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Closed-Loop Servohydraulic Test Bench Control System
Closed-loop servohydraulic test bench control system is based on digital devices of ZETSENSOR series with CAN interface. This system has fast response characteristics, high precision, and compact dimensions. The system enables comprehensive control of the servo drive in automated mode in compliance with the set test parameters such as pressure (force), displacement, along with the parallel control of other system parameters such as temperature, pressure, filter plugging, oil pressure, etc.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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FLIM Upgrades for Leica
SP2 / SP5 / SP8
*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Identical Systems for Multiphoton FLIM and Confocal FLIM*Detectors can be Swapped Between RLD Port and X1 Port*Systems are Modular: More FLIM Channels can be Added
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Parallel NTDS Isolation Tap Box
IXI’S NTDS parallel isolation tap box is the ideal solution for relibility tapping NTDS parallel type A, B, C, and H interfaces. It connects easily to existing cables forming a tee connection that can be used for data monitoring and acquisition over long distances without interference with your system.
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3200W to 4080W -Single Output - 3200W To 4080W - Single Output
TPS Series
*400/440/480 VAC (Nom.) 3Ph Delta or Wye*Fully Regulated, Wide Range Adj. Output*Voltage and Current Programming*-40°C (start up) to +70°C operation*>92% Efficiency*PMBus™ Communication*Built-in ORing FET for parallel operation
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Power Supply PowerLab 305d-ii
PowerLab triple Series power supplies are reliable and accurate laboratory equipment with two outputs with adjustable and stabilized DC voltage and regulated (limited) power consumption and additional output has-voltage. Adjustable outputs can work independently, in series (max output voltage 120V DC for model 605-II) or parallel (max current of 10A for models 305-II and 605-II). Power can be used in the design of electronic products, scientific works, laboratories, production lines and in teaching.
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Surface Resistance Meter
WL MIDGET
WL MIDGET Surface Resistance Meter is an ultra-wide range, battery operated, portable instrument for measuring Surface Resistivity and Resistance to Ground of virtually any flat surface conforming to ASTM D-257 standard method by using recommended parallel bar sensing probe. Gives simple, repeatable measurements of conductive, static dissipative, and insulative surfaces. Ranging is automatic due to the use of high-speed OP-AMP Integrated circuits being linear, with changeover points +1/2 decade on a logarithmic scale. Repeatability equals + 5%.
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Interface
RCNIC-A2PAU4
Abaco Systems' RCNIC-A2PAU4 is a high performance 4-lane PCI Express interface for monitoring, generating or analyzing full-bandwidth AFDX/ARINC 664 protocol traffic. Our exclusive pipeline architecture maximizes packet throughput using parallel controllers and efficient DMA transfers, thereby avoiding the bottlenecks of CPU-based interface solutions.
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Confocal FLIM System
DCS-120
*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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PXI Source Measure Unit
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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Measurement Of Straightness, Flatness, Positioning Uncertainty Of Round Tables >
ELCOWIN - Software For 2D-straightness Measurement With Electronic Autocollimators
Optik Elektronik Gerätetechnik GmbH
The software ELCOWIN serves for the measurement of straightness, squareness, parallelism of slides and flatness of precision tables by the autocollimation principle. ELCOWIN can be used in connection with electronic autocollimators of the ELCOMAT series from Moeller-Wedel-Optical.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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PXI Resistor Module Quad 8 Bit
40-291-021
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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SATA (Serial ATA)
Serial ATA (SATA) is a data transfer technology designed to move data to and from storage devices such as disk drives, ATAPI drives, host bus adapters (HBA), and port multipliers. SATA is a serialized enhancement and replacement to parallel IDE. Since SATA ratification in 2003 and its move to 6Gbps in 2008, Teledyne LeCroy has continued to support and innovate with its industry leading protocol analysis and traffic generation capabilities.
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NI-9477, 60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module
779517-01
60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module - The NI‑9477 works with industrial logic levels and signals to connect directly to a wide array of industrial relays, solenoids, and motors. Each channel is compatible with signals from 5 V to 60 V and … features isolation from channel‑to‑earth ground. You can wire the NI‑9477 channels in parallel to sink up to 20 A of current per module (1 A per channel maximum).
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Parallel Active Multifunction Filter
SINAF 3.0
Lifasa - International Capacitors, SA
The active filters offer the best possible solution to solve the problems related to the quality in the electrical network, both in industrial three-phase installations, as commercial or service installations. These problems are caused, not only by the harmonics, but also by the consumption of reactive power (generally of capacitive type).
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Scale / Weight Meter
Equipped with a DC or load cell signal conditioner, this Laureate offers special firmware for scale / weighing applications: two tare functions; count by 1, 2, 5, 10, 20, 50 or 100; auto-zero function; setpoint offset, and dummy right-hand zero for display to 999,990. Built-in excitation for up to four 350-ohm load cells in parallel.
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PCI to PC/104+ Bus Adapter
327/328
Model 327 and 328 are bus-to-bus adapters that allow operating a PCI board from a PC/104+ card stack. They allow selection of important PC/104+ signals using jumper plugs, thereby avoiding the requirement of using hardwired settings. Model 327 aligns the PCI board parallel to the PC/104+ boards, while model 328 places it perpendicular.
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Miniature 8-channel photon counter
id150 SERIES
Intended for large-volume OEM applications, the id150-1x8 is the only multichannel solid-state single photon detector on the market. It consists of a CMOS silicon chip packaged in a standard TO8-16pin header with a transparent window cap. The chip combines 8 in-line single photon avalanche diodes that can be accessed simultaneously for parallel processing. square in center-to-center A fast active quenching circuit is integrated within each pixel in order to operate each diode in photon counting regime. The chip is mounted on a printed circuit board on top of a single-stage thermoelectric cooler (TEC). A thermistor can be used to measure the temperature of the chip. Only two low power supplies of +5V and -25V are needed for operation in photon counting mode. The fast active quenching circuit leads to a dead time of less than 50ns per channel. An outstanding timing resolution of less than 60ps allows high accuracy measurements.
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Integrated Test Facility
ITF
The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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AXIe Logic Analysis & Protocol Test
Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Full Wafer Contact Test System
Fox 1
Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Mission Critical, Fault Tolerant Power Supplies
Series HSF
- Hot-swappable plug-in power supplies.- Designed to be combined in an N+1 fault-tolerant power system.- Front panel voltage adjustment trimmer for adjustment of output voltage.- Built-in forced current sharing and or-ing diodes.- May also be used independently as a multi-output power supply.- Designed to be sustainable - new models are backward compatible with existing racks.- Available in 1U and 3U sizes. Mounts in 19-, 23-, and 24-inch equipment racks.- All models include power factor correction (PFC).- Full service customized DC power distribution systems can match power supply output(s) with your load(s).- I/O connections via 24 pin connector that plugs into rack adapter. External connections are made via rack adapter.- Surface mount technology permits minimum mounting space.- Entire RA 19 racks populated with HSF power supplies can be connected in parallel, parallel-redundant or series.- HSF are CE Marked per per the LVD, EMC and RoHS 2 Directives. See applicable Declaration of Conformity.- Compliant with UL 8750, Standard for LED Equipment,- Watch video of NEBS GR-63-CORE earthquake and office vibration testing.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Digital Demultiplexers
Advanced Science and Novel Technology, Co., Inc.
24:48 digital demultiplexer (DMUX) with SSTL1.5 input and output interfaces.Supports data rates from 1.0Mbps to 2.0Gbps.User-controllable independent internal delays for data and clock signals.1.5V I2C control interface with a user-defined 3-bit chip address.Preset function for synchronization of multiple parallel devices.Full-rate output copy of external high-speed clock input signal.Two pairs of clock divided-by-2 and synchronous clock enable outputs for supporting the tree-type demultiplexation structure.Additional synchronous clock divided-by-4 output.Dual power supply of +3.0V and +1.5V.Industrial temperature range.Low power consumption of 2.1W at 2.0Gbps.Available in custom 256-pin BGA package (13mm x 13mm x 2.5mm).
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Battery Extra Load Units
BXL Series
BXL is an extra load unit designed to be used with DV Power’s BLU series battery testers. However, this unit is a universal add-on device. Because of that, it is compatible, as an additional load, with any other discharge/capacity tester in the market.In case when discharge current exceeds the capacity of a single BLU device, BXL can increase the discharge capacity. There are no limitations on the number of extra load units that can be connected in parallel to the main battery tester.A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way. Also, all instruments are in accordance with battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.These units can be used on any type of battery string, such as lead-acid, Li-Ion, Ni-Cd, etc. They test battery strings with voltages in the range of 5,25 – 500 V DC. On the other hand, current up to 250 A can be discharged through the BXL internal structure.The instrument simulates a constant resistance load during the discharge test. Several resistances can be set for different battery nominal voltage levels. This makes BXL extremely flexible in selecting its load capabilities.
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I²C/SPI Interface Device
The I²C/SPI Interface Device is a master or slave interface for inter-integrated circuit (I²C), or master interface for serial parallel interface (SPI) devices. With plug-and-play USB connectivity, the I²C/SPI Interface Device is a portable solution to communicate with consumer electronics and integrated circuits. The I²C/SPI Interface Device can be physically located more closely to I²C/SPI devices than PCI interfaces, reducing I²C bus length and minimizing noise problems. The I²C/SPI Interface Device supports I²C rates up to 250 kHz and SPI rates up to 50 MHz, and it also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I²C devices or toggling LEDs.
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High Performance Programmable AC Power Supply
IT7600 Series
IT7600series high performance programmable AC power supplies, adopt advanced digital signal processing technology, with frequency up to 10-5000 Hz, built-inall-round power meter and large-screen oscilloscope function. Power up to 54kVA and support master-slave parallel, which can provide high-capacity single-phase or three-phase AC output.
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Three Axis Interferometer
10735A
The Keysight 10735A Three Axis Interferometer is used in multiple axis applications where linear and angular control of the stage is required. It combines in a single package the functionality of an optical bench with multiple beam benders, beam splitters, and three interferometers. The interferometers split an incoming laser beam into three beams to measure linear distance, pitch and yaw, or linear distance, roll and yaw. Three linear measurements provide the basis for calculating two angular measurements. The inherent beam parallelism ensures that there is essentially no cosine error between the three measurements and also ensures angle accuracy for pitch and yaw measurements. Other characteristics include:
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Digital Attenuators
Macom Technology Solutions Holdings Inc.
Digital Step Attenuators (DSA)are offered in up to 6 Bit control with lowest step size of 0.5 dB covering DC to 40 GHz. MACOM's DSAs can be controlled with serial and parallel control allowing for best implementation for our customers. These products exhibit low insertion loss and high attenuation accuracy and are offered both GaAs and Silicon (SOI) processes and are offered in both packaged and bare die form factors.
