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Product
GPC/SEC Data Systems for Enhanced Control and Performance
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Agilent GPC/SEC data systems enable powerful control, data acquisition, calculations, and result reporting. For accurate molecular weight analysis and complete polymer and protein characterization, GPC/SEC software provides the functionality required for conventional and advanced GPC/SEC in a simple, powerful, fully integrated package.GPC/SEC software for OpenLAB CDS adds application-specific calibration, data processing, and reporting to your OpenLAB CDS. Cirrus GPC Multi Detector software, an add-on to OpenLAB CDS ChemStation, allows you to process conventional GPC data using a column calibration. Bio-SEC software is a dedicated standalone package for characterisation of proteins and other biomolecules.
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ATI Performance Oscilloscopes
DPO70000SX
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DPO70000SX ATI Performance Oscilloscopes deliver the industry’s most accurate capture of high-speed signal behavior to verify, validate and characterize your next generation designs. Capture up to 70 GHz signals with the lowest noise and highest fidelity, ensuring the most accurate measurements of your signal’s true characteristics.
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Functional Test
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Products and systems used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Microwave Cavity Characterization
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Material Sensing & Instrumentation
Microwave cavity characterization complements TDR Dielectric Spectroscopy in low-loss materials, providing high-resolution permittivity and loss data at specific single frequencies. Since measurements do not change significantly with frequency in low-loss materials (Kramer-Kronig relation) cavity measurement at select frequencies provides a full characterization across the RF/microwave range.
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Base Station Emulator
SUTP 5018
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Designed to create a custom cellular environment to serve testing and characterization needs. The combination of high power, real-time computing and the software defined radio platform enables this instrument to create your own cells for testing in a compact size and cost-efficient way.
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Product
PAM4 Bit Error Rate Tester.
BERT-1102
Tester
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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Two-Pole Voltage Tester
P-6
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SONEL P-6 has all the features that characterize the P-4 Voltage Tester and P-5 Voltage Tester. In addition, the P-6 model has the phase identification function which allows to verify the phase compatibility (and its overtaking or delay) against the phase at the reference object.
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Laser Diode Characterization System
58620
System
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Uncooled Microbolometer
384 x 288 FPA
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Drawing on its extensive experience in microbolometric detector design, fabrication, and characterization, as well as in detector-to-ROIC (Read-Out Integrated Circuit) monolithic integration, INO is proud to offer its 384 x 288 pixel microbolometer FPA (Focal Plane Array) in short series.
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Vibration Testing
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Response Dynamics Vibration Engineering, Inc.
We most often characterize a problem first and work from known conditions, and stay in “the known” as we proceed by making sense of what we observe as we move forward. We test and analyze the change in dynamics we are trying to create in real-time, on site, and often make changes to our experimental test plan on the fly as we discover how a system is actually behaving. In doing so we often get meaningful results from which we can make sound engineering decisions in a short time frame. We don't just make measurements and spit out data. We help identify the problem and propose solutions.
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Fiber Optic Sensor Systems
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Fraunhofer Institute for Telecommunications
Fiber-optic and photonic measuring systems open up innovative measuring and control technology concepts for a wide variety of applications. They play a major role in optimizing energy efficiency and are important technological innovation drivers for new and future-oriented markets.In the Department of Fiber Optic Sensor Systems of the Fraunhofer Heinrich Hertz Institute, the focus of application-oriented research is on the development of a new generation of photonic sensors. These are characterized by extreme miniaturization, high network and communication capability as well as extremely low power consumption or even a self-sufficient power supply.In the Department of Fiber Optic Sensor Systems at the Fraunhofer Heinrich Hertz Institute is focused applied research on the development of a new generation of photonic sensors. These are characterized by extreme miniaturization, high network and communication skills as well as an extremely low power consumption, or even a self-sufficient energy supply.
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Antenna Test Chamber for Automotive Radar
ATS1500C
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The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Variable Attenuators
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Variable attenuators are an integral part of most BER testing and EDFA characterization setups. All of EXFO's modular (IQS line) and benchtop variable attenuators are built for top performance and pinpoint accuracy. Each model offers a distinct set of features and specifications to suit various testing needs.
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Power Analyzer
HMC8015
Analyzer
The R&S®HMC8015 Power analyzer is a compact tester for AC/DC load and standby current characterization that enables measurements without additional tools such as a computer or remote infrastructure. In addition to a numerical and graphical display with 26 key parameters, the instrument delivers performance and compliance protocols in line with IEC 62301, EN 50564 and EN 61000-3-2.
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Power Device Analyzer / Curve Tracer
B1505A
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The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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X-ray Diffraction (XRD) Instruments
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X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
Load Module
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Analog Modulation and Frequency-Dependent Measurements
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Modern lightwave transmission systems require accurate and repeatable characterization of their optoelectronic, optical and electrical components to guarantee high-speed performance.
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Antenna, Ridged Guide
EM-6960 | 200 MHz – 2 GHz
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The EM-6960 operates over the 200 MHz to 2 GHz frequency range and is characterized by relatively high gain and low VSWR over this wide range.
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Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
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Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Product
High Power Devices
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SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
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Product
Phase Noise Analyzer and VCO Tester
FSPN
Phase Noise Analyzer
The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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Pulsed and CW lasers, 375 – 1700 nm, 1 kHz measurement rate
871 Series
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The 871 Laser Wavelength Meter from Bristol Instruments is the best way to measure the absolute wavelength of both pulsed and CW lasers and OPOs. By combining proven Fizeau etalon technology with automatic calibration, the reliable accuracy needed for the most meaningful experimental results is ensured. What’s more, a sustained measurement rate of 1 kHz enables the wavelength characterization of every single pulse for most lasers. And, the resulting time resolution of 1 ms provides the most detailed analysis of tunable lasers.
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PNA-X Microwave Network Analyzer
N5241A
Network Analyzer
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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Battery Capacity Analyzer
600B
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The 600B Battery Capacity Analyzer addresses the need to test and maintain sealed lead acid (SLA) batteries used in backup power UPS, emergency lighting, fire alarms, security systems, and many other electrical systems. By quickly characterizing a battery's response to a load resistance, the meter displays the remaining battery capacity as an indicator of the battery's health.
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PCI Express 5.0 Transmitter Electrical Performance Validation and Compliance Software
D9050PCIC
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Use the PCIe 5.0 Tx compliance software to test, debug and characterize your PCIe Gen5 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report upon test completion. The application compares the results with the specification test limit and includes margin analysis which indicates how closely the device passes or fails each test. With the option InfiniiSim Waveform Transformation Toolset, the software supports integrated de-embedding of the breakout channel of the test fixture.
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Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
