Backplane Test
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Backplane Twinax Connectors
We have taken the standard housing configuration of the P1 & P3 mounting dimensions while incorporating true differential pair contacts within the P1 & P3 dimensional constraints. P1 connector housing contains 21 position true differential pair blind mate contacts allowing board designers to carry high density differential pair signals from the LRU via motherboard to daughter-card plug in modules with a single connector P1 type housing.
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Bluetooth RF Test System
FRVS
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
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Configurable Functional Test System
ATS-5000
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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OpenVPX Backplanes
Elma is a leading contributor to the DoD hardware convergence and tri-service commonality initiatives, providing CMOSS / SOSA-aligned technology, backplanes and modules pursuant to the stated goals of those initiatives. As the leader in VITA 46/65 OpenVPX backplane design and manufacturing, our cutting-edge signal integrity analysis informs the designs of our high-speed backplanes, handling critical data at speeds of 12 Gbps and reaching towards 25 Gbps.
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Backplane
Axiomtek offers various kinds of backplanes for industrial computing platforms, including PICMG 1.0 PCI, PICMG 1.0 ISA, PICMG 1.3 full-size, and PICMG 1.3 half-size backplane. Axiomtek's backplane product line provides not only the highest compatibility with power supply unit but also the best choice of slot expansion.
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VME / VME64x Backplanes
Hartmann Electronic is an industry leader in the designing, manufacturing and production of backplane technology, including VME and VME64x. Over the evolution of its near 40 years of existence, VME-bus has become a worldwide standard and is still used in a wide variety of applications across many different markets. Hartmann’s innovation in cost effective design benefits customers in diverse industries including military, transportation, medical imaging, telecom, industrial controls, and aerospace.
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OpenVPX Backplanes - 3U, 6U
OpenVPX provides a versatile, high-speed architecture utilizing the rugged Eurocard form factor. There are backwards-compatibility options with VME/64x with hybrid backplanes.
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CompactPCI Backplanes
Model types include 3U and 6U, 32bit and 64bit, 33 MHz and 66 MHz. We offer several variations including EasyCable, EasyPlug, Low Profile, 32-bit, PICMG 2.16, and the latest CompactPCI Serial.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Modular Functional Testing Platform
OTP2
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Backplanes
As a preferred vendor to the world''''s largest defense and industrial companies, Atrenne's high-speed backplanes are the go-to choice for organizations delivering high performance and reliability in the harshest defense and industrial computing environments. Available in all of the latest form factors, our backplanes are fully customizable to address the requirements of your specific application. Atrenne offers the industry's largest selection of 10 Gbaud Gen-3 VPX backplanes.
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Backplane
VME64/VME64x
VECTOR Electronics and Technology, Inc.
Vector offers a comprehensive range of VMEbus backplanes from 2 to 21 slots. VME J1/J2 and VME64x J1/J2/P0 backplanes per ANSI/VITA 1.1-1997. Monolithic 6U high VME64 and VME64x backplanes are fully RoHS compliant and perform to ANSI/VITA 1.7-2003 (R2009) increased current level for VME (96 pin) and VME64x (160 pin) DIN/IEC connectors.
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6TL10 Table Top Test Base
H71001000
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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VPX Backplanes
Dawn’s VPX backplanes are based on Gen3 VPX, VPX (VITA46), VPX REDI (VITA48), OpenVPX (VITA65) and VITA 68 VPX compliance, available in a wide range of profiles and topologies.
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3U VPX – OpenVPX Backplanes
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. OpenVPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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PXI / PXIe Backplanes
PXI (PCI eXtensions for Instrumentation) is a PC-based bus platform for measurement and automation systems. PXI uses commercial PC-based PCI bus technology while combining rugged CompactPCI modular packaging, as well as key timing and synchronization features. While derived from cPCI, PXI adds the timing and synchronization features, among other things, that were not present in cPCI.
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cPCI Serial Backplanes
CompactPCI Serial is an industrial standard for modular computer systems. It is based on the established PICMG 2.0 CompactPCI standard, which uses the parallel PCI bus for communication among a system's card components. In contrast to this, CompactPCI Serial uses only serial point-to-point connections.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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1 PICMG® CPU, 1 PCI-E® x16,1 PCI-X™, 2 PCI™ Slots Backplane
EBP-5E1
- Segment: 1- Slots:1 PICMG® CPU, 1 PCI-E® x16, 1 PCI-X™, 2 PCI™- Support ATX power supplies- Dimension: 153 mm x 330 mm
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SoC Test Systems
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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PXI Functional Test System
U8989A
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Electrification Testing Solutions
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
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Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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3U VPX Power Backplanes
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. Open VPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
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Standard Test Systems
WaveCore™ Products
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.





























