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Software
Solar Cells/ Photovoltaic Devices
Materials Development Corporation
MDC offers a comprehensive array of current-voltage, capacitance-voltage, and resistivity measurements to characterize solar cells and PV devices. CSM/Win systems and software can help to fine tune your process for maximum efficiency. Critical values such as series and shunt resistances, maximum power point (both actual and theoretical), and fill factor are automatically determined.
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Specialty Instruments
Advanced Thermal Solutions, Inc.
ATS offers a variety of unique specialty instruments, designed for specific applications across the electronics industry. These instruments range from providing heat flux measurements and cold plate characterization, to precise isothermal surface temperature control and fan flow characterization.
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Differential Scanning Calorimeter
DSC-60 Plus Series
DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
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Four Slot PXI/PXIe Full Hybrid ABex Chassis with up to PXIe x4 Connectivity on Each Slot
ABex PXIe Rack 04
Ultra-Compact 2U ABex chassis with 4 slots. This variant is characterized by outstanding compactness and due to the directly integrated PXIe full hybrid backplane one achieves maximum performance at an attractive price. The first slot is reserved for a single slot PXIe controller. Either Konrad PXIe embedded controllers or MXI interfaces are supported.
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PXIe-6571, 1-Slot, 100 MVector/s PXI Digital Pattern Instrument
786320-01
1-Slot, 100 MVector/s PXI Digital Pattern Instrument - The PXIe‑6571 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. It also includes debugging tools … like Shmoo, digital scope, and viewers for history RAM, pin states, and system status. The PXIe-6571 requires a chassis with 82 W slot cooling capacity, such as the PXIe-1095.
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PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-01
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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PNA-X Microwave Network Analyzer, 43.5 GHz
N5244B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Optical Spectrum Analyzer Module
OSAPXIe
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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CMP Tester
CP-6
The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Optical Spectrum Analyzers
FTBx-5245/5255
Robust In-service Pol-Mux OSNR for 100G/200G/400G (FTBx-5255). Industry’s only all-in-one OSA covering all applications: high speed (100G+ In-service OSNR, etc.), CWDM, O and L-band testing, etc.Portable solution for spectral characterization of DWDM/CWDM networks. Industry’s smallest OSA/transport solution in a single platform (FTB-4 Pro). Pol-Mux OSNR option compliant with IEC 61282-12 standard.
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Fluxgate 150A Current Sensor
LF03
Our LF03 current sensor works with the dynamic Fluxgate measurement technology. It is characterized by its simple, practical design and prevents high temperature drifts. Fluxgate technology uses the phenomenon of magnetic saturation to modulate the measured magnetic field and convert it into an electric field.
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Component Test Stands
As your specialist for measurement and testing technology, imc designs and manufactures test stands perfectly matching requirements for a complete range of components: whether for servomotors, pumps, brakes or valves – according to your wishes, imc component test stands can quickly and precisely test for perfect operation, verify lifetime, determine energy efficiency, and much more. Thanks to the modern software imc STUDIO, test objects can be tested for complex and wide-ranging scenarios.Test stand solutions from imc are characterized by their flexibility, short set-up times and productive test processes.As a manufacturer of measurement and test technology, it is second nature to us that imc test stands deliver reproducible and verifiable results and ensure productive test processes. Furthermore, we place enormous value not only on first-class technical features for imc test stands, but also on meeting the economic demands of our customers.
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MPI Automated Probe Systems
MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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SSD
M.2 SSD (iSLC)
Innodisk M.2 (S42) 3IE4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Displacement and Encoders
INCREMENTAL digital Transducers are mainly designed for displacement measurement in machine tools and other industrial applications. The sensors are characterized by high precision and are absolutely dust and waterproof. The used materials permit applications in heavy industrial environments.DISPLACEMENT Transducers are suitable for measurements of small distances up to 50mm. They are characterized by high accuracy and repeatability, reliability and fast response. Digital ENCODERS operate on optical or magnetical principal and are offered with incremental or absolute coded outputs. They are suitable for precision industrial applications.
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Pulsed and CW lasers, 375 – 1700 nm, 1 kHz measurement rate
871 Series
The 871 Laser Wavelength Meter from Bristol Instruments is the best way to measure the absolute wavelength of both pulsed and CW lasers and OPOs. By combining proven Fizeau etalon technology with automatic calibration, the reliable accuracy needed for the most meaningful experimental results is ensured. What’s more, a sustained measurement rate of 1 kHz enables the wavelength characterization of every single pulse for most lasers. And, the resulting time resolution of 1 ms provides the most detailed analysis of tunable lasers.
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Supercontinuum White Light Lasers
SuperK series
The SuperK series is an industry-leading range of turn-key supercontinuum white light lasers used by the most innovative companies within bio-imaging, semiconductor inspection, sorting, device characterization, and scientific instrumentation. The sources are robust and reliable, built for intensive use, and can replace multiple single-line lasers as well as broadband sources like ASE sources, SLEDs and lamps.
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Acoustic Microscope
AMI D9650
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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PCI Express 4 U.2 Receiver Test Automation
N5991PU4A
The N5991PU4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express U.2 devices and hosts at 8 GT/s.
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Hyphenated Technology
Evolved Gas Analysis (EGA) solutions couple two or more analytical technologies to greatly increase the power of analyses and save precious time by acquiring more information from a single run, creating a powerful and easy-to-use platform for materials characterization. EGA Hyphenation is a powerful tool in the analysis and identification of complex mixtures, both known and unknown, including identifying harmful chemicals in soil, quantitating components in polymers, determining leachables that may contaminate a product's packaging, identifying phthalates in PVC samples and more.
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Optical Light Source
CARY-LS300B
The CARY-LS300B optical light source provide 1310/1490/1550 nm three outputwavelengths to meet specific application requirements. It is a idea solution for the fiberoptic network characterization, out-door network construction inspection and lab application.
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Adhesion Tester
Surf-2
Rtec Adhesion Tester is a turn key solution to measure Pull up Adhesion force, Work of Adhesion and Shear Adhesion of materials. Equipped with Ultra-Sensitive Capacitance Load Cells this tester provides µN level resolution with forces up to 5N. The High-Resolution sensors allow characterization of large samples over macroscopic length scales to study the effect of texture and other surface modifications. Integrated with High Resolution Inverted Camera, it allows the researchers to measure Contact Area vs. Force making it extremely useful in measuring Adhesion of Soft Materials, Biomimetics and Hydrogels.
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TF Analyzer
The TF Analyzer platform is the heart of the modular and flexible measurement systems for the characterization of piezoelectric materials.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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Thermal Analysis
Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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Modulator
SFT3306I
Hangzhou Softel Optic Co., Ltd.
SFT3306I 6in1/16in1 ISDB-T modulator is the latest generational Mux-modulating device developed by SOFTEL. It has 6 (or16) multiplexing channels and ISDB-T modulating channels, and supports maximum 192 (or 512) IP input through the 3 GE ports and 6 (or16) ISDB-T non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is also characterized with high integrated level, high performance and low cost. This is very adaptable to newly generation DTV broadcasting system.





























