the PSD array will provide information about the contour of the illuminated object. The possibility for simultaneous readout of the 16 elements together with the fast response of each element makes the PSD array suitable for applications like high speed 3D contour measurements and measurements of parallel, moving objects such as cantilevers.
-
Product
Wafer Testing
Trio Vertical
-
SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
-
Product
High Performance DC/DC Converters
-
The 4:1 Input Voltage 1000 Watt Single FXP DC/DC Full Brick converter is designed to operate in parallel with up to 3 FXP bricks (2800 Watts) with no external circuitry. The FXP series provides a precisely regulated DC output. The output voltage is fully isolated from the input, allowing the output to be positive or negative polarity and with various ground connections.
-
Product
Test & Measurement Platform
Konrad System Manager
-
The Konrad System Manager is the central tool for the Konrad test and measurement platform. It combines execution, interactive supervision and documentation of the installed Konrad test modules.- Displays the live status of the module functions in parallel to running test executions- Easy debugging of the switch routes- Control the modules functions- Configure device Alias name for modules- Display alias naming for switching channels- Execute selftest functionality of the modules- Display device information and documentation of the installed modules- Simulate modules
-
Product
Laser Microgage
2D
-
The Microgage 2D laser alignment tool can be adapted to a wide variety of industrial measuring and alignment requirements. Each receiver measures in two axial directions (X & Y) and can be used for checking straightness, flatness, parallelism, squareness, bores, spindles, and other alignment needs.
-
Product
Digital Source Capture Unit
DIO2
Capture Unit
The DIO-II module is a multimode digital source and capture unit. In Low Speed Mode it provides a 20-bit parallel or 24-bit serial I/O capability running at speeds up to 50 MHz. In High Speed Mode, the DIO-II provides a 16-bit parallel I/O capability up to 200 MHz. In both Modes, the Clock is generated by a low jitter PLL source that is capable of generating clocks from 320 kHz up to 1 GHz.
-
Product
1.3 MP Custom Lens NIR Camera Module (Monochrome)
e-CAM10_CU0130_MOD
-
The e-CAM10_CU0130_MOD is a 1.3 MP NIR Camera module (Monochrome) based on the Aptina / ON Semiconductor AR0130CS CMOS image sensor with S-mount lens holder attached to it. The AR0130 is a 1/3” Optical Form factor, Electronic Rolling Shutter CMOS sensor with enhanced sensitivity in the Near Infrared region and superior low light performance. The e-CAM10_CU0130_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM10_CU0130_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
-
Product
Memory Burn-in Tester
B6700 Series
-
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.





























