Static and dynamic analysis

Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.

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Topics

Static Analysis
Analysis
Automatic Test Systems
System Test
Test Development
Test Systems
MEMS
Test
Development
Metrology