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Product
Active Device Characterization Solution Up To 67 GHz
N5247BM
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The N5247BM provides the N5247B 67 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 67 GHz.
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Product
ENA Vector Network Analyzer
E5072A
Vector Network Analyzer
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Digital Instruments
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Digital Instruments generate and acquire high-speed digital waveforms for transmitting data, communicating with devices under test, or testing digital interfaces. These instruments are ideal for semiconductor characterization and production, interfacing to LVDS and TTL digital electronics, and testing the functionality of high-speed serial links.
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Product
Chromatography Detectors
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Brookhaven Instruments Corporation
Detailed size or molar mass distribution information is useful in many areas such as investigating protein aggregation and understanding (or predicting) polymer properties. Since chromatography fractionates a sample before analysis, it is an ideal tool for characterizing these distributions.
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Product
Oil Testers
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PeakTech Prüf- und Messtechnik GmbH
This device was developed for the quick and reliable testing of frying oils in the catering trade, commercial kitchens and also for private users. With the device settings it is possible to display the oil temperature of the deep fryer. By measuring the TPM value (Total Polar Materials) the content of polar substances can be determined, which is a reliable parameter to characterize the extent of aging of the frying oil / frying fat during frying.
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Product
Display Measurement Systems
DTS Series
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Instrument Systems Optische Messtechnik GmbH
Characterization of emissive, transmissive, reflective, and transflective displaysViewing-angle-dependent analysis of illuminance, contrast, color, and derived parametersDetermination of the electro-optical transfer function: analysis of luminance, contrast, and color depending on electrical driving conditionsMeasurement of transient properties, such as switching times, flicker, and modulation
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Product
In-Process Test OTDR
8000i
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The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
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Product
CG-MALS
Calypso II
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Label-free, immobilization-free characterization of protein-protein and other macromolecular interactions with composition-gradient multi-angle light scattering.
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Product
Continuous Time Interval Analyzer - PXI
GT668PXI-40
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A true breakthrough in high-speed Time Measurement and test technology, GuideTech’s GT668PXI-40 leverages the power of its CTIA continuous time-stamping technology, eliminating the need for supplemental triggers, pattern markers or clock recovery circuits.GuideTech’s CTIAs enables serial interfaces pattern verification and full jitter analysis in milliseconds for fast, automated characterization and high-throughput production test on all ATE platforms, including low-cost and in-house testers.GT668PXI-40 cards can be expanded up to 36 Channels Single Ended Input in a single 3U PXI chassis.
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Product
DDR5 Receiver Conformance and Characterization Test Application
M80885RCA
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DDR5 Receiver Conformance and Characterization Test Application.
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Product
ENA Vector Network Analyzer
E5080B
Vector Network Analyzer
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 53 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
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Product
Optical Return Loss (ORL) Meter
OPTOWARE-S300 (FOTS-ORL Meter Systyem)
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The Optical Return Loss(ORL) Meter is an efficient system for the characterization and test of optical components and systems to be performed in high quality.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-03
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
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GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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Product
IP QAM
SFT3332 (-D)
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Hangzhou Softel Optic Co., Ltd.
SFT3332 (-D) IP QAM modulator is Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 32 multiplexing channels, 32 scrambling channels and 32 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 32 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is characterized with dual RF output ports which broaden the bandwidth for QAM carriers.
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Product
WiGig RF Tester
IQgig-RF Model B
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When used in conjunction with IQgig-IF, an optimized test solution for conducted testing of WiGig chipsets and baseband modules, the IQgig family products provide a total test solution for R&D characterization and high volume manufacturing.
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Product
LabVIEW Programming Service
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DMC has successfully employed LabVIEW in many industries, including product development, R&D, high-tech manufacturing, and test engineering. Following are a few relevent examples: Laboratory Automation; Carbon Monoxide Detector Testing, Strobe Light Testing, Multi-Station Permeability Test Stand, Hydraulic Fluid Tribology Testing. Manufacturing Automation; Engine Cold-Test Characterization, Smart Battery Pack Manufacturing Test, Automotive Sensor Testing.
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Product
Streak Camera
OptoScope SC-20 systems
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The SC-20 streak camera system is characterized by its large detection area of 35 mm x 4 mm and a large usable screen diagonal of 40 mm. Signals are mapped onto the fiber optic input window and measured without the need for optical reduction. In the simplest case, the entrance optics consists of a slit mask that lies directly on the entrance window. In addition, a flexible extension with a shutter, a lens mount or an adjustable slot with coupling optics is possible. The time resolution in the sub-nanosecond range qualifies the camera for many applications in detonics and plasma physics.
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Product
Image Sensor Characterization Systems
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Image Sensor QE and Spectral Responsivity Characterization
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Product
OTDR
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OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
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Product
Temperature Test
Series T
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The temperature test are characterized by high rates of temperature change, ease of programmability through our color touch panel, as well as extremely low noise levels
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Product
Scienlab Battery Test System – Cell Level
SL113XA | SL100XA Series
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The cell is the basis of any battery system and directly influences its function, performance and safety. Therefore, it is essential to test and characterize the cell at an early development stage. For this purpose, Keysight offers reliable test systems for precise and reproducible measurement results. The Cell Level Series (SL1002A, SL1004A, SL1007A, SL1132A and SL1133A) — also known as Battery Cell Tester — emulates sink and source for battery cells for automotive and industrial applications.
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Product
Ultrastable Lasers
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Menlo Systems offers ultrastable, frequency stabilized lasers at basically any wavelength. We supply fully characterized systems with linewidths <1Hz and Allan deviations of 2 x 10-15 (in 1 s) as well as modules and components allowing for state-of-the-art systems tailored to customers' needs.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
Source Measure Unit
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Thermal Analysis
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The TORC (Thermo-optical Oscillating Refraction Characterization) technique applies decades of know-how in optical instrumentation to thermal analysis in a novel and unique way. The technique requires minimal sample preparation at maximal tolerance for sample properties. You can determine the coefficient of thermal expansion, glass and phase transitions as well as polymerization for various samples: liquids, gels, pastes, and certain solids. For example: cured and uncured resins, adhesives, glues, etc. can easily be characterized. Both thermal and time-dependent processes can be monitored with minimal effort.
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Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-01
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
OTDR
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Wuhan Sunma Technology Co., Ltd.
OTDR, short for optical time-domain reflectometer, is an optoelectronic instrument used to characterize an optical fiber. It can offer you an overview of the whole system you test and can be used for estimating the fiber length and overall attenuation, including splice and mated-connector losses. It can also be used to locate faults, such as breaks, and to measure optical return loss.
