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Product
Solar Array Simulator
G5.SAS
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The G5.SAS series are unidirectional sources. It was developed specifically for testing inverters and simulating solar arrays and is suitable for use in laboratories and on test benches. The modular and finely graded G5.SAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies feature especially low capacitance values in the output filter stage and switchable earth leakage resistors for adaptation to the insulation measurement of the DUT.
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Product
Bus Analyzer, Exerciser, Emulator, and Programmer
CAS-1000-I2C/E
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While the I²C interface seems simple on the surface, this straightforward architecture is not immune to intermittent glitches, device misbehaviors, and protocol violations. Likewise, tracking down these errors can be tedious business if the right tool is not utilized.The CAS-1000-I2C/E bus analyzer is an exceptional tool for pinpointing I2c irregularities. The ability to spot complex problems and identify invisible obstacles make it the preferred I²C development solution. Advanced logging, debugging, emulation, and verification capabilities offer power and versatility, yet the Windows-based user interface makes the most complex features simple to use.The CAS-1000-I2C/E succeeds where simple monitoring and interactive I/O tools fall short—a complete solution to monitoring, emulating, stressing, and characterizing I²C and SMBus interfaces.
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Product
Total Flux Measurement Systems
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LED’s and Luminaires must be characterized and tested for brightness and color, for production quality control and also for R&D. The Gamma Scientific Total Flux Measurement System combines our accurate Radoma Spectrometer and an integrating sphere for total flux (total power) and color measurements of LED, micro LED and Luminaires. Measurement parameters include spectrum, lumens, total power, peak and dominant wavelength, CRI, CCT, FWHM and other optical properties.
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Product
Light Analysis
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Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic photodiodes (uncalibrated and calibrated), photodetectors (biased, amplified, and avalanche), CCD and CMOS arrays, position detectors, integrating spheres, and photomultiplier tubes. The Beam Characterization category contains beam profilers (camera and scanning slit), a wavefront sensor, spectrometers, and interferometers, while the Polarimetery link leads to a selection of instruments used to measure and control the polarization of light.
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Product
CMP Tester
CP-6
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The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Product
FMC Loopback Test Board
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The FMC loopback tester board enables developers and assembly factories to test and characterize the FMC carrier board interfaces. The board features full differential loopbacks on all the FMC high pin count (HPC) connector interfaces including LA, HA, HB, DP and CLK. It also provides a 125MHz transceiver LVDS reference clocks on GBTCLK signals. The FMC loopback board is based on VITA 57 standard with ruggedized conduction or air cooling.
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Product
System Instruments
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bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Product
NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
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The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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Product
Streak Camera
OptoScope SC-20 systems
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The SC-20 streak camera system is characterized by its large detection area of 35 mm x 4 mm and a large usable screen diagonal of 40 mm. Signals are mapped onto the fiber optic input window and measured without the need for optical reduction. In the simplest case, the entrance optics consists of a slit mask that lies directly on the entrance window. In addition, a flexible extension with a shutter, a lens mount or an adjustable slot with coupling optics is possible. The time resolution in the sub-nanosecond range qualifies the camera for many applications in detonics and plasma physics.
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Product
High Voltage 50 Ω Pulse Generator
TLP-12010A
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High Power Pulse Instruments GmbH
The high-current TLP/HMM test system TLP-12010A offers advanced features intended for the characterization of semiconductor devices, discrete components, such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain. It includes high current I-V characteristics inpulsed operation mode, turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects e.g. reverse recovery, Safe-Operating-Area (SOA) and ESD measurements in general.
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Product
Functional Test
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Products and systems used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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Product
PCI Express 5 CEM Receiver Test Automation
N5991PC5A
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The N5991PC5A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 5.0 CEM Add-In Cards and systems.
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Product
PXI Microwave Switch Modules
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Pickering's PXI Microwave Switch Modules vary from simple multiplexer and switch configurations to integrated matrices and large multiplexers. Most products are characterized for 50 operation however certain 75 versions are supplied either as standard or custom products. Remote versions occupy a single PXI slot with the microwave switches mounted separately from the host chassis, connection to the module is via a supplied control cable.
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Product
Analog/Linear Tester
Amoeba 4200
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4200 is capable of running multiple test sites independently with a parallel efficiency of up to 85% for quad-site and octal-site testing.It comes with test development and production software suite, which makes the transition from test development and bench characterization to production seamlessly.
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Product
Temp Characterized CalPod, 20 GHz
85531B
Electronic Calibration Module
CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button and without removing the DUT or re-connecting standards. Very useful in thermal chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the thermal testing to perform a normal re-calibration.
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Product
Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
784777-02
Signal Module
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
Controlled Impedance Analyzers
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HYPERLABS Controlled Impedance Analyzers can be used with various probes and adapters to quickly and reliably characterize impedance on PCB test coupons. These Test Systems are designed to comply with IPC-2141A standards for PCB coupon testing, and can be customized to meet specific customer needs.
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Product
Digital Pattern Generators
DPG
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Active Technologies Digital Pattern Generators also known as DPG, allow digital stimuli generation to stimulate digital designs, providing the capability to emulate standard serial or parallel bus transactions or custom digital interfaces, for system or device debugging and characterization.
