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Manual Tuners
Manual tuners are used both in the laboratory and as system components to establish or transform impedances for a number of applications. They can be used to establish optimum source or load terminations for device characterization, normalize a source or load for precision laboratory measurements and/or calibrations (noise, power, etc.), and can act as a matching transformer between a mismatched source and a mismatched load.
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CIELab Color Sensor
PR0128
The CIELab Color Sensor PR0128 is a color detection system with integrated high power light source, for determining the surface color. It is characterized by the identification of the smallest color nuances and the highest long-term stability. Here, up to 63 completely different products in different colors can be independently controlled and tested without changing parameters or gain levels.
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PNA-L Microwave Network Analyzer
N5235B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to50 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
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LXI Microwave Matrix, 10GHz, Dual 4x4
60-750-244
The 60-750-244 is a dual 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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cPCI System Power Supply
VX6620
The potential-free power supplies of the VX66xx family stand for precision and reliability and are characterized by many extras such as extremely low noise, very short rise and fall times and additional measurement functions. The energy is completely provided by the PXI chassis, therefore external power supplies are not necessary
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Zeta Potential & Particle Size Analyzer
AcoustoSizer II
The new AcoustoSizer IIs provides thorough characterization of concentrated colloidal dispersions. Directly measuring particle size, zeta potential, pH, conductivity, and temperature, it furnishes the most comprehensive analysis available in a single, turnkey instrument. Based on a flow-through sensor design, the AcoustoSizer IIs can be used in a laboratory batch analysis mode or connected directly to a process slipstream. Built-in syringe pumps provide automated potentiometric and volumetric titration capabilities for accurate isoelectric point and surfactant addition determination.
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LXI Microwave Matrix, 10GHz, Single 8x4 With Loop-Thru
60-750-184-A
The 60-750-184-A is a single 8x4 10GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Electrical Signal Test
High-density, multi-channel pulse pattern generators and bit error detectors for the design, characterization and production test of optical transceivers and opto-electrical components.
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Reverberation Chambers
Over the past several decades, RCs have been enjoying growing popularity as a promising facility for the characterization of wireless devices and for EMC testing. The RC (Reverberation Chamber) measurement method exhibits much competitive superiority over the AC (Anechoic Chamber) method and TEM Cell method, such as low cost, enhanced test repeatability, a more realistic test environment, and easily achieved high-field environment. The application of the RC for performing EMC testing was first proposed by H. A. Mendes in 1968. In the recent IEC 61000-4-21 standard, the importance of EMC testing using RCs as an alternative measurement technique has been recognized.
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Custom Bench Test
TestEdge provides customized bench test. If your device has specialized test requirements, it may be necessary to test your device using specialized bench equipment rather than traditional ATE. In other situations, both ATE and a custom bench setup may be required to fully characterize the device and provide necessary correlation. Finally, it may be useful to create a custom bench setup to facilitate device debug.
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Fiber Optic Tester
OPTOWARE-FTTx-PON Test Solutions
FTTx networks using PON technology can be characterized and maintained every step of the way using very simple new fiber-optic test equipment.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Subsea Oil-In-Water Analyzer
The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Photonic Device Testing
ficonTEC’s series of photonic device testing machines is focused on automated electrical, optical or mixed-signal electro-optical characterization (test-&-qualify) of chips and dies, opto-electronic assembles and integrated devices. Capability includes PIC design validation and device verification.
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120 GBd High-performance BERT
M8050A
The Keysight M8050A high-performance bit error ratio tester (BERT) enables accurate characterization of receivers used in next-generation data center networks and server interfaces. With uncompromised signal integrity, support for NRZ, PAM4, PAM6, and PAM8 signals, and data rates up to 120 GBd, the flexible architecture of the M8050A supports 1.6T pathfinding as well as other leading-edge technologies.
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TLP Tester
Tokyo Electronics Trading Co., Ltd.
A method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures.
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Light Simulator
From the review of the scientific development history, reliable and stable artificial light sources have played a very important role in the past century. For example, the artificial solar simulator is an important part of simulating sunlight to ensure accurate performance of PV characterization. With the growth of light sensor applications, more and more requirement of light simulators (or artificial light sources) explored. One of the core technologies of Enlitech is the artificial light sources. We can manipulate different lamp types (short arc lamps, LEDs, filament lamps et. al.) to generate different spectrum-form in different light intensity levels, beam sizes, and wavelength ranges. We have launched different artificial light source products for different applications fields. For instance, SS-X series solar simulators and ILS-30 ambient light simulator are for the PV field, HAAS is highly accurate star light simulator for the space field, and ALS-300 is a general-purpose light source in science research field. These products can not only meet the needs of your application, but also speed up the process of your research or mass-production.
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64 Gbaud High-performance BERT
M8040A
The Keysight M8040A is a highly integrated BERT for physical layer characterization and compliance testing. With support for PAM-4 and NRZ signals and data rates up to 64 Gbaud (corresponds to 128 Gbit/s) it covers all flavors of 200 and 400 GbE standards.
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Basic Spectrum Analyzer
N9322C
Quickly uncover key insights through fast, value-priced, general-purpose performance up to 7 GHz with -152 dBm DANL and 0.6 dB overall amplitude accuracy Streamlined for straightforward and efficient operation with marker demodulation, one-button optimization, and user-definable soft keys Robust measurement features for easily characterizing your product Automation and communication interface with industry standard SCPI language support and USB and LAN connectivity choices
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Variable Optical Attenuator Module for Multimode Fiber Applications
81578A
The Keysight 81578A variable optical attenuator is designed for multimode fiber applications and features lowest insertion loss and excellent wavelength flatness over a complete attenuation range of 60 dB, for characterizing optical network components for telecommunication and data communication in systems.
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Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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AXIe M8000 Series of BER Testers
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Phase Noise Analyzer and VCO Tester
FSWP
The R&S®FSWP phase noise analyzer and VCO tester features very high sensitivity thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.
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PNA Microwave Network Analyzer
N5224B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PNA-X Microwave Network Analyzer, 26.5 GHz
N5242B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
