-
product
PNA Network Analyzer Family
Choose between three PNA Series to get the right mix of speed, performance and price In R&D, obtain a higher level of measurement integrity that helps you transform deeper understanding into better designs On the production line, attain the throughput and repeatability you need to transform great designs into competitive products Get the ultimate expression of Keysight expertise in linear and nonlinear device characterization
-
product
USB Type-C Interconnects Compliance Test Software
S94USBCB
Use the S94USBCB software to test, debug and characterize your USB Type-C cable and connector designs. The PathWave TAP based test sequencer automates the network analyzer (VNA) for each test and generates a comprehensive HTML report. When run with L8990M switch matrix, it enables 20-ports fully automated test without port re-connection.
-
product
PXI Network Analyzers
M983xA Series
Keysight’s M983xA PXIe vector network analyzer (VNA) combines all your measurements into a single instrument, enabling multisite, multi-DUT, multiport system characterization with faster speeds and greater flexibility.
-
product
LXI Microwave Matrix, 20GHz, Single 3x3, Terminated With Loop-Thru
60-751-133-C
The 60-751-133-C is a single 3x3 20GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
-
product
Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
-
product
nductive Proximity Sensors
Millions of inductive proximity sensors are currently in use in virtually all industries. They detect metal objects without contact, and are characterized by a long service life and extreme ruggedness. With the latest ASIC technology, SICK's sensors offer the ultimate in precision and reliability. SICK can provide the right solution to meet your requirements every time – from cylindrical or rectangular standard sensors with single, double or triple operating distance, to special sensors for explosive zones and harsh environments. Our sensors are the intelligent, reliable route to implementing industry-specific and customized solutions to any task involving automation.
-
product
Optical Clock-Recovery Modules / O-CR
Optical clock-recovery modules are required when a clock signal is not present to trigger the oscilloscope or when it is better to use the embedded clock present in the data stream, such as for 100G Lambda optical signals.Clock-recovery modules are essential for transmitter signal characterization.
-
product
Gas Analysis
FLOW EVO
SmartGAS NDIR sensors offer many advantages for successful gas analysis and are ideal for process control. They are convincing where extreme precision and reliability are required. Various versions can be combined easily, which thus allows complex measurement tasks. All smartGAS sensors are characterized by low detection limits, low drift, a wide temperature range and extremely low operating and maintenance costs.
-
product
Uncooled Microbolometer
384 x 288 FPA
Drawing on its extensive experience in microbolometric detector design, fabrication, and characterization, as well as in detector-to-ROIC (Read-Out Integrated Circuit) monolithic integration, INO is proud to offer its 384 x 288 pixel microbolometer FPA (Focal Plane Array) in short series.
-
product
PNA-X Microwave Network Analyzer
N5247B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
-
product
Environmental Monitors
The tools and techniques designed to observe an environment, characterize its quality, and establish environmental parameters, for the purpose of accurately quantifying the impact an activity has on an environment.
-
product
Arbitrary Waveform Generators
M8100 Series
The M8100 Series arbitrary waveform generators (AWGs) offer a level of versatility that enables you to set up complex real-world signals — whether you need precise signals to characterize the performance of a design or need to stress a device to its limits. From low-observable radar to high-density communications, testing is more realistic with our precision arbitrary waveform generators.
-
product
Flash Diffusivity Analyzers
DLF 2800
The Discovery Laser Flash DLF 2800 is an advanced freestanding instrument for the measurement of thermal diffusivity and specific heat capacity of materials from room temperature to 2800°C. The distinctive design incorporates a proprietary laser, laser optics, detector, and furnace technologies, and along with the unique six-position sample carousel, ensures unprecedented measurement accuracy and sample throughput. With the ability to operate in a variety of atmospheric conditions, including inert gas or under vacuum, the DLF 2800 can characterize a wide variety of materials, including polymers, ceramics, carbons, graphite, composites, glasses, metals, and alloys.
-
product
DisplayPort 2.0 Receiver Test
N5991DP2A
Use the Keysight N5991DP2A DisplayPort 2.0 Receiver Test Software to test, debug and characterize your DisplayPort Sink products maximizing the usage of your test instruments.
-
product
Candlestick Sensor
Advanced Thermal Solutions, Inc.
The Candlestick Sensor is a flexible, robust, base-and-stem design air velocity sensor that measures both temperature and air velocity for characterizing thermal conditions in electronic systems. The Candlestick Sensor is narrow and low profile to minimize the disturbance of the heat flow in the test domain. It features a flexible, plastic-sleeved stem, which facilitates installation and repositioning during the testing process.
-
product
Science-Grade MWIR InSb Camera
FLIR A6700 MWIR
Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6700 MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements. In fact, the camera’s image output can be windowed to increase frame rates to 480 frames per second to accurately characterize even higher speed thermal events, helping ensure critical data doesn’t get missed during testing.
-
product
Frequency Multipliers
The Kuhne electronic Frequency Multipliers can be characterized by a high band width, a very good suppression of fundamental and harmonic waves, a small current consumption and a very compact housing.
-
product
Sample Holder
In combination with the PES measuring system, sample holders from aixACCT Systems are now practically standard for the characterization of piezoelectric materials.
-
product
Teradyne Software Solutions
From design through production, whether developing and debugging code or performing characterization, Teradyne offers an array of seamless solutions that extend beyond our core software to reduce your engineering efforts and speed development.
-
product
Antenna and Component Testing
Alpha Omega Electromagnetics, L.L.C.
We extensively test and characterize our antennas and related RF components to ensure they meet and exceed required performance parameters as well as our customer expectations. Antennas and active and passive RF components are characterized in the lab at AOE and antennas are also fully characterized in anechoic chambers. Passive antennas are characterized for gain, antenna patterns, polarization, etc. and active antennas are additionally fully characterized for EIRP, G/T and Noise Figure.
-
product
kSA RateRat Pro
kSA RateRat Pro is a compact, convenient and easy-to-use optical metrology tool for thin-film characterization. Its unique capability is to measure, in situ and in real-time, optical constants (n and k), deposition rate and film thickness.
-
product
Network Infrastructure Testing
Xena VulcanBay
Xena Networks’ VulcanBay is a scalable Gigabit TCP test chassis that offers extreme performance for stateful traffic load testing, analysis and characterizing of Ethernet equipment and network infrastructure. It supports 1/2.5/5/10/25/40GE interfaces and can be used for simulating millions of real-world end-user environments to test and validate infrastructure, a single device, or an entire system.
-
product
Variable Angle Spectroscopic Ellipsometer
VUV-VASE
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
-
product
Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
product
Laser Source
TW3109
Techwin(China) Industry Co., Ltd
can provide 1 to 4 output wavelengths to meet specific requirements, including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber, as well as other wavelengths according to customer needs. Together with the TW3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
-
product
Test Data Investment Services
PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development
-
product
Rheometer longitudinal
DT-600
Characterizes visco-elastic longitudinal properties of Newtonian and non-Newtonian liquids of any composition.
-
product
PXI/PXIe MIL-STD-1553 Multiplexer, Single 16-Channel, 2-Pole
42-739-001
The modules are ideal for the testing of multiple devices that use a serial communication interface, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance. The module uses long lifetime electromechanical relays characterized for use in communications systems.
-
product
Bluetooth Measurement Interface
BTC-4148
The Portland Tool & Die BTC-4148 is a complete interface for measuring and characterizing Bluetooth audio devices including handsets, headsets, speakers, car kits and other devices with Bluetooth audio input or output.
-
product
Refractive Index Profiler
S14
The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
