-
Product
NanoSpectralyzer
NS MiniTracer
-
The NS MiniTracer is the latest addition to the innovative line of NanoSpectralyzer instruments from Applied NanoFluorescence, LLC. Its design is optimized for fast, easy, and highly sensitive analytical measurements on a variety of samples containing single-walled carbon nanotubes. The MiniTracer is ideal for quantitating SWCNTs in environmental and biological specimens and is also perfect for routine sample characterization in any SWCNT research lab.
-
Product
Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
-
The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
-
Product
PXI Electronic Load Module
Load Module
PXI Electronic Load Module provides the electronic load capabilities of sinking DC power with high-accuracy measurements in a compact form factor optimized for design validation, characterization, and production test.
-
Product
Metrology
-
KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
-
Product
BGA Sockets
-
Ironwood has the most comprehensive collection of BGA (Ball Grid Array) sockets that can be used for prototype application, silicon validation, system development, thermal characterization, burn-in application, functional production test, etc. BGA socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. BGA sockets for prototype applications, silicon validations, system development applications uses low cost elastomer contact technology.
-
Product
PathWave BenchVue Advanced Power Control And Analysis
BV9201B
-
The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
-
Product
Science-Grade MWIR InSb Camera
FLIR A6700 MWIR
-
Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6700 MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements. In fact, the camera’s image output can be windowed to increase frame rates to 480 frames per second to accurately characterize even higher speed thermal events, helping ensure critical data doesn’t get missed during testing.
-
Product
Multi Channel Optical Fibre Verification
-
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
-
Product
Test Services
-
D-Coax offers RF/Microwave test services for your researchprojects, as well as, production quantities tests. We have available resources and expertise in the high frequency interconnects testing that will benefit your research and products. We will work with you to make your requested tests the most accurate and reliable and we'll complete them in a timely fashion. The following parameters can be characterized or tested to specifications with our test services: Time Domain: Impedance, Impedance profile, rise time, propagation delay, skew and more. Frequency Domain: S21 - Insertion loss, S11- Return loss, S12 - Reverse Insertion loss (port 2 insertion loss), S22 - Reverse Return loss (port 2 return loss) and more.
-
Product
Cell Isolation & Analysis
-
Life's complexity originates in cells, spanning cellular structure, genetic diversity, gene expression, and complex tissue formation. Serving as the fundamental unit, cells form the foundation of all biology. Characterization of cells, their processes and interactions can provide insights into areas like medicine, symbiosis, and biological diversity. Bio-Rad supports these inquiries, offering innovative technologies for your cell biology research.
-
Product
Network Analyzer Software
-
Network analyzer software tools enable you to investigate, characterize, and troubleshoot your designs in a variety of measurement applications. Software applications are available for PNA-X, PNA-L, PNA and ENA series network analyzers.
-
Product
ATCA 5U 7 Slot replicated Mesh 40G
109ATCA507-3003R
-
The 5U 7 slot ATCA backplane is a replicated Mesh with dual shelf managers, designed to meet 40Gbps (4 x 10G ports) data rates. Elma's ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
-
Product
Test Cell System
qCf FC25/100
-
The quickCONNECTfixture with an active fuel cell area of 25 cm 2 has been an integral part of our product portfolio since 2006. The excellent properties and the patented design of the cellFixture offer enormous advantages in the characterization of cell-internal components for fuel cells and electrolysis.
-
Product
PXI-5651, 3.3 GHz RF Signal Generator
779670-01
Signal Generator
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
-
Product
STDF Test Data Analysis Tool
DataView
-
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
-
Product
Static and dynamic analysis
MEMS
-
Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
-
Product
ATCA 5U 14 Slot Mesh w uTCA connector for SHMM
1900001778-0000R
-
The 14-slot mesh backplanes have standard 1X full mesh topologies. Elma Electronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
-
Product
Capillary Rheometers
-
Plastics are amazing materials with the unique ability to flow when heated to relatively low temperatures. They can be formed into a wide variety of shapes and tailored for many different applications. However, their flow properties during this process are complex and affected by many parameters. Instron® provides comprehensive and effective testing solutions in plastics applications and industries through the CEAST SmartRHEO Series. This capillary rheometer simulates the process conditions, measuring the plastic materials flow behavior that characterizes the rheology of materials.
-
Product
Software
Srive-Level Capacitance Profiling (DLCP) Measurement
-
Materials Development Corporation
Drive-levelcapacitance profiling is an extremely useful technique to characterize amorphoussilicon or other semiconductor material with large concentrations of deep band gap states.
-
Product
Dual Blackbody Wide FOV
-
Dual blackbody, all reflective background IR target projector is used to characterize WFOV IR sensor systems. It features a broadband, 3 to 14 micron range, reflective IR target technology for the most accurate and stable differential targets, controlled background radiance, a 5º FOV with 36º uniform background.
-
Product
Device Characterization
-
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
-
Product
Broadband VNA Operation To 220 GHz
S93301B
-
Configure a 220 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs
-
Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
-
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
-
Product
MXG X-Series RF Vector Signal Generator, 9 kHz to 6 GHz
N5182B
Vector Signal Generator
Take your designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading ACPR & output powerTest wideband devices with factory-equalized 160 MHz RF bandwidthReduce the time spent on signal creation with Signal Studio software, including LTE, WLAN & GNSSLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
-
Product
QE System
PVE300
-
The PVE300 system is a monolithic,turnkey solution for photovoltaic material and device characterization;a key component in research, or as part of a production-line quality process.
-
Product
M2 & BPP Systems
-
The M2 factor wil define the beam propagation characteristics compared to ideal Gaussian beam propagation. According to ISO Standard 11146 rightfully offers the laser beam characterization as "M2 times diffraction limited beam", as such, a perfect beam will have an M2 of 1. 1 will be the best achievable value and no beam could have an M2 less than 1. Our conceptual design is based on sub-assemblies allowing to change the sensing head in the M2 device, offering multiple wavelengths heads up to 2.7 microns from deep UV (knife-edge technology) and camera based technology with built-in automatic filter wheel for adjustment. For focused beams, the same measuring head could be attached to a device for meauring highly divergent or highly convergent beams - FocusGage-BA, wherein the Laser Analyzing Electronic Autocollimator offers the capability of divergence measurement with Coming Soon M2 definition. M2Beam is the cornerstone of those measuring devices.
-
Product
Mux-scrambling Modulator 8 Ch
SFT3394C
-
Hangzhou Softel Optic Co., Ltd.
SFT3394C is a high performance and cost-effective QAM modulator designed by Softel. It has 16 DVB-S/S2 FTA tuner input to 16 non-adjacent carrier output with multiplexing, scrambling and QAM modulating included. It also supports maximum 512 IP input port and one IP (MPTS) output through GE1 and TS input for re-mux through 2 ASI ports. SFT3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation CATV broadcasting system.
-
Product
Nanomechanical Test System
Hysitron TI Premier
-
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
-
Product
PXIe-4135, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-01
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
-
Product
Cryogenic Probe Station
FWPX
-
Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.
