In-Circuit Testing and Test Engineering

GenRad 2287 - Datest

3560 Hybrid Test Nodes
Windows Interface
Total GenRad 227X Migration Capability
20 Mhz Clock, Sync, and Trigger, 5 Mhz data rates
Vector Test for VLSI, PLCC’s & ASICS
Test Express Vectorless Testing
Multiple Chain Boundary Scan
Analog Functional Test Module