Backplane Test
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Automotive Test Platform
ETS-800
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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VXS Backplanes
VXS (VME Switched Serial) represents an extension of the VME family according to VITA 41.0. This system is downward-compatible, so that assemblies with VME 96-pin connectors can still be used, while adopting the use of serial signals such as Gigabit Ethernet, PCI Express, Serial RapidI/O, and other fabrics.
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Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Fully-Automated CTIA-Compliant OTA Test System
TS8991
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Scienlab Battery Test System - Cell Level
SL1007A
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Digital Backplanes
MSXB 034
Digital Backplanes provide expansion slots to accommodate compatible digital external boards. Digital Backplanes are passive, and connect all signals in each of the expansion slots in parallel. All expansion slots are identical.
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VME Backplane
VME J1
VECTOR Electronics and Technology, Inc.
Vector offers wide range of VME backplanes from 3 to 21 slots wide in J1 and J2 are 3U backplanes. All VME backplane boards are constructed from FR4 epoxy glass material and are assembled and tested. Press fit connectors are used throughout on all sizes.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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FlexVPX Backplane
FlexVPX provides system designers with the flexibility and performance required for the most demanding applications. The ability to interconnect 2 and 3-slot 3U VPX compliant backplanes allows for custom system configurations using COTS hardware. Backplanes are equipped with PCI Express bridges that ensure fast and high-throughput for point-to-point communication between different elements in the system.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Backplane Connectors
Offering a broad portfolio of backplane connectors that include SOSA aligned optical, COTS plus hard metric, VITA standard and high speed twinax interconnects. Our interconnect solutions address the requirements of mission-critical applications within commercial aerospace, space and defense market segments.
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Backplanes
Backplanes are the heart of all System Platforms. Perfect signal integrity is the key to maximum performance of your boards. Elma engineers know how to take System Platforms to full usability. In this section you will find backplanes for all purposes.
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PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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cPCI Backplanes
CompactPCI bus is compatible, in terms of electrical specification, with the PC world’s PCI bus. The mechanical specifications were adapted to the commonly used Euro-board plug in systems for 19" racks.
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Custom Backplanes
LCR Embedded Systems also provides our customers with backplanes in any established or custom form factor – build-to-spec, build-to-print, or anything in between. Thanks to our high-level design expertise in chassis, enclosures, and integrated systems, we’re able to develop a family of backplanes that can function as part of a comprehensive engineering ecosystem in any form factor or environment, including Terabit speeds.
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Test Fixture, Axial And Radial
16047A
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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VXI Backplanes
VXI is a prime example of the old saying, “if it isn’t broken, don’t fix it.” Since the late 1980’s, VXI has been a trusted standard in the world of testing solutions as a more compact and robust predecessor of the GPIB standard. Arising initially to soothe the need for a more compact and integral open testing standard, VXI is still as necessary and impactful as it was more than 30 years ago.
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Digital Backplanes
MSXB 035
Digital Backplanes allow easy digital input and output expansion for large systems. Backplanes typically are used with Industrial Enclosures, which provide electrical shielding and a provide a compact unit for multiple external boards.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
