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Product
Integrated Test Facility
ITF
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The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Product
AMIDA 5000 Tester
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AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Product
Microwave Power Amplifier 1/4 Watt, 10 MHz to 40 GHz
GT-1040A
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The Spanawave/Giga-tronics GT-1040A Microwave Power Amplifier incorporates broadband MMIC-based architecture. These state-of-the-art amplifiers are based on solid-state parallel MMIC design with exceptionally wide bandwidth and high power. The unique circuit topology is highly reliable, with performance that excels where extremes of bandwidth and power are demanded.
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Product
Software Solutions
ZAP MULTIRUN
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The ZAP MULTIRUN allows parallel or sequential execution of the same script on multiple work stations and mobile devices. Using ZAP MULTIRUN test automation teams expedite time to execution multiplied by number of devices per given test runs.
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Product
NTDS I/O Analyzer
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The NTDS I/O Analyzer provides insight and visibility, enabling users to quickly and efficiently analyze timing relationships, message protocols, throughput, and data integrity on all types of NTDS interfaces. It is capable of monitoring any combination of NTDS Parallel Type A, B, C, H and NTDS Serial Type D, E channels as defined in the MIL-STD-1397 revision B and C specifications regardless of NTDS mode. The channels are connected to existing NTDS cabling with NTDS tap boxes and extract ongoing communication. Each word of NTDS information received is time-stamped with a 125 nanosecond resolution clock ensuring highly accurate timing measurements. Data collected is stored locally for analysis and can be transmitted to external equipment enabling remote troubleshooting, event reconstruction, or time-critical feedback on system performance.
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Product
Multi-Parallel Bioreactors
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Small-scale, multi-parallel bioreactors provide more process information for culture comparison in less time. Multiple experiments can assess different clones or cell lines, as well as the effects of pH, temperature, feeding, media, gassing rates and inoculation densities.
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Product
Miniature 8-channel photon counter
id150 SERIES
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Intended for large-volume OEM applications, the id150-1x8 is the only multichannel solid-state single photon detector on the market. It consists of a CMOS silicon chip packaged in a standard TO8-16pin header with a transparent window cap. The chip combines 8 in-line single photon avalanche diodes that can be accessed simultaneously for parallel processing. square in center-to-center A fast active quenching circuit is integrated within each pixel in order to operate each diode in photon counting regime. The chip is mounted on a printed circuit board on top of a single-stage thermoelectric cooler (TEC). A thermistor can be used to measure the temperature of the chip. Only two low power supplies of +5V and -25V are needed for operation in photon counting mode. The fast active quenching circuit leads to a dead time of less than 50ns per channel. An outstanding timing resolution of less than 60ps allows high accuracy measurements.
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Product
Universal Programmers
Uprog
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Uprog is universal device programmers family. It uses LPT parallel port or USB for communication with PC.Graphical interface of Uprog software is very confortable in usage for programming and testing tasks. Uprog programmers have 100% universal programming socket. They allow to put independly on any pin programming voltage (0-30V), power supply (1.8-8V), ground or clock, so this flexibility allow Uprog programmers to handle any device.
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Product
96/48/24-CH Opto-22 Compatible Digital I/O PCI Cards
PCI-7296/7248/7224
Digital I/O Module
ADLINK"s PCI-7296/7248/7224 are high-density parallel digital I/O boards with 96/48/24 I/O channels. The header connectors are fully compatible with industry Opto-22 standard. Thus, PCI-7296/48/24 can utilize the Opto-22 external devices. The PCI-7296/7248/7224 devices emulate mode 0 of the industry standard 8255 programmable peripheral interface (PPI) chips. The PCI-7296/7248/7224 provides 4/2/1 PPI chips respectively. Each PPI offers three 8-bit ports: Port A, Port B and Port C. The Port C is divided into 2 nibble-wide (4-bit) ports. The PCI-7296/7248/7224 devices have programmable timer/counters. One 16-bit counter is available for event counting, while the other 32-bit timer is available for timed interrupt generation. The PCI-7296/7248/7224 devices provide multiple programmable interrupt sources from DIO channels, as well as the output of the timer.
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Product
Power Supply, 100V, 33A, 3300W
N8739A
Power Supply
Keysight basic DC power supplies offer essential features for a tight budget. The Keysight N8739A is a 100V, 33A, 3300W, single output power supply in a small 2U package. It offers flexible AC input options, analog/resistance control of output voltage and current, as well as parallel and series connection of multiple supplies to achieve more output current or voltage respectively.
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Product
Test Adapter
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Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Product
756W to 1512W - Single Output
PF-A Series
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*Low Profile (0.5")*0.95 Power Factor*EN61000-3-2 Compliant*Parallel Operation
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Battery Extra Load Units
BXL Series
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BXL is an extra load unit designed to be used with DV Power’s BLU series battery testers. However, this unit is a universal add-on device. Because of that, it is compatible, as an additional load, with any other discharge/capacity tester in the market.In case when discharge current exceeds the capacity of a single BLU device, BXL can increase the discharge capacity. There are no limitations on the number of extra load units that can be connected in parallel to the main battery tester.A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way. Also, all instruments are in accordance with battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.These units can be used on any type of battery string, such as lead-acid, Li-Ion, Ni-Cd, etc. They test battery strings with voltages in the range of 5,25 – 500 V DC. On the other hand, current up to 250 A can be discharged through the BXL internal structure.The instrument simulates a constant resistance load during the discharge test. Several resistances can be set for different battery nominal voltage levels. This makes BXL extremely flexible in selecting its load capabilities.
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Product
Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Product
2-Port SFP Ethernet Card
ECU-P1524PE
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2-port SFP Ethernet cards supporting HSR/PRP (IEC 62439-3) are specialized NICs designed for zero-delay, high-availability industrial networks. These cards feature dual SFP ports to operate as Dual Attached Nodes (DAN) in HSR ring topologies or parallel PRP networks.
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Product
TRF Manager 9
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Configuration by using a PC, this is one of the major TRF generator attribute. Instruments have factory settings suitable for common applications and contain the most popular test patterns. But many users want to customize the setup or set the instrument according to specificic application requirements. They also may want to adjust parameters, that cannot be accessed by any other way. That is what TRF Manager 9 (optional software pack) can do. And much more! Pattern generators of the TRF-498 and 598 series use a parallel interface for connection with PC. Basic setup can be realized by using Pattern Manager, free software downloadable from our site. For advanced settings there is available TRF Manager 3 software. For more detailed information see the TRF-498 and TRF-598 section, please.
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Product
Switch Mode Power Supplies-Air Cooled
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The MS-Series features constant voltage and current control with easy, quick installation and maintenance. Modular versions easily increase the output by means of series or parallel connection. All models have DC short circuit protection. With forced air-cooled models, the cooling air quantity is controlled in relation to the load reducing contamination and noise levels.
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Product
Confocal FLIM for Macroscopic Objects
DCS-120 Macro
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*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Product
MEMS And Sensor Test Solutions
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Modular design based on standard handlers, high parallelism, ambient to automotive tri-temp handling.
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Product
PCI to PC/104+ Bus Adapter
327/328
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Model 327 and 328 are bus-to-bus adapters that allow operating a PCI board from a PC/104+ card stack. They allow selection of important PC/104+ signals using jumper plugs, thereby avoiding the requirement of using hardwired settings. Model 327 aligns the PCI board parallel to the PC/104+ boards, while model 328 places it perpendicular.
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Product
Modular DC Power Supply
62000B series
DC Power Supply
Chroma's new 62000B series of Modular DC Power Supplies offer many unique features for Burn-in and plating/electrolysis applications. The features include a N+1 redundancy, high power densities, hot-swappable maintenance, remote ON/OFF and programmable control via the CAN bus. The 62000B family offers 5 types of power module with ranging from 1V to 150V, current from 10A to 90A, and offers two mainframe type of six and three position. The six position mainframe can envelop in up to six power modules paralleled operation for 9KW power output. The 62000B can easily parallel up to fourteen mainframe to 120KW with current sharing and CAN bus control for bulk power applications. The Modular DC Power Supplies of 62000B are very cost effective with high power density and low current ripple. These instruments have be designed for burn-in applications such as the LCD panels, DC-DC converters, power inverters, notebook computers, battery chargers and many other types of electronic devices.
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Product
Automatic Vision Measuring Machine
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Sinowon Innovation Metrology Manufacture Ltd.
Moving bridge structure, measured workpiece is fixed;◆ Four-axis CNC fully auto close loop control, auto measurement;◆ “00” grade “JINANQING”marble base and pillar, stable and reliable;◆ Imported open type linear scale, resolution is 0.1um, high accuracy, great stability;◆ Imported P grade linear guide, precision grinding ball screw and AC servo motor, ensure accuracy stability of system position;◆ Imported high definition color industry camera, ensure clear observation and stable measurement requirement;◆ 6.5X continue auto zoom lens, precision auto zoom, only need to make pixel calibration once time;◆ Programmable 5-ring 8-division LED surface illumination, contour parallel LED illumination, can realize 256 grade brightness adjustment intelligently;◆ Equipped with imported touch probe, realize 3D measurement;◆ With proprietary fully auto measuring software iMeasuring 4.2, powerful function, simple operation;◆ Optional laser probe, it can also be customized according to customer request;◆ Optional FexQMS Measuring Data Analysis and Real-time monitoring software which enhance program control and reduce material
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Product
Time History Recording to Throughput Disc
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For the most critical tests time history data can be recorded in parallel with vibration control with no reduction in control performance. The real-time throughput data capture function of the m+p VibControl system allows you to record all selected channels continuously in the time domain on the embedded data server (“throughput to disc”) irrespective of the channel count and the frequency range utilized. This means that you can always access all the original data for analysis purposes.
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Product
Analog Mixed Signal Testers
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- PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Holographic Concave Gratings - Type I
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type I holographic concave gratings are recorded on spherical substrates, with equidistant and parallel grooves.Their geometric optical properties are the same as classically ruled gratings and are interchangeable with them.When used in a spectrograph, Type I holographic concave gratings are traditionally arranged on the Rowland circle (i.e., the circle defined by the grating center and the tangential radius of curvature of the grating).
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Product
Validation Testers
M Series
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The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
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Product
Multiphoton FLIM System
DCS-120 MP
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*Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software
