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Product
Cryogenic Probe Station
FWPX
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Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.
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Product
CIELab Color Sensor
PR0128
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The CIELab Color Sensor PR0128 is a color detection system with integrated high power light source, for determining the surface color. It is characterized by the identification of the smallest color nuances and the highest long-term stability. Here, up to 63 completely different products in different colors can be independently controlled and tested without changing parameters or gain levels.
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Product
2-MGEM Optical Anisotropy Factor Measurement System
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The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Product
NTA Particle Size Analyzers
NanoSight Range
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The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.
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Product
Surface Plasmon Resonance Analysis
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Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Product
Fibolocator
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Fibolocator is an innovative device for measuring and characterizing breaks and other backscattering-causing faults in optical fibers. Time-resolved correlation reflectometry is the principle on which the device is based. It analyzes the backscattered light like a pulse OTDR, but unlike such OTDRs, cw laser diodes are used. The requirements for the test signal and the complexity of the system are low, which leads to very low costs for OEM subsystems.
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Product
Static Image Analysis System Particle Size
PSA300
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The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Product
Connected Meteorology
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"Epi to Etch" - get full control of your frontend processes! The LayTec Connected Metrology® ecosystem enables improved process control characterizing complex layer stacks along the manufacturing chain. In a typical frontend production line, wafers are measured 3 or more times by LayTec products.
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Product
Laser Test Systems
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Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers.
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Product
Modulation Distortion Up To 53 GHz
S95070B
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S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Product
LXI Microwave Matrix, 20GHz, Single 4x4, Terminated With Loop-Thru
60-751-144-C
Matrix Switch Module
The 60-751-144-C is a single 4x4 20GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Probe Card
VC20E Series
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The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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Product
InfiniiVision Oscilloscopes
2000 X-Series
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70 MHz to 200 MHz See more signal detail with 50,000 wfms/s update rateView time-correlated digital content with 8 digital channels (MSO)Modulate signals within the scope with WaveGen, built-in 20 MHz function generator (optional)Quickly characterize signals with the built-in 3-digit voltmeter and 5-digit counter option Decode serial busses faster with hardware-based serial analysis options for CAN, LIN, I2C, SPI and RS232/422/485/UART Protect your investment with full upgradability
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Product
MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Product
Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
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The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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Product
Display Test & Characterization Solutions
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The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.
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Product
Modulation Distortion Up To 8.5 GHz
S930700B
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S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Multiple Angle Laser Ellipsometer
PH-LE
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The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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Product
Battery Analyzers
BA6010 Series
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The BA6010 Series battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. The BA6010 Series is suitable for characterizing battery chemistries that are responsive to a 1 kHz AC stimulus signal including lead acid, lithium and alkaline type batteries used in consumer products, electric vehicles, power backup, security, and fire alarm systems.
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Product
Oscilloscopes
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Berkeley Nucleonics Corporation
Is a type of electronic test instrument that graphically displays varying voltages of one or more signals as a function of time. Their main purpose is capturing information on electrical signals for debugging, analysis, or characterization.
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Product
Resistance Calibration
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Process Instruments maintains fractional part-per-million accuracy with a state of the art resistance calibration facility. Specialized services include precision resistor manufacture, resistor and shunt repair, characterization of alpha and beta temperature coefficients and the determination of barometric effects on resistance values.
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Product
NFC and EMVCo Conformance and Design Validation Solution
Micropross MP500 TCL3
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The MP500 TCL3 Generator/Analyzer is a high-performance test solution for designing and characterizing NFC devices. Built specifically for the laboratory environment, the MP500 TCL3 offers advanced signal generation features for unmatched flexibility. It supports the following standards:
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Product
Off-Air Testing Products
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Understanding the challenges of the Electromagnetic Spectrum is paramount for Engineers that are charged with the design, characterization, validation of modern RF systems such as Communications Systems, RADAR Systems, and Electronic Warfare Systems.
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Product
Soft Front Panel for NI RF Analyzers
NI RFSA Soft Front Panel
Analyzer
The NI RFSA Soft Front Panel helps you quickly view and analyze RF signals using PXI hardware from National Instruments. The soft front panel features built-in measurements such as third-order intercept (TOI), complementary cumulative distribution function (CCDF), adjacent channel power ratio (ACPR), occupied bandwidth (OBW), channel power, and transmit power. With these one-button measurements, you can quickly measure, display, and store results, which makes NI PXI instruments ideal for characterization and validation environments. You can also use the NI RFSG Soft Front Panel for generating continuous waveform (CW) or modulated RF signals.
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Product
IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
Mainframe
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Analyzer
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Product
PXIe-4135, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-01
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
783126-02
Signal Module
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
Software
Electrochemistry Tests
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Materials Development Corporation
CyclicVoltammetry and Galvanostatic Charging are tests used throughout the industrial and scientific communities to study chemical reactions and behavior of electronic structures. They are extremely helpful in the monitoring of nano based dielectrics, used in super /ultra capacitors or self-assembled monolayers (SAMs). The Cyclic Voltammetry test applies a ramping voltage to a device and measures the resulting current. In acapacitor-like structure the current reveals loss in the dielectric as well as degradation over time. CyclicVoltammetry is used to characterize the performance of supercapacitors and ultracapacitors formed using various nano-technologies. It is also useful in the studies of self-assembled monolayers used for sensors.
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Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
Source Measure Unit
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
