Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A - Keysight Technologies
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Modular Source/Measure Units (SMU)
E5260A + E5270B - Keysight Technologies
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High-Channel Density Precision SMU
PZ2100 Series - Keysight Technologies