Open Area Test Sites
test objects to 30MHz to 3000 MHz frequency range.
See Also: OATS, Comb Generators
-
Product
Switch Probes (Normally Open (NO)) F88617B550G200SM
1007513
-
The Switch Probes (Normally Open, NO) F88617B550G200SM, with the order code 1007513, embodies both durability and high performance, engineered from 100% recycled materials in China. This fully assembled product offers a robust design that ensures reliability while being easy to clean and maintain, making it a practical choice for various applications. This model is part of the F886-NO family, which is known for its precision and efficiency in electrical connectivity.
-
Product
Turnkey Open Telco Solutions
-
Radisys supplies hardware, software, and management tools, as well as telecommunications software expertise and systems integration services. Our expertise in systems integration and leadership in the open telecom ecosystem, combined with our history as a hardware manufacturer makes Radisys an optimal partner for turnkey open hardware and systems integration projects.
-
Product
Switch Probes (Normally Open (NO)) F88506B230G350SM35
1021606
-
The Switch Probes (F88506B230G350SM35) serve as a vital component for various applications, embodying a robust design tailored for precise electrical and mechanical measurements. The F885-NO type boasts a standard pitch of 3.50 mm and operates efficiently across a broad temperature range of -45°C to +100°C, ensuring reliability under diverse environmental conditions. This basic contact probe combines versatile functionality with adherence to specified technical standards, making it an ideal choice for industrial applications requiring accurate probe measurements.
-
Product
Test System
BMS HIL
Test System
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
-
Product
PCI card with 3 IP sites
PCI3IP
-
The PCI compatible PCI3IP design adds 3 Industrypack compatible slots to your PCI host. The PCI3IP acts as an adapter, converter, carrier, or bridge between the PCI bus and your IndustryPack hardware. The PCI3IP is a half size PCI card with 3 IP sites; compatible with the smallest chassis and the tallest processors that prevent full size solutions.
-
Product
Open Circuit Locator
A994
-
The A994 is an open circuit locator for electric and telephone cables wind on the reel; it gives the position of the fault from the inside or outside end of the cable, in percentage to the total cable length. The instrument measures the ratio of the capacitances of the two sections of failed conductor using two high precision i/v converters. The advantage of this method is due to the fact that the measurement error depends almost exclusively on the dimensional inhomogeneity of the cable. The A994 has the unique feature to permit the location of fault in cables with all broken wires. This instrument locates breaks in cables with a total capacity between 2 nF and 5 uF. The distance to fault is displayed on a large LCD display.
-
Product
Area Scan Cameras
-
JAI provides a wide selection of industrial machine vision cameras with both single-sensor and multi-sensor configurations. Resolutions range from 0.3 MP to 20 MP, with high frame rates ranging up to 250 fps for full 5MP resolution. A selection of cameras can operate beyond the visible – in the ultraviolet, near infrared and in the short wave infrared light spectrums.
-
Product
Switch Probes (Normally Open (NO)) F88516B180G270E28
1021802
-
The Switch Probes (Normally open (NO)) F88516B180G270E28 is a versatile probe designed for a variety of electronic applications. With a family classification of F885-NO, this probe is engineered to operate effectively within a temperature range of -45°C to +100°C, making it suitable for environments where resilience to extreme conditions is essential. The probe boasts a compact design with a pitch of 3.50 mm and features a basic contact probe configuration that ensures reliable performance. Its high-quality construction includes materials such as beryllium copper for the plunger and brass for the barrel, offering durability and enhanced conductivity, which are critical components in electronic switching mechanisms.
-
Product
Open eVision Deep Learning Studio
-
Ease the evaluation of Open eVision’s Deep Learning toolsDataset creation and image annotation for classification, segmentation, and object localizationCreate and configure dataset splits to decide how your images are usedManage the data augmentation transformationsTrain your tools in succession thanks to the training queueValidation and analysis of the results of the trained toolsAvailable on Windows and LinuxFree of charge
-
Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
-
Product
Area Scan Camera
Genie Nano-5GigE
-
Engineered for imaging applications that require high-speed data transfer, the all new Genie Nano 5GigE is an easy replacement for gigabit ethernet cameras built into current vision systems that rely on the existing GigE Vision interface standard. The new Genie Nano 5GigE models feature the brand new 5Gbps (5GBASE-T) link speed.
-
Product
Switch Probes (Normally Open (NO)) F88517B230G200SM
1004335
-
The Switch Probes (Normally open (NO)) F88517B230G200SM is a highly sophisticated basic contact probe designed for precise applications. It belongs to the F885-NO family, featuring a compact design with a pitch of 3.50 mm (138 mil). This probe operates effectively in extreme temperatures ranging from -45°C to +100°C, making it suitable for a wide range of environments. The design incorporates advanced engineering to ensure a reliable performance alongside user-friendly operational handling.
-
Product
Test Probes / Test Fixtures
-
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
-
Product
Software to Simulate Large Area Semiconductor Devices
Laoss
-
Laoss (large-area organic semiconductor simulation) is a powerful software package for the design, simulation, and optimization of large-area organic and perovskite solar cells and LEDs (displays, lighting panels, photovoltaic arrays).
-
Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
-
Product
In-Circuit Testing and Test Engineering
GenRad 2287
-
3560 Hybrid Test NodesWindows InterfaceTotal GenRad 227X Migration Capability20 Mhz Clock, Sync, and Trigger, 5 Mhz data ratesVector Test for VLSI, PLCC’s & ASICSTest Express Vectorless TestingMultiple Chain Boundary ScanAnalog Functional Test Module
-
Product
Dust Caps, Opens
-
These coaxial dust caps are used for protective purposes, both from the environment & contaminants. Note: SMA, 2.92, 3.5mm dust caps are the same, as the threads are the same. Likewise, 2.4mm & 1.85mm dust caps are the same, the threads being the same. Some people use opens for calibration purposes at low frequencies, but these opens are not VNA rated, we don't measure fringing capacitance etc.
-
Product
Switch Probes (Normally Open (NO)) F87516B100G135L
1004710
-
The Switch Probes (Normally open (NO)) model F87516B100G135L is an exemplary choice for precision contact applications, reflecting a careful design philosophy that balances robustness and tactile response. Designed for a continuous current capacity of 5.00 A, this basic contact probe belongs to the F875-NO family, making it suitable for a variety of electrical environments. Able to withstand temperatures from -45°C to +100°C, this probe ensures reliable performance across a broad operational range. Featuring a switch travel of 1.50 mm and a typical contact resistance of 65 mOhm, it is ideal for high-reliability applications where low resistance is critical.
-
Product
Variable Area Flow Meters
-
Omega's extensive portfolio of variable area flow meters supports any industrial, medical, lab, or process control application. Let Omega help you select the proper flow meter for your application
-
Product
Switch Probes (Normally Open (NO)) F88506B100G200SM
1004245
-
The Switch Probes (Normally open (NO)) F88506B100G200SM is a highly versatile and robust component designed for precision applications, particularly in gasoline engine systems. With a temperature range of -45°C to +100°C, this basic contact probe, part of the F885-NO family, ensures reliable performance across a variety of environments. The design incorporates high-quality materials such as brass in the barrel and gold plating for optimal conductivity, ensuring longevity and dependability. The effective design, with a total length of 44.80 mm and a preload force of 70 cN, combines compact dimensions with superior functionality, making it ideal for critical automotive tasks.
-
Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
-
Product
Open Source Service to Help Secure and Trust Your Software
Community Attestation Service / CAS
-
- CAS stores all signatures inside of immudb, the standard for open source immutable databases.- CAS is protected against tampering. All attestation data is integrity-checked and cryptographically verified by the CAS client.- CAS is also protected against MITM attacks. The public key below is checked by every communication.A Software Bill of Materials (SBOM) is a list of components in a piece of software.Like a list of ingredients on food packaging -- where you might consult a label to avoid foods that may cause an allergy -- SBOMs can help companies avoid use of software that may harm their organization.If defects are later found in a specific part, the SBOM makes it easy to locate affected products.
-
Product
Switch Probes (Normally Open (NO)) F88717K200U150
F88717K200U150
-
The Switch Probes (Normally open (NO)) F88717K200U150 is a highly versatile tool designed for precise electrical measurements in a variety of environments. With a temperature range of -45°C to +100°C, this probe ensures reliability and stability in both extreme cold and heat. Its compact design features a total length of 25 mm and a nominal travel of 4 mm, making it suitable for integration into tight spaces. The probe's cutting-edge design is part of the F887-NO family, specifically tailored for applications where a basic contact is essential.
-
Product
Switch Probes (Normally Open (NO)) F87916B050G125
1030167
-
The Switch Probes (Normally Open (NO)) F87916B050G125 is a highly efficient basic contact probe designed for precision applications, suited to a wide temperature range of -45°C to +100°C. This product, characterized by its robust construction, features a total length of 24.50 mm and a minimum travel requirement of 2.60 mm for activation. Its unique design ensures reliable performance with a continuous current rating of 3.00 A, making it ideal for various electronic connections requiring reliability and efficiency. Additionally, the typical contact resistance is maintained at a low 65 mOhm, optimizing performance in critical applications.
-
Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
-
According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
-
Product
Complete Field Meter Site Testing Solution
7 Series
-
We raised the industry standard by introducing the PowerMaster 7 Series as a true 3-phase analyzing reference standard with internal 3-phase current and voltage source capability. The innovative design of the PowerMaster® 7 Series allows utilities to fully test a metering installation with one piece of equipment. Customer load meter testing, phantom load meter testing, CT burden and ratio testing, CT de-magnetization, PT ratio testing, and transducer testing can all be performed with one solution. In addition, vector diagrams, voltage and current waveforms, and harmonics data up to the 100th harmonic can all be analyzed to complete a true wiring verification.
-
Product
Modular Open Systems Approach (MOSA) Solutions
-
NAI’s Modular Open Systems Approach (MOSA) solutions provide customers with pre-configured, pre-validated, rugged military embedded solutions that save development time and cost while reducing program risk. These Flexible, Adaptable, Configurable, Modular and Expandable Systems Eliminate custom designs and redesigns by taking advantage of NAI’s Configurable Open Systems Architecture (COSA). NAI's full suite of MOSA Solutions are ARM® Cortex®-A53 processor-based and are ruggedized to withstand -40° C to +71° C and qualified to MIL-STD-1275D & MIL-STD-704A with 50 ms holdup (VITA 62 power supply); MIL-STD-461F and MIL-STD-810G.
-
Product
6U VPX UltraScale™ FPGA board with FMC+ sites
IC-FEP-VPX6e
-
Based on the latest Xilinx Kintex UltraScale™20nm FPGA, the IC-FEP-VPX6e is a 6U OpenVPX Front-End Processor (FEP) optimized for applications requiring DSP intensive processing in highly constrained environments.
-
Product
Switch Probes (Normally Open (NO)) F87511B100G080
1124204
-
Introducing the Switch Probes (Normally open (NO)) F87511B100G080, an expertly engineered solution designed for precision in various applications. These basic contact probes from the F875-NO family are crafted to operate efficiently within a temperature range of -45°C to +100°C, ensuring reliability across diverse environments. With a pitch of 2.54 mm (100 mil), they provide excellent performance for fine measurements. The continuous current rating reaches up to 5.00 A, paired with an impressive typical contact resistance of only 65.00 mOhm, making them a dependable choice for electronic connections.
-
Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.





























